Travis CD
Sessions
- Session T6 (Oct 12 08:30-12:00) (Tutorial) 3DIC Advanced Packaging, Test & SLM
- Session T10 (Oct 12 13:00-16:30) (Tutorial) UCIe based Multi-Chiplets Design & Test
- Session B1 (Oct 13 13:30-15:00) In-Field Reliability, Safety & Lifecycle Management
- Session B2 (Oct 13 16:00-17:30) Analog/Mixed-Signal & Scan-Based BIST Techniques (Short Papers)
- Session B3 (Oct 14 10:30-12:00) AI Track (User Forum) - Applications
- Session B4 (Oct 14 15:30-17:00) Analog & Mixed-Signal Test Validation
- Session B5 (Oct 15 10:30-12:00) Scan Design & Testability Insertion
- Session B6 (Oct 15 13:30-15:00) Special S4: