ITC 2021: INTERNATIONAL TEST CONFERENCE
Zoom Room B

Zoom link will be added in Underline platform.

Sessions

  • Session 1B (Oct 12 09:30-10:30) ML for Diagnosis
  • Session 2B (Oct 12 12:00-13:00) Wafer Map Classification I
  • Session P2 (Oct 12 14:00-15:00) What is the best high-speed I/O Test Method: 1149.10 or high speed I/O protocol?
  • Session 3B (Oct 13 09:30-10:30) Wafer Map Classification II
  • Session 4B (Oct 13 12:00-13:00) Failure Diagnosis
  • Session 5B (Oct 14 09:30-10:30) Test Data (Short Paper)
  • Session 6B (Oct 14 12:00-13:00) Analog Testing