PROGRAM FOR TUESDAY, OCTOBER 7TH: TALK VIEW
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View: with abstractssession overview
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
17:30
18:00
18:30
08:30-09:10
Ivana Kovacevic-Badstuebner
09:10-09:30
Mustafa Shqair, Emmanuel Sarraute, Frédéric Richardeau
09:30-09:50
Shin-Ichiro Hayashi, Yoshikazu Konishi, Shu Muraoka, Keiji Wada
09:50-10:10
P. Heimler, J. Müller, M. Lakshman Mysore, S. Gesell, J. Lutz, T. Basler
10:10-10:30
P.-E. Vidal, G. Viné, S. Baffreau, A. Gopishetti, T.-L. Le
10:50-11:10
E.M. Meknassi, N. Moultif, S. Duguay, B. Lambert, G. Bertao, O. Latry
11:10-11:30
Jean-Guy Tartarin, Damien Saugnon
11:30-11:50
Chao-Yang Ke, Ming-Dou Ker
11:50-12:10
L. Kemystetter, F. Caignet, A. Boyer, F. Ruffat, G. Mejecaze, F. Puybaret
13:50-14:30
From AI-powered Image Classification to GenAI: Possibilities for Modern Image-based Failure Analysis
Roland Brunner
14:30-14:50
Patrick Dreher, Marcel Sippel, Johannes Seltsam, David Sopp
14:50-15:10
Long-Term Drift of a Bandgap Voltage Reference by Molding Compound Oxidation during Extended Thermal
E.G. Marina Alonzo, R.T.H. Rongen, P. Turpin, P. Tounsi, S. Ben-Dhia
15:10-15:30
Borghese, Marrazzo, Fienga, Riccio, Maresca, Breglio, Irace
15:30-15:50
A. Tomas, T. Loïc, A. Guédon-Gracia, H. Fremont, P.-Y. Pichon
15:50-16:10
D. Santoro, F. Gerbino, C. Sciancalepore, P. Cova, D. Spaggiari, N. Delmonte
15:00-15:20
Duan Chao, Wu Zhaoxi
15:20-15:30 Exhibitor Flash Presentation - SmarAct Metrology / Kleindiek Nanotechnik
16:30-18:50
Junpeng Gao, Xuerong Ye, Qisen Sun, Cen Chen, Hao Chen, Guofu Zhai
Yihan Chen, Mingyao Ma, Wenting Ma, Rui Zhang, Zhenyu Fang
Qian Xu, Mingyao Ma, Tingzhi Jiang, Jiacheng Wu
Uladzimir Kalkouski
Réveil, Sarafinof, Cacho, Pradeau, Derrier, De Matos, Mukherjee, Maneux
A. Sarafinof, L. Réveil, F. Cacho, M. De Matos, C. Mukherjee, J. Hai, C. Maneux
Adrien Badetz, Chloé Bouexière, Nicolas Sarazin, Bneoit Lambert
Uladzimir Kalkouski
Messoudi, Jacqueline, Coq Germanicus, Lallemand, Chauvat, Froissart
Zhaoxi Wu, Chao Duan, Meng Meng, Rui Cao, Leiun Zhang, Maolin Zhang
Meng Meng, Jiajia Sun, Xu Wang
Mohamed Belaid, Hamza Kaouach
Taeyoon Im, Jahyeon Kim, Dongyurl Yu, Yong-Ho Ko
T. Walter, G. Khatibi, L.A. Sánchez López, M. Li, S. Listl
Shin-Il Kim, Dongjin Kim
Prashanth Prakash Kamath, Dawei Zhao, Jürgen Leib, Maximilian Hofmann
Standardized Test Method for Pure Bending Evaluation of Foldable Display Materials Under Natural-Arc
Seongyong Lim, Ikhyun Jo, Uihyo Jeong
Thermo-mechanical reliability of transfer molded TO-247-3L packages with Ag nanoporous sheet bonding
Yehri Kim, Byeong Kwon Ju, Dongjin Kim
Byeongchan Kim, Yehri Kim, Dongjin Kim
Modica et.al
A. Diouf, V. Rustichelli, M. Alam, L. Pace, E. Marcault, T. Grzes, H. Morel
M. Fiore, A. Sitta, G. Mauromicale, M. Calabretta, F. Iannuzzo
Christale Crouard, Jonathan Godillon, Patrick Tounsi, Jean-François Pieprzyk
Dedew, Lefebvre, Nguyen, Le, Rustichelli, Oliveira, Alam, Coccetti
Optimal Preconditional Voltages for SIC MOSFET Vth Measurement in the Aim of Temperature Measurement
Louis Alauzet, Patrick Tounsi, Jean-Pierre Fradin
Transient junction temperature measurement error of SiC MOSFETs in power cycling – Influence of gate
J. Breuer, F. Dresel, A. Schletz, J. Klier, J. Leib, B. Eckardt
Chenyi Wang, Cen Chen, Hao Chen, Haodong Wang, Xuerong Ye
Shuo Zhou, Yufu Wang, Diyin Tang, Yongle Ma, Yufang Guo
Nils Zöllner, Oliver Schilling, David Uebelacker
Cougo et.al
Bo Wang, He Lyu, Zhichao Wei, Zhibo Yang, Pengchao Xue, Bo Mei
10:30-10:50 Coffee Break
12:30-13:50 Lunch Break
16:10-16:30 Coffee Break