Chen He is a Fellow and Senior Director at NXP Semiconductors. With a PhD degree in Computer Engineering from the University of Texas at Austin, he has more than 25 years of experience and leadership in automotive microcontrollers and processors development, especially the area of Zero Defect (ZD) stress and test methodology. His interests also include embedded Non-Volatile Memory (NVM) and Machine Learning (ML) applications to test. Chen has been issued 32 US patents and published around 50 papers. He has served as panelist and program committee member and given invited talks at multiple IEEE conferences. He has been elected to IEEE Fellow for his contributions to test of automotive microcontrollers and microprocessors since 2023.