Salle Gabriel 1
70 places
Sessions
- Session I1 (Oct 07 11:30-12:10) I1 - Extreme environments : ESD and EMC
- Session C (Oct 07 14:40-15:20) C - Progress in Failure Analysis: Defect Detection and Analysis
- Session EFP1 (Oct 07 15:20-15:30) Exhibitor Flash Presentation - SmarAct Metrology / Kleindiek Nanotechnik
- Session G (Oct 07 15:30-16:10) G - Photonics Reliability
- Session H (Oct 08 08:30-10:30) H - MEMS and sensors Reliability
- Session B (Oct 08 10:50-12:10) B - Semiconductor Failure Mechanisms & Reliability for Si technologies & Nanoelectronics
- Session EFP2 (Oct 08 12:10-12:20) Exhibitor Flash Presentation - Opsens Solutions
- Session I2 (Oct 09 09:10-10:30) I2 - Extreme environments : Reliability and Radiation