ITC 2026: 2026 IEEE INTERNATIONAL TEST CONFERENCE
Travis AB

Sessions

  • Session T5 (Oct 12 08:30-12:00) (Tutorial) From LLMs to AI Agents: Foundations for Semiconductor Engineering
  • Session T9 (Oct 12 13:00-16:30) (Tutorial) From LLMs to Agentic AI: Applications and Architectures for Test Data Analytics
  • Session A1 (Oct 13 13:30-15:00) AI Track: AI-Driven Wafer & IC Defect Classification
  • Session A2 (Oct 13 16:00-17:30) AI Track: AI & LLM-Driven Test Automation (Short Papers)
  • Session A3 (Oct 14 10:30-12:00) AI Track (User Forum) - Platforms and Analytics
  • Session A4 (Oct 14 15:30-17:00) AI Track: AI-Driven Test Generation & Layout Optimization
  • Session A5 (Oct 15 10:30-12:00) AI Track: Analytics, Yield, Performance
  • Session A6 (Oct 15 13:30-15:00) Chiplet & Heterogeneous Integration Test