Pizzetti
Sessions
- Session Tutorial 1 (Sep 23 09:00-10:40)
- Session Tutorial 2 (Sep 23 11:00-12:40)
- Session Opening (Sep 23 14:00-14:40)
- Session K1 (Sep 23 14:40-16:00) Semiconductor Keynotes
- Session F1 (Sep 23 16:20-18:20) Power devices reliability: smart-power devices and silicon power
- Session K2 (Sep 24 08:20-09:40) Automotive Keynotes
- Session L (Sep 24 10:00-11:40) Automotive and industrial electronic reliability
- Session F3 (Sep 24 14:20-16:00) Power devices reliability: power electronic systems
- Session WS Automotive (Sep 24 16:20-18:30)
- Session F2-1 (Sep 25 08:20-10:20) GaN&SiC: reliability and testing methodologies (1)
- Session F2-2 (Sep 25 10:40-12:00) GaN&SiC: reliability and testing methodologies (2)
- Session F2-3 (Sep 25 14:00-15:20) GaN&SiC: reliability and testing methodologies (3)
- Session F2-4 (Sep 25 15:40-17:00) GaN&SiC: discrete device stability and reliability
- Session E-1 (Sep 26 08:20-10:20) Reliability of packages for power devices and sensors
- Session E-2 (Sep 26 10:40-12:20) Bond wire reliability
- Session Closing (Sep 26 12:20-13:00)