Crockett AB

Session T1 (Oct 11 08:30-12:00) (Tutorial) Test 101: Introduction to the World of Test by Adit Singh (Auburn University)
Session T3 (Oct 11 13:00-16:30) (Tutorial) Secure Scan-based DfT
Session T7 (Oct 12 08:30-12:00) (Tutorial) Timing Tests, Process Variations, Circuit Marginalities and Silent Data Corruption
Session T11 (Oct 12 13:00-16:30) (Tutorial) Device-Aware-Test: A Strategic Solution for Unmodeled Faults
Session D1 (Oct 13 13:30-15:00) Memory & Timing Defect Testing
Session D2 (Oct 13 16:00-17:30) Industrial Test Systems & Silicon Case Studies
Session D3 (Oct 14 10:30-12:00) AI Track (User Forum) - Systems
Session D4 (Oct 14 15:30-17:00) Debug, Fault Analysis & Simulation Techniques
Session D5 (Oct 15 10:30-12:00) Advanced ATPG Techniques
Session D6 (Oct 15 13:30-15:00) Special S5:
Session SLM-1 (Oct 15 16:00-18:30) SLM Workshop (Day 1)
Session SLM-2 (Oct 16 08:00-16:00) SLM Workshop (Day 2)