Magic Kingdom Ball 3
This room is on the Upper Level (Exhibit Floor is on the Lower Level)
Sessions
- Session C1 (Sep 27 14:00-15:30) Diagnosis and Debug
- Session C2 (Sep 27 16:00-17:30) New Frontiers in Test Content Optimization
- Session C3 (Sep 28 11:00-12:30) Memory Test/Diagnosis
- Session C4 (Sep 28 14:30-16:00) Memory Test/Repair
- Session C5 (Sep 28 16:30-18:00) Panel 3: Silicon Life-Cycle Management - Performing RAS in Today’s Mission Critical Systems
- Session C6 (Sep 29 10:30-12:00) Special Session on Chiplet Integration
- Session C7 (Sep 29 13:30-15:00) Special Session on Silicon Life-Cycle Management “Design-for-Verification (DfV): A New Direction in Design Qualification”