Program for Tuesday, October 7th: Session View

ESREF2025: ESREF 2025 : 36TH EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS

PROGRAM AUTHORS KEYWORDS

PROGRAM FOR TUESDAY, OCTOBER 7TH: SESSION VIEW

Days:

View: with abstracts talk overview

8:30

9:00

9:30

10:00

10:30

11:00

11:30

12:00

12:30

13:00

13:30

14:00

14:30

15:00

15:30

16:00

16:30

17:00

17:30

18:00

18:30

08:30-10:30

F2-1 - Power Devices and Microelectronic System: Reliability and Failure Analysis - F2-1 SiC Reliability

Amphitheatre Jean Touton

10:50-11:10

Exhibition Booth Tour - PVA TePla / ITEST

10:50-11:30

I1 - Extreme environments : ESD and EMC

Amphitheatre Jean Touton

11:10-11:30

Exhibition Booth Tour - ESRF / Intraspec Technologies

11:30-12:10

D - Reliability of Microwave devices and circuits

Amphitheatre Jean Touton

11:30-11:50

Exhibition Booth Tour - EDEN Instrument / Jiaco Instruments

11:50-12:10

Exhibition Booth Tour - UniSiC Technology / Hamamatsu

12:10-12:20

Exhibitor Flash Presentation - Jeol Europe / Excillum

Amphitheatre Jean Touton

13:50-14:30

C - Progress in Failure Analysis: Defect Detection and Analysis

Amphitheatre Jean Touton

14:30-16:10

E2 - Packaging and Assembly : Reliability and Failure Analysis - Long-term Reliability and Harsh Conditions

Amphitheatre Jean Touton

14:30-15:20

C - Progress in Failure Analysis: Defect Detection and Analysis

Salle Gabriel 1

15:20-15:30

Exhibitor Flash Presentation - SmarAct Metrology / Kleindiek Nanotechnik

Salle Gabriel 1

15:30-16:10

G - Photonics Reliability

Salle Gabriel 1

16:30-18:50

Session posters

Poster Session - All topics

10:30-10:50 Coffee Break

12:30-13:50 Lunch Break

16:10-16:30 Coffee Break

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