ESREF 2018: 29TH EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS

This page contains an index consisting of author-provided keywords.

1
100 nm GaN HEMT	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
14nm FinFET	Failure Analysis on 14nm FinFET Devices with ESD CDM Failure
2
28nm	Solving 28nm I/O Circuit Reliability Issue due to Design Weakness
28nm FDSOI CMOS technology	Single-Event Transient Effects on Dynamic Comparator in 28nm FDSOI CMOS Technology
3
3D	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
3D image processing	Automated Detection of Counterfeit ICs using Machine Learning
3D Integration	Metallization Defect Detection in 3D Integrated Components using Scanning Acoustic Microscopy and Acoustic Simulations
4
4H-SiC MOSFET	VTH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs
6
600V GaN GIT	Evolution of C-V and I-V characteristics for a commercial 600V GaN GIT power device unde repetitive short-circui tests
A
AA	Self-heating induced variability and reliability in nanosheet-FETs based SRAM A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
Accelerated ageing	Online Condition Monitoring of IGBT Modules Using Voltage Change Rate Identification Calendar and cycling ageing combination of batteries in electric vehicles
accelerated aging	Influence of temperature of Storage, Write and Read operations on Multiple Level Cells NAND Flash memories
accelerated degradation data	A new processing method for accelerated degradation data based on quantile regression and pseudo-failure lifetime
accelerated mechanical fatigue test (BAMFIT)	Cyclic robustness of heavy wire bonds: Al, AlMg, Cu and CucorAl
Accelerated Testing	Experimental studies of: laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate
Accessibility	New defect detection approach using near electromagnetic field probing for high density PCBAs
acoustic	An acoustic emission sensor system for thin layer crack detection
acoustic emission	Investigation of Acoustic Emission as a Non-invasive Method for Detection of Power Semiconductor Aging An acoustic emission sensor system for thin layer crack detection
acoustic microscopy	Frequency domain scanning acoustic microscopy for power electronics: physics-based feature identification and selectivity
Acoustic Simulation	Metallization Defect Detection in 3D Integrated Components using Scanning Acoustic Microscopy and Acoustic Simulations
acoustic wave	Frequency domain scanning acoustic microscopy for power electronics: physics-based feature identification and selectivity
Active Thermal Control	Thermal stress reduction of quasi-Z source inverter drive by model predictive control
Adaptive body biasing	A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems
additive manufacturing	A Novel Method of Reliability-Centered Process Optimization for Additive Manufacturing
AFM	In-situ transistor reliability measurements through nanoprobing
Ag nanowire transparent electrode	Failure mechanism of Ag nanowire-coated conductive transparent electrode for wearable devices under folding and torsional fatigue condition
Ag paste	Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation structure
Ag stress migration bonding	Large area die-attachment by silver stress migration bonding for power device applications
Ageing	Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
Ageing modes	Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications
Aging	Analysis of 6T SRAM cell in sub-45nm CMOS and FinFET technologies Conducted EMI Evolution of power SiC MOSFET in a Back Converter after Short-Circuit Aging Tests
aging indicator	Effect of short circuit aging on safe operating area of SiC MOSFET
AlGaN/GaN	Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors
Alpha Source Scanning	Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources
Amorphous Si	Performance increase of tandem amorphous / microcrystalline Si PV devices under variable illumination and temperature conditions
amorphous-Si (a-Si) thin-film (TF)	Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules
Analytics	Analytics for physics of failure in automotive applications
Annealing	Towards Understanding Recovery of Hot-Carrier Induced Degradation
Approximate Circuits	Design of Approximate-TMR using Approximate Library and Heuristic Approaches
Approximate Library	Design of Approximate-TMR using Approximate Library and Heuristic Approaches
arbiter PUF	Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope
ARM	PTM-based hybrid error-detection architecture for ARM microprocessors
Arrhenius plot	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
artificial neural network	Investigation of artificial neural network algorithm based IGBT online condition monitoring
ATMR	Design of Approximate-TMR using Approximate Library and Heuristic Approaches
atomic force microscopy	In-situ transistor reliability measurements through nanoprobing
authentication	Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope
Automated	Steps toward automated deprocessing of integrated circuits
automotive	Complex Automotive ICs defect localization driven by Quiescent Power Supply Current: three cases study
automotive applications	Analytics for physics of failure in automotive applications
Automotive Environment	Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
avalanche ruggedness	Avalanche ruggedness of parallel SiC power MOSFETs
B
B10 lifetime	Two-thermal-states model predictive control for IGBT in three-phase inverter
back bias voltage	Photon emission as a characterization tool for bipolar parasitics in FinFET technology
Back gate bias	The total ionizing dose response of Leading-edge FDSOI NMOSFET
backside emmi	Complex Automotive ICs defect localization driven by Quiescent Power Supply Current: three cases study
backside protection	IC security and quality improvement by protection of chip backside against hardware attacks
barrier height	Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors
Battery	Comparison of Lithium-ion Battery Performance at Beginning-of-Life and End-of-Life
Battery energy storage system	A Novel Fault-tolerant Control for Battery-Energy-Storage System Based on Cascade Multilevel Converter with Battery/BMS Failure
BB	Self-heating induced variability and reliability in nanosheet-FETs based SRAM A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
BDC	Complex Automotive ICs defect localization driven by Quiescent Power Supply Current: three cases study
Bias Temperature Instability	In-situ transistor reliability measurements through nanoprobing Bias temperature instability and condition monitoring in SiC power MOSFETs
Bias temperature stress	Variation-resilient quantifiable plasma process induced damage monitoring
Bias voltage	Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena
BiCMOS	Complex Automotive ICs defect localization driven by Quiescent Power Supply Current: three cases study
Biomass mission	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
bipolar parasitics	Photon emission as a characterization tool for bipolar parasitics in FinFET technology
BMS	Reliability design of battery management system for power battery
body bias effect	Effect of OFF-State stress on Reliability of nMOSFET in SWD circuits of DRAM
body built-in current sensors	A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems
Bond Wire	Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling
bond wire degradation measurement	On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition
Bondwire fatigue	Reliability model of bond wire fatigue for IGBT in MMC with system redundancy consideration
boundary determination	Fault Location of a Switched Mode Power Supply based on Extended Integer-coded Dictionary Method
Breackdown Voltage of IGZO/AL2O3 TFTs	Effects of stair-case Gate bias stress in IGZO/Al2O3 flexible TFTs
Breakdown voltage	TCAD Study of DLC Coatings for Large-Area High-Power Diodes
BTI	In-situ transistor reliability measurements through nanoprobing
buck converter	Conducted EMI Evolution of power SiC MOSFET in a Back Converter after Short-Circuit Aging Tests
Buck-Boost Converter	Detection and Identification of Power Switch Failures for Fault-Tolerant Operation of Flying Capacitor Buck-Boost Converters
Built-in current sensors	Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults
bulk FinFET	Impact of Different Transistor Arrangements on Gate Variability Photon emission as a characterization tool for bipolar parasitics in FinFET technology
C
C-V	Evolution of C-V and I-V characteristics for a commercial 600V GaN GIT power device unde repetitive short-circui tests Measurement and Analysis SiC-MOSFET threshold voltage shift
CAF	Experimental studies of: laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate
Calendar ageing	Calendar and cycling ageing combination of batteries in electric vehicles
Capacitor	Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications
Capacitor bank	An Analytical Circuit based Nonlinear Thermal Model for Capacitor Banks
Capacitor loss analysis	Capacitor loss analysis method for power electronics converters
Capacity	Comparison of Lithium-ion Battery Performance at Beginning-of-Life and End-of-Life
carbon	Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors
cascade multilevel converter	A Novel Fault-tolerant Control for Battery-Energy-Storage System Based on Cascade Multilevel Converter with Battery/BMS Failure
Cascaded system	An Extensible Stability Analysis Method in Time Domain for Cascaded DC-DC Converters in Electrical Vehicles
CC	Self-heating induced variability and reliability in nanosheet-FETs based SRAM A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
Cell capacitor	Effect of DC/AC stress on the reliability of cell capacitor in DRAM
ceramic capacitor	Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs)
Chain transition fault	Exploitation of Laser Voltage techniques for identification and complete characterization of a scan chain transition fail issue using the second harmonic approach
characteristic of ageing precursor	Statistical analysis of characteristic of ageing precursor of IGBT based on synthetic effect of multi-physical fields
characterization	In-situ transistor reliability measurements through nanoprobing Measurement and Analysis SiC-MOSFET threshold voltage shift Design and development of MEMS-based structures for in-situ characterization of thermo-mechanical behaviour of thin metal films
Charge pumping	Measurement and Analysis SiC-MOSFET threshold voltage shift
Charge Sharing	Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions
Charge Transport Mechanisms	Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches
Chip backside	IC security and quality improvement by protection of chip backside against hardware attacks
Circut level simulation of transistor aging	NBTI and HCI models for circuit level aging simulations in different EDA environments
CMOS	Performance-reliability trade-offs in short range RF power amplifier design
CMOS-MEMS microphone	Stress Analysis of CMOS-MEMS Microphone under Shock Loading by Taguchi Method
Cold plate	Water cold plates for high power converters: a software tool for easy optimized design
Combined Test	Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
Common and differential modes	Conducted EMI Evolution of power SiC MOSFET in a Back Converter after Short-Circuit Aging Tests
Complex Systems	Moisture Modeling in Complex Systems
composition ratio	Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors
condition monitoring	Investigation of Acoustic Emission as a Non-invasive Method for Detection of Power Semiconductor Aging Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated ageing of power electronics Envelop Tracking Based Embedded Current Measurement for Monitoring of IGBT and Power Converter System ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier
conducted EMI	Conducted EMI Evolution of power SiC MOSFET in a Back Converter after Short-Circuit Aging Tests
Conductive Anodic Filament	Experimental studies of: laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate
confidence	An easy-implemented confidence filter for signal processing in the complex electromagnetic environment
Contactless testing	New defect detection approach using near electromagnetic field probing for high density PCBAs
Continuum Mechanics	Modeling the rate-dependent inelastic deformation behavior of porous polycrystalline silver films
Control strategy	Study on power cycling test with different control strategies
Converters	Converter monitoring in a wind turbine application
Cooling	GaN transistors efficient cooling by graphene foam
Copper wire	Deriving Lifetime Predictions for Wire Bonds at High Temperatures
Correlative Microscopy	A novel crowdsourcing platform for microelectronics counterfeit defect detection
corrosion	Corrosion behaviour of sintered silver under maritime environmental conditions
Cosmic ray ruggedness	Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique
Counterfeit detection	Automated Detection of Counterfeit ICs using Machine Learning A novel crowdsourcing platform for microelectronics counterfeit defect detection
counterfeit electronic	Reliability concerns from the gray market
Coupling factor	Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction
crack	An acoustic emission sensor system for thin layer crack detection
Creep	Modeling the rate-dependent inelastic deformation behavior of porous polycrystalline silver films
Creep fatigue	Importance of Electric Resistance Monitoring in Shear Test
creep law	Creep measurement and choice of creep laws for BGA assemblies' reliability simulation
Critical Application	An Efficient EDAC Approach for Handling Multiple Bit Upsets in Memory Array
Cross-sectional nanoprobing	Cross-sectional Nanoprobing Sample Preparation on Sub-micron Device with Fast Laser Grooving Technique
Cross-sectional SEM	Cross-sectional Nanoprobing Sample Preparation on Sub-micron Device with Fast Laser Grooving Technique
Crowd Sourcing	A novel crowdsourcing platform for microelectronics counterfeit defect detection
crystalline silicon (c-Si)	Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules
current balancing	A fully digital feedback control of gate driver for current balancing of parallel connected power devices
current destruction	Unified view on energy and electrical failure of the short-circuit operation of IGBTs
current filaments	Unified view on energy and electrical failure of the short-circuit operation of IGBTs
current overload	Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam
Current pulse test	Lithium-ion battery state of health estimation with short-term current pulse test and support vector machine
current sensing	Envelop Tracking Based Embedded Current Measurement for Monitoring of IGBT and Power Converter System
current surge	Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam
CVS	Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment
Cycle ageing	Calendar and cycling ageing combination of batteries in electric vehicles
cyclic four-point bending	Characterization of cyclic delamination behavior of thin film multilayers
D
Damped Sinusoidal pulse	Analysis of Semiconductor Fault using DS (Damped Sinusoidal) HPEM Injection
data retention	Influence of temperature of Storage, Write and Read operations on Multiple Level Cells NAND Flash memories
DBC	Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation structure
DC circuit breaker	A novel current-limiting circuit based on resistive-type SFCL for fault in DC power system
DC-DC converter	An Extensible Stability Analysis Method in Time Domain for Cascaded DC-DC Converters in Electrical Vehicles
dc-link capacitors	ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier
DDR3 SDRAM	Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory
deep learning	Void detection in solder bumps with deep learning
Defect clustering model	Statistical Nature of Hard Breakdown Recovery in High-κ Dielectric Stacks Studied using Ramp Voltage Stress
Defect detection	New defect detection approach using near electromagnetic field probing for high density PCBAs
Defect localization	Lock-in Thermography for defect localization and thermal characterization for space application
degradation	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes Degradation estimation using feature increment stepwise linear regression for PWM Inverter of Electro-Mechanical Actuator The effect of solar cell internal resistance change on the bus voltage ripple in spacecraft power system Device Characterization of 16/14nm FinFETs for Reliability Assessment with Infrared Emission Spectra Current induced degradation study on state of the art DUV LEDs Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes Degradation of GaN-on-GaN vertical diodes submitted to high current stress Degradation of vertical GaN-on-GaN fin transistors: step-stress and constant voltage experiments Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits
Degradation indicators	Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules
Degradation of battery	Lithium-ion battery state of health estimation with short-term current pulse test and support vector machine
Deprocessing	Steps toward automated deprocessing of integrated circuits
Design	Cross-Layer Approaches for Resilient VLSI System Design
Design for reliability	RCD snubber design based on reliability consideration: A case study for thermal balancing in power electronic converters
Design of experiment	Gaussian Process Regression Approach for Robust Design and Yield Enhancement of Self-Assembled Nanostructures
Design optimization	Thermal resistance modelling and design optimization of PCB vias
device parameters	Device Characterization of 16/14nm FinFETs for Reliability Assessment with Infrared Emission Spectra
DFT	New defect detection approach using near electromagnetic field probing for high density PCBAs
di/dt	Failure Signature Analysis of Power-Opens in DDR3 SDRAMs
Diamond-like carbon (DLC)	TCAD Study of DLC Coatings for Large-Area High-Power Diodes
DICE	A single event upset tolerant latch design
Die defect detection	Automated Detection of Counterfeit ICs using Machine Learning
dielectric	The end of gate oxide scaling (for real this time) Dielectric reliability in microelectronics: a tight relationship between degradation and technology
Dielectric Charging	Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches
Digital circuits	Simulation and Modelling of Long Term Reliability of Digital Circuits implemented in FPGA
Digital feedback control(DFC)	A fully digital feedback control of gate driver for current balancing of parallel connected power devices
Digital image correlation	Comparison of Experimental, Analytical and Simulation Methods to Estimate Substrate Material Properties for Warpage Reliability Analysis
Diode	The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection
Diodes	Study of forward AC stress degradation of GaN-on-Si Schottky diodes
direct power control	Direct power control of three-level NPC grid-connected system combined with fault-tolerant technology
Direct Power Injection	Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory
discharge voltage	A prediction method for discharge voltage of lithium-ion batteries under unknown dynamic loads
dislocation	Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes
displacement damage	Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices
dissipated energy	Effect of short circuit aging on safe operating area of SiC MOSFET
double pulsed testing	Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors
drain and source contact resistances	A new electro-optical transmission line measurement method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance
DRAM	Effect of OFF-State stress on Reliability of nMOSFET in SWD circuits of DRAM Effect of DC/AC stress on the reliability of cell capacitor in DRAM
Drill Bit Wear Out	Experimental studies of: laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate
drive cycle	Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
Drop test	Stress Analysis of CMOS-MEMS Microphone under Shock Loading by Taguchi Method
DTSCR	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
Dummy cell	Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction
DUV LED	Current induced degradation study on state of the art DUV LEDs
Dychotomy	Exploitation of Laser Voltage techniques for identification and complete characterization of a scan chain transition fail issue using the second harmonic approach
Dynamic Comparator	Single-Event Transient Effects on Dynamic Comparator in 28nm FDSOI CMOS Technology
Dynamic current	Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction
dynamic on-resistance	A new electro-optical transmission line measurement method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance
Dynamic Response	Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
E
EBSD	Quantification of lead-free solder fatigue by EBSD analysis
EBSP	Quantification of lead-free solder fatigue by EBSD analysis
EELS	Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors
Efficiency degradation	Photovoltaic plant maintainability optimization and degradation detection: modelling and characterization
Efficiency improvement	Performance increase of tandem amorphous / microcrystalline Si PV devices under variable illumination and temperature conditions
Electric vehicle	Calendar and cycling ageing combination of batteries in electric vehicles
electric vehicle motor driver	Method of Junction Temperature Estimation and Over Temperature Protection Used for Electric Vehicle’s IGBT Power Modules
Electrical characterization	Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices
Electrical Injection	On the Analysis of Radiation-induced Single Event Transients on SRAM-based FPGAs
electrical overstress	Surge Protection Design with Surge-to-Digital Converter for Microelectronic Circuits and Systems
Electrical overstress (EOS)	Solving 28nm I/O Circuit Reliability Issue due to Design Weakness
electrical resistivity	Influence of thermal exposure upon mechanical/electrical properties and microstructure of sintered micro-porous silver
Electrical stress	Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress
Electrical Vehicles	An Extensible Stability Analysis Method in Time Domain for Cascaded DC-DC Converters in Electrical Vehicles
Electro-mechanical Actuator	Degradation estimation using feature increment stepwise linear regression for PWM Inverter of Electro-Mechanical Actuator
Electro-Optical TLM	A new electro-optical transmission line measurement method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance
Electro-thermal Interactions	Thermal Modeling of Wire-bonded Power Modules Considering Non-Uniform Temperature and Electric Current Interactions
electrochemical measurements	Corrosion behaviour of sintered silver under maritime environmental conditions
electroluminescence	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
electrolytic capacitor	Lifetime Prediction of Aluminum Electrolytic Capacitors in LED Drivers Considering Parameter shifts
electromagnetic interference	An easy-implemented confidence filter for signal processing in the complex electromagnetic environment
electronic reliability	Corrosion reliability of lead-free solder systems used in electronics
Electronics	Use of Golden Samples for the Assessment of the Quality and Reproducibility of Scanning Acoustic Microscopy Images of Electronics Samples
Electrostatic Discharge	Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique
Electrostatic Discharge (ESD)	Failure Analysis on 14nm FinFET Devices with ESD CDM Failure
elevated temperature	Impact of elevated temperature applied during low dose rate irradiation on the degradation of BiCMOS operational amplifiers
Embedded components	Highlighting two integration technologies based on vias: Through Silicon Vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.
embedded processors	SHARC: Efficient Metric for Selective Protection of Software against Soft Errors
EMC	Conducted EMI Evolution of power SiC MOSFET in a Back Converter after Short-Circuit Aging Tests
EMP(Electromagnetics Pulse)	Analysis of Semiconductor Fault using DS (Damped Sinusoidal) HPEM Injection
Empirical model	An empirical model for thermal interface materials based on experimental characterizations under realistic conditions
encryption	Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope
energy destruction	Unified view on energy and electrical failure of the short-circuit operation of IGBTs
Energy dissipation	A novel current-limiting circuit based on resistive-type SFCL for fault in DC power system
EOS	Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress
Epoxy resin	Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture
Error Detection and Correction (EDAC)	An Efficient EDAC Approach for Handling Multiple Bit Upsets in Memory Array
ESA	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Experimental mechanics	Importance of Electric Resistance Monitoring in Shear Test
F
FA	Detection of Failure Mechanisms in 24-40nm FinFETs with (Spectral) Photon Emission Techniques using InGaAs Camera
Fail-to-open	Ensure an original and safe “Fail-to-Open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation
failure	Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress
Failure analysis	Metallization Defect Detection in 3D Integrated Components using Scanning Acoustic Microscopy and Acoustic Simulations Failure Analysis on 14nm FinFET Devices with ESD CDM Failure A power cycling degradation inspector of power semiconductor devices Reliability concerns from the gray market Failure Modes and Mechanism Analysis of SiC MOSFET under Short-Circuit Conditions Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
Failure analysis (FA)	Solving 28nm I/O Circuit Reliability Issue due to Design Weakness
Failure Analysis on FINFET	Understanding spatial resolution of laser voltage imaging
Failure mechanism	Failure mechanism of Ag nanowire-coated conductive transparent electrode for wearable devices under folding and torsional fatigue condition
Failure mode analysis	Reliability assessment and failure mode analysis of MEMS accelerometers for space applications
failure prediction	A Prognostic Methodology for Power MOSFETs Under Thermal Stress Using Echo State Network and Particle Filter
failure rate estimation method	Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique
fast hole trapping	Method to extract parameters of power law for nano-scale SiON pMOSFETs under Negative Bias Temperature Instability
fast measurement	Method to extract parameters of power law for nano-scale SiON pMOSFETs under Negative Bias Temperature Instability
fatigue	Characterization of cyclic delamination behavior of thin film multilayers Importance of Electric Resistance Monitoring in Shear Test
Fatigue failure	Effect of Joule heating on the reliability of solder joints under power cycling conditions
Fault current	A novel current-limiting circuit based on resistive-type SFCL for fault in DC power system
Fault diagnosis	On-line Fault Diagnosis Model for Locomotive Traction Inverter Based on Wavelet transform and Support Vector Machine Detection and Identification of Power Switch Failures for Fault-Tolerant Operation of Flying Capacitor Buck-Boost Converters Simple and Effective Open Switch Fault Diagnosis of Single-Phase PWM Rectifier
Fault Isolation	Understanding spatial resolution of laser voltage imaging
fault location	Fault Location of a Switched Mode Power Supply based on Extended Integer-coded Dictionary Method
Fault tolerance	Evaluating the reliability of a GPU pipeline to SEU and the impacts of software-based and hardware-based fault tolerance techniques PTM-based hybrid error-detection architecture for ARM microprocessors Design of Approximate-TMR using Approximate Library and Heuristic Approaches SHARC: Efficient Metric for Selective Protection of Software against Soft Errors
fault tolerance technology	Direct power control of three-level NPC grid-connected system combined with fault-tolerant technology
Fault-tolerant	Detection and Identification of Power Switch Failures for Fault-Tolerant Operation of Flying Capacitor Buck-Boost Converters
fault-Tolerant control	A Novel Fault-tolerant Control for Battery-Energy-Storage System Based on Cascade Multilevel Converter with Battery/BMS Failure A Fault-Tolerant Control Strategy for Switched Reluctance Motor Drive for Electric Vehicles Under Short-Fault Condition
FDSOI	The total ionizing dose response of Leading-edge FDSOI NMOSFET
FE-Simulation	Influence of the pulse length and temperature swing on the relative lifetime estimation for sintered/soldered chip-on-substrate samples via FE-simulation of power cycles Modeling the rate-dependent inelastic deformation behavior of porous polycrystalline silver films
FEM	Effect of solder material thickness on Power MOSFET reliability by Electro-Thermo-Mechanical Simulations Water cold plates for high power converters: a software tool for easy optimized design
FEM Reliability Simulation	Reliability investigation of large area solder joints in power electronics modules and its simulative representation
Field Programmable Gate Array	Simulation and Modelling of Long Term Reliability of Digital Circuits implemented in FPGA
field reliability	Reliability evaluation of IGCT from accelerated testing, quality monitoring and field return analysis
filter	An easy-implemented confidence filter for signal processing in the complex electromagnetic environment
FinFET	Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment Process variation dependence of total ionizing dose effects in bulk nFinFETs
FinFET technology	Photon emission as a characterization tool for bipolar parasitics in FinFET technology
FinFET-based SRAM	A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs
FinFETs	Detection of Failure Mechanisms in 24-40nm FinFETs with (Spectral) Photon Emission Techniques using InGaAs Camera
Finite Element Analysis	Life Prediction Methodology of System-in-Package Based on Physics of Failure Highlighting two integration technologies based on vias: Through Silicon Vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.
Finite element method	Stress Analysis of CMOS-MEMS Microphone under Shock Loading by Taguchi Method
Finite Element Method (FEM)	Thermal Modeling of Wire-bonded Power Modules Considering Non-Uniform Temperature and Electric Current Interactions
finite element modeling	Creep measurement and choice of creep laws for BGA assemblies' reliability simulation Failure Mechanism Analysis of Fuses Subjected to Manufacturing and Operational Thermal stresses
Flash reliability	Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction
Flexible electric devices	Shear properties of In-Bi alloy joints with Cu substrates during thermal aging
Flexible Thin Film Transistors	Effects of stair-case Gate bias stress in IGZO/Al2O3 flexible TFTs
Floating gate (FG)	A New Multitime Programmable Non-volatile Memory Cell Using High Voltage NMOS
Flying Capacitor	Detection and Identification of Power Switch Failures for Fault-Tolerant Operation of Flying Capacitor Buck-Boost Converters
Focused-Ion Beam	Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs
Foldable electronic device	Failure mechanism of Ag nanowire-coated conductive transparent electrode for wearable devices under folding and torsional fatigue condition
Folding fatigue	Failure mechanism of Ag nanowire-coated conductive transparent electrode for wearable devices under folding and torsional fatigue condition
Fowler-Nordheim	Measurement and Analysis SiC-MOSFET threshold voltage shift
FPGA	A fully digital feedback control of gate driver for current balancing of parallel connected power devices
full adder	Evaluation of Variability using Schmitt Trigger on Full Adders Layout
Functionality	Interplay of humidity and electrical functionality imposing reliability problems in electronics
Fundamental Frequency	Fundamental Frequency Region-based Thermal Control of Power Electronics Modules in High Power Motor Drive
Fuses	Failure Mechanism Analysis of Fuses Subjected to Manufacturing and Operational Thermal stresses
fuzzy control	An easy-implemented confidence filter for signal processing in the complex electromagnetic environment
fWLR	Variation-resilient quantifiable plasma process induced damage monitoring
G
GaAs	Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices
gallium nitride	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
GaN	Radiation robustness of normally-off GaN/HEMT power transistors (COTS) Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress Study of forward AC stress degradation of GaN-on-Si Schottky diodes A new electro-optical transmission line measurement method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance Combined experimental and numerical approach to study electro-mechanical resonant phenomena in GaN-on-Si heterostructures Degradation of GaN-on-GaN vertical diodes submitted to high current stress Qualification of GaN microwave transistors for the European Space Agency Biomass mission Degradation of vertical GaN-on-GaN fin transistors: step-stress and constant voltage experiments Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation structure Reliability issues in power SiC and GaN
GaN HEMT	Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
GaN HEMTs	Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stress On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs
GaN power HEMT	Failure Analysis of 650V Enhancement Mode GaN HEMT after Short Circuit Tests
GaN transistor	GaN transistors efficient cooling by graphene foam
GaN-buffer design	Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs
GaN-on-si	Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs
Gate current	TCAD investigation on hot-electron injection in new-generation technologies
Gate oxide reliability	Bias temperature instability and condition monitoring in SiC power MOSFETs
gate reliability	Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs
Gate shielding effect	Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena
gate unit reliability	Reliability evaluation of IGCT from accelerated testing, quality monitoring and field return analysis
Gaussian process regression	Gaussian Process Regression Approach for Robust Design and Yield Enhancement of Self-Assembled Nanostructures Application of Multi-Output Gaussian Process Regression for Remaining Useful Life Prediction of Light Emitting Diodes
Genetic Algorithm	Design of Approximate-TMR using Approximate Library and Heuristic Approaches
Golden Sample	Use of Golden Samples for the Assessment of the Quality and Reproducibility of Scanning Acoustic Microscopy Images of Electronics Samples
Graphene foam	GaN transistors efficient cooling by graphene foam
Graphics Processing Units	Evaluating the reliability of a GPU pipeline to SEU and the impacts of software-based and hardware-based fault tolerance techniques
Grid-connected PV systems	Lifetime estimation of modular cascaded H-bridge MLPVI for grid-connected PV systems considering mission profile
ground bouncing noise	Reliable N Sleep Shuffled Phase Damping Design for Ground Bouncing Noise Mitigation
H
H3TRB	The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection
Hard breakdown recovery	Statistical Nature of Hard Breakdown Recovery in High-κ Dielectric Stacks Studied using Ramp Voltage Stress
Hardware attacks	IC security and quality improvement by protection of chip backside against hardware attacks
Hardware-based Approach	A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs
Harmonic Compensation	Lifetime Evaluation of a Multifunctional PV Single-Phase Inverter during Harmonic Current Compensation
harsh environment	humidity robustness for high voltage power modules: limiting mechanisms and improvement of lifetime
HCI	NBTI and HCI models for circuit level aging simulations in different EDA environments
Health Indicators	Degradation estimation using feature increment stepwise linear regression for PWM Inverter of Electro-Mechanical Actuator
health prognostics	Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated ageing of power electronics
heating	Performance increase of tandem amorphous / microcrystalline Si PV devices under variable illumination and temperature conditions
Heatsink	Water cold plates for high power converters: a software tool for easy optimized design
Heavy ion	Radiation robustness of normally-off GaN/HEMT power transistors (COTS)
Heavy ion irradiation	Progressive Drain Damage in SiC Power MOSFETs Exposed to Ionizing Radiation
Heavy Ions	Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions
HEMT	Radiation robustness of normally-off GaN/HEMT power transistors (COTS) A new electro-optical transmission line measurement method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance Effects of HPEM Stress on GaAs Low-Noise Amplifier from Circuit to Component Scale
HESS；	A PCH Strong Tracking Control Strategy for Power Coordinated Allocation of Li-SC HESS
High density PCBA	New defect detection approach using near electromagnetic field probing for high density PCBAs
High electron mobility transistor	Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors
High K	Effect of DC/AC stress on the reliability of cell capacitor in DRAM
High power IGBT modules	Implementation of Direct Chip Junction Temperature Measurement in High Power IGBT Module in Operation - Railway Traction Converter
High Temperature Gate Bias (HTGB)	Investigation of Degradation Mechanisms in Low-Voltage p-Channel Power MOSFETs Under High Temperature Gate Bias Stress
High temperature reverse bias	Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode
High temperature storage	Deriving Lifetime Predictions for Wire Bonds at High Temperatures
high-electron-mobility transistor	Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors
High-K	Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory
HKMG	Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment
Hot carrier	Simulation and Modelling of Long Term Reliability of Digital Circuits implemented in FPGA Variation-resilient quantifiable plasma process induced damage monitoring
Hot carrier degradation	Towards Understanding Recovery of Hot-Carrier Induced Degradation
hot carriers	Device Characterization of 16/14nm FinFETs for Reliability Assessment with Infrared Emission Spectra
Hot-carrier injection	TCAD investigation on hot-electron injection in new-generation technologies
hotspots	Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules
HPEM	Effects of HPEM Stress on GaAs Low-Noise Amplifier from Circuit to Component Scale
HPEM(High Power Electromagnetics)	Analysis of Semiconductor Fault using DS (Damped Sinusoidal) HPEM Injection
HTGB	The synergetic effects of high temperature gate bias and total ionization dose on 1.2kV SiC devices
HTRB	Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stress
Humidity	humidity robustness for high voltage power modules: limiting mechanisms and improvement of lifetime Interplay of humidity and electrical functionality imposing reliability problems in electronics
hybrid baseplates	Low temperature transient liquid phase bonded Cu-Sn-Mo and Cu-Sn-Ag-Mo interconnects – a novel approach for hybrid metal baseplates
hydrogen diffusion	Degradation of GaN-on-GaN vertical diodes submitted to high current stress
I
I-V	Evolution of C-V and I-V characteristics for a commercial 600V GaN GIT power device unde repetitive short-circui tests
IC Aging Modeling	NBTI and HCI models for circuit level aging simulations in different EDA environments
IC design retrofit	Solving 28nm I/O Circuit Reliability Issue due to Design Weakness
IC design weak point	Solving 28nm I/O Circuit Reliability Issue due to Design Weakness
IC quality	IC security and quality improvement by protection of chip backside against hardware attacks
IC security	IC security and quality improvement by protection of chip backside against hardware attacks
IDDQ	Complex Automotive ICs defect localization driven by Quiescent Power Supply Current: three cases study
IEMI	Effects of HPEM Stress on GaAs Low-Noise Amplifier from Circuit to Component Scale
IGBT	Measure of High Frequency Input Impedance to Study the Instability of Power Devices in Short Circuit Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated ageing of power electronics Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena Statistical analysis of characteristic of ageing precursor of IGBT based on synthetic effect of multi-physical fields Transient junction temperature estimation of IGBT using improved thermal model On-line Fault Diagnosis Model for Locomotive Traction Inverter Based on Wavelet transform and Support Vector Machine The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling Method of Junction Temperature Estimation and Over Temperature Protection Used for Electric Vehicle’s IGBT Power Modules
IGBT module	Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature swings Study on power cycling test with different control strategies
IGBT modules	Lifetime prediction of a modified Y-source inverter in photo-voltaic application
IGBT protection	Envelop Tracking Based Embedded Current Measurement for Monitoring of IGBT and Power Converter System
IGBT reliability	Investigation of artificial neural network algorithm based IGBT online condition monitoring Two-thermal-states model predictive control for IGBT in three-phase inverter
IGCT	Reliability evaluation of IGCT from accelerated testing, quality monitoring and field return analysis
imaging	Frequency domain scanning acoustic microscopy for power electronics: physics-based feature identification and selectivity
IMC	Mechanism of Wire Bond Shear Testing
Immunity	Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory
impact of bonding parameters	Cyclic robustness of heavy wire bonds: Al, AlMg, Cu and CucorAl
In-Bi solder	Shear properties of In-Bi alloy joints with Cu substrates during thermal aging
InAlGaN/GaN	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
indenter	An acoustic emission sensor system for thin layer crack detection
Inflection points	How to successfully overcome inflection points, or long live Moore's law
influence factor	Influence Factors Analysis of Rail Potential in Urban Rail Transit
InGaAs	Detection of Failure Mechanisms in 24-40nm FinFETs with (Spectral) Photon Emission Techniques using InGaAs Camera
InGaN	Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes
InGaZnO thin film transistor	Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors
Input/Output circuit (I/O)	Solving 28nm I/O Circuit Reliability Issue due to Design Weakness
inspection	An acoustic emission sensor system for thin layer crack detection
Instabilities	Failure Analysis of 650V Enhancement Mode GaN HEMT after Short Circuit Tests
Instability	Measure of High Frequency Input Impedance to Study the Instability of Power Devices in Short Circuit Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors
Insulated gate bipolar transistor	Online Condition Monitoring of IGBT Modules Using Voltage Change Rate Identification
Insulated Gate Bipolar Transistors	Converter monitoring in a wind turbine application
integer-coded dictionary	Fault Location of a Switched Mode Power Supply based on Extended Integer-coded Dictionary Method
Integrated Circuits	Steps toward automated deprocessing of integrated circuits
integrated health indicator	Remaining useful life prediction for lithium-ion batteries based on an integrated health indicator
interface state	High resolution observation of defects at SiO2/4H-SiC interfaces by time-resolved scanning nonlinear dielectric microscopy
intermetallic compound	Corrosion reliability of lead-free solder systems used in electronics
Internal Resistance	The effect of solar cell internal resistance change on the bus voltage ripple in spacecraft power system Comparison of Lithium-ion Battery Performance at Beginning-of-Life and End-of-Life
Interval Analysis	Mutual and self-aging effects of power semiconductors on the thermal behaviour of DC-DC boost power converter
intrinsic Stress measurement	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Inverters	Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters
IR Thermography	Lock-in Thermography for defect localization and thermal characterization for space application
irradiation	Impact of elevated temperature applied during low dose rate irradiation on the degradation of BiCMOS operational amplifiers
ITIQ comparator	Design and Implementation of Reliable Flash ADC for Microwave Applications
J
junction temperature	Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated ageing of power electronics Method of Junction Temperature Estimation and Over Temperature Protection Used for Electric Vehicle’s IGBT Power Modules Fundamental Frequency Region-based Thermal Control of Power Electronics Modules in High Power Motor Drive
Junction temperature measurement	Implementation of Direct Chip Junction Temperature Measurement in High Power IGBT Module in Operation - Railway Traction Converter
L
lach design	A single event upset tolerant latch design
large area die-attachment	Large area die-attachment by silver stress migration bonding for power device applications
Large Area Solder Joint	Reliability investigation of large area solder joints in power electronics modules and its simulative representation
Laser deprocess technique	Cross-sectional Nanoprobing Sample Preparation on Sub-micron Device with Fast Laser Grooving Technique
laser diodes	Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes Further improvements of an extended Hakki-Paoli method
Laser lock-in thermography	Non-destructive imaging of defects in Ag-sinter die attach layers – a comparative study including X-Ray, Scanning Acoustic Microscopy and thermography
Laser Voltage Imaging	Understanding spatial resolution of laser voltage imaging
Laser Voltage techniques	Exploitation of Laser Voltage techniques for identification and complete characterization of a scan chain transition fail issue using the second harmonic approach
laser-diode	Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits
lead-free	Corrosion reliability of lead-free solder systems used in electronics Quantification of lead-free solder fatigue by EBSD analysis
leakage current	Effect of DC/AC stress on the reliability of cell capacitor in DRAM Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors
LED	Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress
LED driver	Lifetime Prediction of Aluminum Electrolytic Capacitors in LED Drivers Considering Parameter shifts
Life Consumption	Impact of meteorological variations on the lifetime of grid-connected PV inverters
Life Prediction	Life Prediction Methodology of System-in-Package Based on Physics of Failure
life time	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
lifetime	System-level Reliability Enhancement of dc/dc Stage of a Single-Phase PV Inverter
lifetime estimation	Lifetime estimation of modular cascaded H-bridge MLPVI for grid-connected PV systems considering mission profile Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
Lifetime evaluation	Influence of the pulse length and temperature swing on the relative lifetime estimation for sintered/soldered chip-on-substrate samples via FE-simulation of power cycles Lifetime Evaluation of a Multifunctional PV Single-Phase Inverter during Harmonic Current Compensation Life consumption of a MMC-STATCOM Supporting Wind Power Plants: Impact of the Modulation Strategies
Lifetime Modeling	Reliability investigation of large area solder joints in power electronics modules and its simulative representation
Lifetime prediction	Lifetime prediction of a modified Y-source inverter in photo-voltaic application Lifetime Prediction of Aluminum Electrolytic Capacitors in LED Drivers Considering Parameter shifts Importance of Electric Resistance Monitoring in Shear Test
lift-off failure	Cyclic robustness of heavy wire bonds: Al, AlMg, Cu and CucorAl
Light Emitting Diode	Application of Multi-Output Gaussian Process Regression for Remaining Useful Life Prediction of Light Emitting Diodes
Lithium ion battery	Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications
Lithium-Ion	Comparison of Lithium-ion Battery Performance at Beginning-of-Life and End-of-Life
lithium-ion battery	A prediction method for discharge voltage of lithium-ion batteries under unknown dynamic loads Lithium-ion battery state of health estimation with short-term current pulse test and support vector machine Calendar and cycling ageing combination of batteries in electric vehicles Remaining useful life prediction for lithium-ion batteries based on an integrated health indicator
LNA	Effects of HPEM Stress on GaAs Low-Noise Amplifier from Circuit to Component Scale
Location of Critical High Carrier Multiplication Spots	Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources
Lock-in thermography	Non-destructive imaging of defects in Ag-sinter die attach layers – a comparative study including X-Ray, Scanning Acoustic Microscopy and thermography Lock-in Thermography for defect localization and thermal characterization for space application
Logistic regression	Gaussian Process Regression Approach for Robust Design and Yield Enhancement of Self-Assembled Nanostructures
Long term dc bias stability	Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique
loss measurement	Capacitor loss analysis method for power electronics converters
low dose rate	Impact of elevated temperature applied during low dose rate irradiation on the degradation of BiCMOS operational amplifiers
low frequency concussion	A Reliable Speed Controller for Suppressing Low Frequency Concussion of Electric Vehicle
Low-melting temperature	Shear properties of In-Bi alloy joints with Cu substrates during thermal aging
low-temperature PVD PZT	Reliability Testing of Integrated Low-Temperature PVD PZT Films
Lumen degradation	Application of Multi-Output Gaussian Process Regression for Remaining Useful Life Prediction of Light Emitting Diodes
M
Machine Learning	A novel crowdsourcing platform for microelectronics counterfeit defect detection
Maintainability	Photovoltaic plant maintainability optimization and degradation detection: modelling and characterization
Maintenance	Reliability Assessment of Power Conditioner Considering Maintenance in a PEM Fuel Cell System
manufacturing process	Manufacturing process-based storage degradation modelling and reliability assessment
maritime environment	Corrosion behaviour of sintered silver under maritime environmental conditions
MDSWC	Degradation estimation using feature increment stepwise linear regression for PWM Inverter of Electro-Mechanical Actuator
measurement	Combined experimental and numerical approach to study electro-mechanical resonant phenomena in GaN-on-Si heterostructures
measurement method	Further improvements of an extended Hakki-Paoli method
measurement systems	In-situ transistor reliability measurements through nanoprobing
Mechanical Characterization	Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
mechanical damage	An acoustic emission sensor system for thin layer crack detection
mechanical properties characterization	Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs)
Memory Reliability	An Efficient EDAC Approach for Handling Multiple Bit Upsets in Memory Array
MEMS	Reliability assessment and failure mode analysis of MEMS accelerometers for space applications Design and development of MEMS-based structures for in-situ characterization of thermo-mechanical behaviour of thin metal films
metal foam	Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam
Metal Gate	Failure Analysis on 14nm FinFET Devices with ESD CDM Failure
Metallization	Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling
Meteorological Conditions	Impact of meteorological variations on the lifetime of grid-connected PV inverters
micro galvanic corrosion	Corrosion reliability of lead-free solder systems used in electronics
micro-grid；	A PCH Strong Tracking Control Strategy for Power Coordinated Allocation of Li-SC HESS
Microelectronics	Dielectric reliability in microelectronics: a tight relationship between degradation and technology
microprocessor	PTM-based hybrid error-detection architecture for ARM microprocessors
Microstructures	Shear properties of In-Bi alloy joints with Cu substrates during thermal aging
MIM Capacitors	Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches
Mission Profile	Lifetime estimation of modular cascaded H-bridge MLPVI for grid-connected PV systems considering mission profile System-level Reliability Enhancement of dc/dc Stage of a Single-Phase PV Inverter
Mission profiles	Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters
MLC	Influence of temperature of Storage, Write and Read operations on Multiple Level Cells NAND Flash memories
MLCC	Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs)
model predictive control	Two-thermal-states model predictive control for IGBT in three-phase inverter Thermal stress reduction of quasi-Z source inverter drive by model predictive control
Modeling	Moisture Modeling in Complex Systems
Modeling for reliability	NBTI and HCI models for circuit level aging simulations in different EDA environments
Modelling	TCAD Modelling for Reliability
Modular cascaded H-bridge MLPVI	Lifetime estimation of modular cascaded H-bridge MLPVI for grid-connected PV systems considering mission profile
Modular Multilevel Converter	Life consumption of a MMC-STATCOM Supporting Wind Power Plants: Impact of the Modulation Strategies
Modulation scheme	System-level Reliability Enhancement of dc/dc Stage of a Single-Phase PV Inverter
Modulation Strategies	Life consumption of a MMC-STATCOM Supporting Wind Power Plants: Impact of the Modulation Strategies
Moisture	The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture Moisture Modeling in Complex Systems
Monitoring	Variation-resilient quantifiable plasma process induced damage monitoring Converter monitoring in a wind turbine application
Monte Carlo	Reliability model of bond wire fatigue for IGBT in MMC with system redundancy consideration
Monte-Carlo Simulation	Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions
Moore law	How to successfully overcome inflection points, or long live Moore's law
MOS interface	High resolution observation of defects at SiO2/4H-SiC interfaces by time-resolved scanning nonlinear dielectric microscopy
MOS interface states	VTH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs
MOS transistor	Variation-resilient quantifiable plasma process induced damage monitoring
MOSFET	Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress
Motor Drive Reliability	Fundamental Frequency Region-based Thermal Control of Power Electronics Modules in High Power Motor Drive
MPG encoder	Design and Implementation of Reliable Flash ADC for Microwave Applications
Multi-chip power modules	A Multi-Port Thermal Coupling Model for Multi-Chip Power Modules Suitable for Circuit Simulators
multi-physical fields	Statistical analysis of characteristic of ageing precursor of IGBT based on synthetic effect of multi-physical fields
Multi-physics Modelling and Simulation	Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
Multi-port thermal model	A Multi-Port Thermal Coupling Model for Multi-Chip Power Modules Suitable for Circuit Simulators
Multichip power module	Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
Multifunctional Inverters	Lifetime Evaluation of a Multifunctional PV Single-Phase Inverter during Harmonic Current Compensation
Multiple transient faults	Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults
Multiple-Bit Upset (MBU)	An Efficient EDAC Approach for Handling Multiple Bit Upsets in Memory Array
multitime programmable (MTP)	A New Multitime Programmable Non-volatile Memory Cell Using High Voltage NMOS
mutilayer ceramic capacitor	Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs)
N
N sleep shuffled phase damping	Reliable N Sleep Shuffled Phase Damping Design for Ground Bouncing Noise Mitigation
NAND Flash memory	Influence of temperature of Storage, Write and Read operations on Multiple Level Cells NAND Flash memories
nano-indentation	Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs)
nanoprobing	In-situ transistor reliability measurements through nanoprobing
NBTI	In-situ transistor reliability measurements through nanoprobing Simulation and Modelling of Long Term Reliability of Digital Circuits implemented in FPGA NBTI and HCI models for circuit level aging simulations in different EDA environments NBTI and irradiation related degradation mechanisms in power VDMOS transistors
near EM field	New defect detection approach using near electromagnetic field probing for high density PCBAs
negative bias temperature instability	In-situ transistor reliability measurements through nanoprobing
Negative Bias Temperature Stress (NBTS)	Investigation of Degradation Mechanisms in Low-Voltage p-Channel Power MOSFETs Under High Temperature Gate Bias Stress
NIEL	Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices
NIR illumination	Performance increase of tandem amorphous / microcrystalline Si PV devices under variable illumination and temperature conditions
nMOSFET	Effect of OFF-State stress on Reliability of nMOSFET in SWD circuits of DRAM
Noise	Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena
Noisy Environment	An Efficient EDAC Approach for Handling Multiple Bit Upsets in Memory Array
Non-Destructive Analysis	Use of Golden Samples for the Assessment of the Quality and Reproducibility of Scanning Acoustic Microscopy Images of Electronics Samples
Non-destructive testing	Non-destructive imaging of defects in Ag-sinter die attach layers – a comparative study including X-Ray, Scanning Acoustic Microscopy and thermography
non-uniform operation	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
Non-uniform Temperature	Thermal Modeling of Wire-bonded Power Modules Considering Non-Uniform Temperature and Electric Current Interactions
non-volatile memory (NVM)	A New Multitime Programmable Non-volatile Memory Cell Using High Voltage NMOS
Numerical modeling	Photovoltaic plant maintainability optimization and degradation detection: modelling and characterization
O
object detection	Void detection in solder bumps with deep learning
Observer	Simple and Effective Open Switch Fault Diagnosis of Single-Phase PWM Rectifier
obsolescence	Reliability concerns from the gray market
off shore	Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated ageing of power electronics
OFF-State stress	Effect of OFF-State stress on Reliability of nMOSFET in SWD circuits of DRAM
online condition monitoring	Investigation of artificial neural network algorithm based IGBT online condition monitoring
online estimation	ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier
online monitoring	On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition
Online platform	A novel crowdsourcing platform for microelectronics counterfeit defect detection
open defect	Failure Signature Analysis of Power-Opens in DDR3 SDRAMs
Open-circuit fault	Simple and Effective Open Switch Fault Diagnosis of Single-Phase PWM Rectifier
Operating-Waveform Analysis	Operating-waveform analysis based reliability evaluation of power MOSFETs used for a leg short-circuit initial charge method
operational amplifiers	Impact of elevated temperature applied during low dose rate irradiation on the degradation of BiCMOS operational amplifiers
optical analysis	Device Characterization of 16/14nm FinFETs for Reliability Assessment with Infrared Emission Spectra
optical gain	Further improvements of an extended Hakki-Paoli method
Optical layer	IC security and quality improvement by protection of chip backside against hardware attacks
Organic electronics	Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique
Outdoor stress tests	Performance increase of tandem amorphous / microcrystalline Si PV devices under variable illumination and temperature conditions
over temperature protection	Method of Junction Temperature Estimation and Over Temperature Protection Used for Electric Vehicle’s IGBT Power Modules
Oxide breakdown	A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory
P
p-GaN gate	Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors
p-n junctions	Degradation of GaN-on-GaN vertical diodes submitted to high current stress
P3HT:PCBM polymeric solar cells	Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique
Package reliability	Comparison of Experimental, Analytical and Simulation Methods to Estimate Substrate Material Properties for Warpage Reliability Analysis
Packages	Reliability of packages for power devices
Parallel	Avalanche ruggedness of parallel SiC power MOSFETs
Parallel connected IGBT	A fully digital feedback control of gate driver for current balancing of parallel connected power devices
Parallel sleep transistor	Reliable N Sleep Shuffled Phase Damping Design for Ground Bouncing Noise Mitigation
parameter shifts	Lifetime Prediction of Aluminum Electrolytic Capacitors in LED Drivers Considering Parameter shifts
parasitic bipolar transistor	Photon emission as a characterization tool for bipolar parasitics in FinFET technology
Parasitic capacitance	Online Condition Monitoring of IGBT Modules Using Voltage Change Rate Identification Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena
parasitic devices	Photon emission as a characterization tool for bipolar parasitics in FinFET technology
Parity-per-Byte	An Efficient EDAC Approach for Handling Multiple Bit Upsets in Memory Array
partial decapping	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
partial shadings	Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules
particle filter	Application of Multi-Output Gaussian Process Regression for Remaining Useful Life Prediction of Light Emitting Diodes Remaining useful life prediction for lithium-ion batteries based on an integrated health indicator
passivation	The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection TCAD Study of DLC Coatings for Large-Area High-Power Diodes Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
Passive Temperature Cycling	Reliability investigation of large area solder joints in power electronics modules and its simulative representation
passive thermal cycling	Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam
PBTI	In-situ transistor reliability measurements through nanoprobing
PCB	Experimental studies of: laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate
PCB embedding	Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam
PCB sensor	Envelop Tracking Based Embedded Current Measurement for Monitoring of IGBT and Power Converter System
PCH strong tracking control	A PCH Strong Tracking Control Strategy for Power Coordinated Allocation of Li-SC HESS
Peak minimization	A fully digital feedback control of gate driver for current balancing of parallel connected power devices
Peltier effect	Effect of Joule heating on the reliability of solder joints under power cycling conditions
PEM	Detection of Failure Mechanisms in 24-40nm FinFETs with (Spectral) Photon Emission Techniques using InGaAs Camera
PEM Fuel Cell System	Reliability Assessment of Power Conditioner Considering Maintenance in a PEM Fuel Cell System
Percolation model	Statistical Nature of Hard Breakdown Recovery in High-κ Dielectric Stacks Studied using Ramp Voltage Stress
Performace	Comparison of Lithium-ion Battery Performance at Beginning-of-Life and End-of-Life
performance	Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules
performance index	Reliability Assessment for Traction Power Supply System Based on Quantification of Margins and Uncertainties
Permanent magnet synchronous motor	A Reliable Speed Controller for Suppressing Low Frequency Concussion of Electric Vehicle
pHEMT	Effects of HPEM Stress on GaAs Low-Noise Amplifier from Circuit to Component Scale
Photo-voltaic	Lifetime prediction of a modified Y-source inverter in photo-voltaic application
photon emission	Detection of Failure Mechanisms in 24-40nm FinFETs with (Spectral) Photon Emission Techniques using InGaAs Camera Device Characterization of 16/14nm FinFETs for Reliability Assessment with Infrared Emission Spectra
photon emission microscopy	Photon emission as a characterization tool for bipolar parasitics in FinFET technology
Photovoltaic	Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications
Photovoltaic modules	Photovoltaic plant maintainability optimization and degradation detection: modelling and characterization
Photovoltaic Systems	Lifetime Evaluation of a Multifunctional PV Single-Phase Inverter during Harmonic Current Compensation Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters Impact of meteorological variations on the lifetime of grid-connected PV inverters
Physics	Introduction to the modern Reliability based on physics and statistics
physics of failure	Life Prediction Methodology of System-in-Package Based on Physics of Failure Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of supercapacitors for industrial applications Analytics for physics of failure in automotive applications
PID	Variation-resilient quantifiable plasma process induced damage monitoring
piezo resistive	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Planar and Collimated Alpha Source	Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources
Plasma charging	Variation-resilient quantifiable plasma process induced damage monitoring
Poole-Frenkel-like transport	TCAD Study of DLC Coatings for Large-Area High-Power Diodes
positive bias temperature instability	In-situ transistor reliability measurements through nanoprobing
Positive Gate bias stress	Effects of stair-case Gate bias stress in IGZO/Al2O3 flexible TFTs
power	Study of forward AC stress degradation of GaN-on-Si Schottky diodes A Lightweight Write-Assist Scheme for Reduced RRAM Variability and Power
Power battery	Reliability design of battery management system for power battery
Power Conditioner	Reliability Assessment of Power Conditioner Considering Maintenance in a PEM Fuel Cell System
power converter	Mutual and self-aging effects of power semiconductors on the thermal behaviour of DC-DC boost power converter A Fault-Tolerant Control Strategy for Switched Reluctance Motor Drive for Electric Vehicles Under Short-Fault Condition
power coordinated allocation；	A PCH Strong Tracking Control Strategy for Power Coordinated Allocation of Li-SC HESS
Power Cycle	Effect of solder material thickness on Power MOSFET reliability by Electro-Thermo-Mechanical Simulations
Power Cycling	Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices Influence of the pulse length and temperature swing on the relative lifetime estimation for sintered/soldered chip-on-substrate samples via FE-simulation of power cycles Smart SiC MOSFET accelerated lifetime testing Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling Effect of Joule heating on the reliability of solder joints under power cycling conditions
power cycling test	A power cycling degradation inspector of power semiconductor devices On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature swings Study on power cycling test with different control strategies
power device	Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices Unified view on energy and electrical failure of the short-circuit operation of IGBTs
Power Device Reliability and Robustness	Charge and energy deposition in thick silicon depletion layers by environmental ionizing radiation and terrestrial cosmic rays Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources
Power devices	A power cycling degradation inspector of power semiconductor devices Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters Reliability of packages for power devices
power efficiency	A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems
Power electronics	Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature swings Study on power cycling test with different control strategies Influence of thermal exposure upon mechanical/electrical properties and microstructure of sintered micro-porous silver Vestas’ practice in reliability engineering for power electronics
Power Electronics Reliability	Thermal stress reduction of quasi-Z source inverter drive by model predictive control Reliability investigation of large area solder joints in power electronics modules and its simulative representation
power integrity(PI)	Failure Signature Analysis of Power-Opens in DDR3 SDRAMs
Power inverter	Envelop Tracking Based Embedded Current Measurement for Monitoring of IGBT and Power Converter System
Power module	Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature swings
power module packaging reliability	Low temperature transient liquid phase bonded Cu-Sn-Mo and Cu-Sn-Ag-Mo interconnects – a novel approach for hybrid metal baseplates
Power Modules	Investigation of Acoustic Emission as a Non-invasive Method for Detection of Power Semiconductor Aging humidity robustness for high voltage power modules: limiting mechanisms and improvement of lifetime
Power MOSFET	The synergetic effects of high temperature gate bias and total ionization dose on 1.2kV SiC devices Investigation of Degradation Mechanisms in Low-Voltage p-Channel Power MOSFETs Under High Temperature Gate Bias Stress Ensure an original and safe “Fail-to-Open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation
Power MOSFETs	Avalanche ruggedness of parallel SiC power MOSFETs
power pin	Failure Signature Analysis of Power-Opens in DDR3 SDRAMs
Power Semiconductor Devices	Measure of High Frequency Input Impedance to Study the Instability of Power Devices in Short Circuit An empirical model for thermal interface materials based on experimental characterizations under realistic conditions
Power Semiconductors	Smart SiC MOSFET accelerated lifetime testing
Power transistor	Radiation robustness of normally-off GaN/HEMT power transistors (COTS)
Power VDMOSFETs	NBTI and irradiation related degradation mechanisms in power VDMOS transistors
Power-amplifiers	Performance-reliability trade-offs in short range RF power amplifier design
prediction	A prediction method for discharge voltage of lithium-ion batteries under unknown dynamic loads Remaining useful life prediction for lithium-ion batteries based on an integrated health indicator
pressed contact	Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam
Printed circuit board	Highlighting two integration technologies based on vias: Through Silicon Vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability. Thermal resistance modelling and design optimization of PCB vias
Printed Circuit Board (PCB)	Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
probing	An acoustic emission sensor system for thin layer crack detection
process optimization	A Novel Method of Reliability-Centered Process Optimization for Additive Manufacturing
process variability	Evaluation of Variability using Schmitt Trigger on Full Adders Layout
Process variation	Process variation dependence of total ionizing dose effects in bulk nFinFETs
prognostic	A Prognostic Methodology for Power MOSFETs Under Thermal Stress Using Echo State Network and Particle Filter
Prognostics and health management	Application of Multi-Output Gaussian Process Regression for Remaining Useful Life Prediction of Light Emitting Diodes
Proton	Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices
pseudo-failure lifetime	A new processing method for accelerated degradation data based on quantile regression and pseudo-failure lifetime
PTM	PTM-based hybrid error-detection architecture for ARM microprocessors
Pulsed electro-acoustic analysis	Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture
PV inverter	System-level Reliability Enhancement of dc/dc Stage of a Single-Phase PV Inverter
PV systems	Photovoltaic plant maintainability optimization and degradation detection: modelling and characterization
PWM Inverter	Degradation estimation using feature increment stepwise linear regression for PWM Inverter of Electro-Mechanical Actuator Capacitor loss analysis method for power electronics converters
PZT Thin Films	Reliability Testing of Integrated Low-Temperature PVD PZT Films
Q
qualification	Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of supercapacitors for industrial applications
quality	An acoustic emission sensor system for thin layer crack detection
quantification of margins and uncertainties	Reliability Assessment for Traction Power Supply System Based on Quantification of Margins and Uncertainties
quantile regression	A new processing method for accelerated degradation data based on quantile regression and pseudo-failure lifetime
quasi-Z-source inverter	Thermal stress reduction of quasi-Z source inverter drive by model predictive control
Quatro	A single event upset tolerant latch design
quiescent current	Complex Automotive ICs defect localization driven by Quiescent Power Supply Current: three cases study
R
R-Flash ADC	Design and Implementation of Reliable Flash ADC for Microwave Applications
Radiation	Analysis of 6T SRAM cell in sub-45nm CMOS and FinFET technologies Radiation robustness of normally-off GaN/HEMT power transistors (COTS) The synergetic effects of high temperature gate bias and total ionization dose on 1.2kV SiC devices
Radiation effects	Evaluating the reliability of a GPU pipeline to SEU and the impacts of software-based and hardware-based fault tolerance techniques On the Analysis of Radiation-induced Single Event Transients on SRAM-based FPGAs
radiation hardened by design	A single event upset tolerant latch design
Radiation hardness	Process variation dependence of total ionizing dose effects in bulk nFinFETs
Radiation Related Degradation	NBTI and irradiation related degradation mechanisms in power VDMOS transistors
Radiation-Hardening-by-Design (RHBD) techniques	Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions
rail potential	Influence Factors Analysis of Rail Potential in Urban Rail Transit
rail transit	Reliability of rail transit traction drive system—a review
Railway traction	Implementation of Direct Chip Junction Temperature Measurement in High Power IGBT Module in Operation - Railway Traction Converter
Raman spectroscopy	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Ramp voltage stress	Statistical Nature of Hard Breakdown Recovery in High-κ Dielectric Stacks Studied using Ramp Voltage Stress
random failure	Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique
RBSOA	Effect of short circuit aging on safe operating area of SiC MOSFET
Real temperature measurement	Lock-in Thermography for defect localization and thermal characterization for space application
Real-time monitoring	A power cycling degradation inspector of power semiconductor devices
Recovery	Towards Understanding Recovery of Hot-Carrier Induced Degradation
redundancy	Reliability model of bond wire fatigue for IGBT in MMC with system redundancy consideration
Reliabil	Reliability model of bond wire fatigue for IGBT in MMC with system redundancy consideration
Reliability	Reliability design of battery management system for power battery A Prognostic Methodology for Power MOSFETs Under Thermal Stress Using Echo State Network and Particle Filter A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems Analysis of 6T SRAM cell in sub-45nm CMOS and FinFET technologies Evaluation of Variability using Schmitt Trigger on Full Adders Layout An Analytical Circuit based Nonlinear Thermal Model for Capacitor Banks Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes Reliability of rail transit traction drive system—a review A Novel Method of Reliability-Centered Process Optimization for Additive Manufacturing Effect of solder material thickness on Power MOSFET reliability by Electro-Thermo-Mechanical Simulations Lifetime prediction of a modified Y-source inverter in photo-voltaic application Implementation of Direct Chip Junction Temperature Measurement in High Power IGBT Module in Operation - Railway Traction Converter Design and Implementation of Reliable Flash ADC for Microwave Applications Mutual and self-aging effects of power semiconductors on the thermal behaviour of DC-DC boost power converter Measurement and Analysis SiC-MOSFET threshold voltage shift The synergetic effects of high temperature gate bias and total ionization dose on 1.2kV SiC devices Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stress Smart SiC MOSFET accelerated lifetime testing The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules System-level Reliability Enhancement of dc/dc Stage of a Single-Phase PV Inverter humidity robustness for high voltage power modules: limiting mechanisms and improvement of lifetime Deriving Lifetime Predictions for Wire Bonds at High Temperatures Reliability concerns from the gray market Design and development of MEMS-based structures for in-situ characterization of thermo-mechanical behaviour of thin metal films Device Characterization of 16/14nm FinFETs for Reliability Assessment with Infrared Emission Spectra Current induced degradation study on state of the art DUV LEDs Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of supercapacitors for industrial applications Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters Performance-reliability trade-offs in short range RF power amplifier design Variation-resilient quantifiable plasma process induced damage monitoring Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules Failure Mechanism Analysis of Fuses Subjected to Manufacturing and Operational Thermal stresses Experimental studies of: laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate Method of Junction Temperature Estimation and Over Temperature Protection Used for Electric Vehicle’s IGBT Power Modules Stress Analysis of CMOS-MEMS Microphone under Shock Loading by Taguchi Method Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology Reliability Testing of Integrated Low-Temperature PVD PZT Films Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature swings Shear properties of In-Bi alloy joints with Cu substrates during thermal aging Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board Characterization of cyclic delamination behavior of thin film multilayers Importance of Electric Resistance Monitoring in Shear Test Reliability and reliability investigation of WBG power devices TCAD Modelling for Reliability The end of gate oxide scaling (for real this time) Vestas’ practice in reliability engineering for power electronics How to successfully overcome inflection points, or long live Moore's law Interplay of humidity and electrical functionality imposing reliability problems in electronics Introduction to the modern Reliability based on physics and statistics Reliability of packages for power devices Dielectric reliability in microelectronics: a tight relationship between degradation and technology Reliability issues in power SiC and GaN
Reliability Analysis	Single-Event Transient Effects on Dynamic Comparator in 28nm FDSOI CMOS Technology
Reliability assessment	Reliability Assessment of Power Conditioner Considering Maintenance in a PEM Fuel Cell System Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults Mutual and self-aging effects of power semiconductors on the thermal behaviour of DC-DC boost power converter Reliability assessment and failure mode analysis of MEMS accelerometers for space applications Reliability Assessment for Traction Power Supply System Based on Quantification of Margins and Uncertainties
reliability evaluation	Reliability of rail transit traction drive system—a review
reliability indicators	Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam
reliability investigation	Reliability and reliability investigation of WBG power devices
reliability model	Reliability of rail transit traction drive system—a review
reliability of capacitor	Capacitor loss analysis method for power electronics converters
reliability of SiC MOSFETs	Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode
Reliability prediction	Simulation and Modelling of Long Term Reliability of Digital Circuits implemented in FPGA
Reliabilty Simulation	NBTI and HCI models for circuit level aging simulations in different EDA environments
Reliable Circuits	Impact of Different Transistor Arrangements on Gate Variability
remaining useful life	Application of Multi-Output Gaussian Process Regression for Remaining Useful Life Prediction of Light Emitting Diodes A Prognostic Methodology for Power MOSFETs Under Thermal Stress Using Echo State Network and Particle Filter Remaining useful life prediction for lithium-ion batteries based on an integrated health indicator
renewable energy	Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated ageing of power electronics
Repassivation	Towards Understanding Recovery of Hot-Carrier Induced Degradation
Repetitive short-circuit test	Evolution of C-V and I-V characteristics for a commercial 600V GaN GIT power device unde repetitive short-circui tests
Repetitive tests	Operating-waveform analysis based reliability evaluation of power MOSFETs used for a leg short-circuit initial charge method
Resilient	Cross-Layer Approaches for Resilient VLSI System Design
Resistive defects	A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs
Resistive RAM	A Lightweight Write-Assist Scheme for Reduced RRAM Variability and Power
Resistive switching	A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory
resistive-random-access memory	Total Ionizing Dose and Single Event Effects of 1Mb HfO2-based Resistive-Random-Access Memory
Resolution	Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters
resonance	Combined experimental and numerical approach to study electro-mechanical resonant phenomena in GaN-on-Si heterostructures An acoustic emission sensor system for thin layer crack detection
RF	Performance-reliability trade-offs in short range RF power amplifier design
RF-MEMS	Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches
Robust design	Gaussian Process Regression Approach for Robust Design and Yield Enhancement of Self-Assembled Nanostructures
Robustness	Avalanche ruggedness of parallel SiC power MOSFETs Measurement and Analysis SiC-MOSFET threshold voltage shift Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs
Rogowski coil	Envelop Tracking Based Embedded Current Measurement for Monitoring of IGBT and Power Converter System
S
Safe failure mode	Ensure an original and safe “Fail-to-Open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation
safety	A Fault-Tolerant Control Strategy for Switched Reluctance Motor Drive for Electric Vehicles Under Short-Fault Condition
Salt Spray Test	Experimental studies of: laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate
SAM	Use of Golden Samples for the Assessment of the Quality and Reproducibility of Scanning Acoustic Microscopy Images of Electronics Samples
Scaling principle	Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena
Scanning Acoustic Microscopy	Metallization Defect Detection in 3D Integrated Components using Scanning Acoustic Microscopy and Acoustic Simulations Non-destructive imaging of defects in Ag-sinter die attach layers – a comparative study including X-Ray, Scanning Acoustic Microscopy and thermography A power cycling degradation inspector of power semiconductor devices Use of Golden Samples for the Assessment of the Quality and Reproducibility of Scanning Acoustic Microscopy Images of Electronics Samples
scanning probe microscopy	High resolution observation of defects at SiO2/4H-SiC interfaces by time-resolved scanning nonlinear dielectric microscopy
Schmitt Trigger	Evaluation of Variability using Schmitt Trigger on Full Adders Layout
SCSOA	Effect of short circuit aging on safe operating area of SiC MOSFET
SDRAM	TCAD simulation of radiation-induced leakage current in 1T1C SDRAM
SEB	Progressive Drain Damage in SiC Power MOSFETs Exposed to Ionizing Radiation
second breakdown	Voltage oscillations during surge pulses induced by self-extinguishing non-destructive second breakdown in pn-junction diodes
security	Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope
SEE	Radiation robustness of normally-off GaN/HEMT power transistors (COTS)
Self assembly	Gaussian Process Regression Approach for Robust Design and Yield Enhancement of Self-Assembled Nanostructures
SEM	Failure Modes and Mechanism Analysis of SiC MOSFET under Short-Circuit Conditions
semiconductor	An acoustic emission sensor system for thin layer crack detection Analysis of Semiconductor Fault using DS (Damped Sinusoidal) HPEM Injection
Sensitivity Analysis	Influence of the pulse length and temperature swing on the relative lifetime estimation for sintered/soldered chip-on-substrate samples via FE-simulation of power cycles
sensor	An acoustic emission sensor system for thin layer crack detection
separated test method	On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition
Shaker	Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
Shear test	Mechanism of Wire Bond Shear Testing Importance of Electric Resistance Monitoring in Shear Test
shear tests	Creep measurement and choice of creep laws for BGA assemblies' reliability simulation
Shock loading	Stress Analysis of CMOS-MEMS Microphone under Shock Loading by Taguchi Method
Shoot-through	Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena
Short Circuit	Measure of High Frequency Input Impedance to Study the Instability of Power Devices in Short Circuit Conducted EMI Evolution of power SiC MOSFET in a Back Converter after Short-Circuit Aging Tests Failure Analysis of 650V Enhancement Mode GaN HEMT after Short Circuit Tests Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs
short circuit aging	Effect of short circuit aging on safe operating area of SiC MOSFET
short pulse power	Transient junction temperature estimation of IGBT using improved thermal model
Short-circuit	Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules Failure Modes and Mechanism Analysis of SiC MOSFET under Short-Circuit Conditions Ensure an original and safe “Fail-to-Open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation
Short-circuit capability	Operating-waveform analysis based reliability evaluation of power MOSFETs used for a leg short-circuit initial charge method
short-fault	A Fault-Tolerant Control Strategy for Switched Reluctance Motor Drive for Electric Vehicles Under Short-Fault Condition
Si IGBT	Thermal Modeling of Wire-bonded Power Modules Considering Non-Uniform Temperature and Electric Current Interactions
SiC	Avalanche ruggedness of parallel SiC power MOSFETs The synergetic effects of high temperature gate bias and total ionization dose on 1.2kV SiC devices Reliability issues in power SiC and GaN
SiC MOSFET	Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules Effect of short circuit aging on safe operating area of SiC MOSFET Conducted EMI Evolution of power SiC MOSFET in a Back Converter after Short-Circuit Aging Tests Investigating SiC MOSFET body diode’s light emission as Temperature-Sensitive Electrical Parameter Smart SiC MOSFET accelerated lifetime testing Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules Thermal Modeling of Wire-bonded Power Modules Considering Non-Uniform Temperature and Electric Current Interactions Failure Modes and Mechanism Analysis of SiC MOSFET under Short-Circuit Conditions Bias temperature instability and condition monitoring in SiC power MOSFETs
SiC MOSFETs	Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs
SiC power module	Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules
SiC Power MOSFET	Progressive Drain Damage in SiC Power MOSFETs Exposed to Ionizing Radiation
signature statistical analysis	New defect detection approach using near electromagnetic field probing for high density PCBAs
SIHFT	SHARC: Efficient Metric for Selective Protection of Software against Soft Errors
Silicon Carbide	Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules
Silicon carbide (SiC)	Ensure an original and safe “Fail-to-Open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation
Silicon Carbide MOSFET	Measurement and Analysis SiC-MOSFET threshold voltage shift
Silicon nitride assisted gate	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
silicon photonics	Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits
silver sinter paste	Influence of thermal exposure upon mechanical/electrical properties and microstructure of sintered micro-porous silver
Silver-sintering die attach	Non-destructive imaging of defects in Ag-sinter die attach layers – a comparative study including X-Ray, Scanning Acoustic Microscopy and thermography
Simulation	Combined experimental and numerical approach to study electro-mechanical resonant phenomena in GaN-on-Si heterostructures Effect of Joule heating on the reliability of solder joints under power cycling conditions
Single Event Burnout	Charge and energy deposition in thick silicon depletion layers by environmental ionizing radiation and terrestrial cosmic rays Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique
Single event cell degradation	TCAD simulation of radiation-induced leakage current in 1T1C SDRAM
single event effects	Total Ionizing Dose and Single Event Effects of 1Mb HfO2-based Resistive-Random-Access Memory
Single Event Transient	Single-Event Transient Effects on Dynamic Comparator in 28nm FDSOI CMOS Technology Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions
Single Event Transients	On the Analysis of Radiation-induced Single Event Transients on SRAM-based FPGAs
single event upset	A single event upset tolerant latch design
single poly CMOS	A New Multitime Programmable Non-volatile Memory Cell Using High Voltage NMOS
Single-phase rectifier	Simple and Effective Open Switch Fault Diagnosis of Single-Phase PWM Rectifier
sinter joining	Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation structure
sinter silver	Corrosion behaviour of sintered silver under maritime environmental conditions
Sintered Silver	Influence of the pulse length and temperature swing on the relative lifetime estimation for sintered/soldered chip-on-substrate samples via FE-simulation of power cycles Modeling the rate-dependent inelastic deformation behavior of porous polycrystalline silver films
SiON dielectrics	Method to extract parameters of power law for nano-scale SiON pMOSFETs under Negative Bias Temperature Instability
sliding mode speed controller	A Reliable Speed Controller for Suppressing Low Frequency Concussion of Electric Vehicle
slow measurement	Method to extract parameters of power law for nano-scale SiON pMOSFETs under Negative Bias Temperature Instability
Snubber	RCD snubber design based on reliability consideration: A case study for thermal balancing in power electronic converters
SOA	Unified view on energy and electrical failure of the short-circuit operation of IGBTs
soft-errors	SHARC: Efficient Metric for Selective Protection of Software against Soft Errors
solar array	The effect of solar cell internal resistance change on the bus voltage ripple in spacecraft power system
solar photovoltaic	Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules
solder alloy	Corrosion reliability of lead-free solder systems used in electronics
solder bumps	Void detection in solder bumps with deep learning
Solder die fatigue failure	Online Condition Monitoring of IGBT Modules Using Voltage Change Rate Identification
solder fatigue	Quantification of lead-free solder fatigue by EBSD analysis
Solder joint	Importance of Electric Resistance Monitoring in Shear Test
solder joint reliability	Creep measurement and choice of creep laws for BGA assemblies' reliability simulation
Solder joints	Effect of Joule heating on the reliability of solder joints under power cycling conditions
solder layer degradation measurement	On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition
soldering induced residual stress	Failure Mechanism Analysis of Fuses Subjected to Manufacturing and Operational Thermal stresses
Space Qualification	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Spatial distribution of degradation	Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress
Spatial resolution	Understanding spatial resolution of laser voltage imaging
Spectra	Detection of Failure Mechanisms in 24-40nm FinFETs with (Spectral) Photon Emission Techniques using InGaAs Camera
Spectral analysis	Current induced degradation study on state of the art DUV LEDs
spectral photon emission	Photon emission as a characterization tool for bipolar parasitics in FinFET technology
spectrum	Device Characterization of 16/14nm FinFETs for Reliability Assessment with Infrared Emission Spectra
sputtering target	Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors
SRAM	Analysis of 6T SRAM cell in sub-45nm CMOS and FinFET technologies In-situ transistor reliability measurements through nanoprobing
SRAM-based FPGA	On the Analysis of Radiation-induced Single Event Transients on SRAM-based FPGAs
stability	Degradation of vertical GaN-on-GaN fin transistors: step-stress and constant voltage experiments
Staggered phase damping	Reliable N Sleep Shuffled Phase Damping Design for Ground Bouncing Noise Mitigation
State of health	Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications Lithium-ion battery state of health estimation with short-term current pulse test and support vector machine
statistical analysis	Statistical analysis of characteristic of ageing precursor of IGBT based on synthetic effect of multi-physical fields
Statistics	Introduction to the modern Reliability based on physics and statistics
Step-stress testing	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
stochastic finite element analysis	A Novel Method of Reliability-Centered Process Optimization for Additive Manufacturing
storage degradation modelling	Manufacturing process-based storage degradation modelling and reliability assessment
storage reliability of batch products	Manufacturing process-based storage degradation modelling and reliability assessment
Stress analysis	Stress Analysis of CMOS-MEMS Microphone under Shock Loading by Taguchi Method
stress-counting	Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
Substrate reliability	Comparison of Experimental, Analytical and Simulation Methods to Estimate Substrate Material Properties for Warpage Reliability Analysis
subthreshold	Evaluation of Variability using Schmitt Trigger on Full Adders Layout
subthreshold hystereisi	VTH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs
supercapacitors	Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of supercapacitors for industrial applications
Superconducting fault current limiter	A novel current-limiting circuit based on resistive-type SFCL for fault in DC power system
Support Vector Machine	Lithium-ion battery state of health estimation with short-term current pulse test and support vector machine
surge protection	Surge Protection Design with Surge-to-Digital Converter for Microelectronic Circuits and Systems
Surge pulse	Voltage oscillations during surge pulses induced by self-extinguishing non-destructive second breakdown in pn-junction diodes
Surge Test	Surge Protection Design with Surge-to-Digital Converter for Microelectronic Circuits and Systems
surge-to-digital converter	Surge Protection Design with Surge-to-Digital Converter for Microelectronic Circuits and Systems
Survival analysis	Deriving Lifetime Predictions for Wire Bonds at High Temperatures
SVM	On-line Fault Diagnosis Model for Locomotive Traction Inverter Based on Wavelet transform and Support Vector Machine
Switched mode power supply	Fault Location of a Switched Mode Power Supply based on Extended Integer-coded Dictionary Method
Switching system	Simple and Effective Open Switch Fault Diagnosis of Single-Phase PWM Rectifier
synergetic effects	The synergetic effects of high temperature gate bias and total ionization dose on 1.2kV SiC devices
system voltage ripple	The effect of solar cell internal resistance change on the bus voltage ripple in spacecraft power system
System-in-Package	Life Prediction Methodology of System-in-Package Based on Physics of Failure
system-level reliability	System-level Reliability Enhancement of dc/dc Stage of a Single-Phase PV Inverter
T
T-gate	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
Taguchi method	Stress Analysis of CMOS-MEMS Microphone under Shock Loading by Taguchi Method
Tandem PV devices	Performance increase of tandem amorphous / microcrystalline Si PV devices under variable illumination and temperature conditions
TCAD	TCAD simulation of radiation-induced leakage current in 1T1C SDRAM Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation TCAD Modelling for Reliability
TCAD simulation	TCAD Study of DLC Coatings for Large-Area High-Power Diodes
TCAD simulations	On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs TCAD investigation on hot-electron injection in new-generation technologies
TEM	Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
temperature	Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules
Temperature Estimate	Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules
Temperature Monitor	Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules
Temperature monitoring	Investigating SiC MOSFET body diode’s light emission as Temperature-Sensitive Electrical Parameter
tensile strength	Influence of thermal exposure upon mechanical/electrical properties and microstructure of sintered micro-porous silver
termination	The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection
Terrestrial cosmic rays	Charge and energy deposition in thick silicon depletion layers by environmental ionizing radiation and terrestrial cosmic rays
Testability	New defect detection approach using near electromagnetic field probing for high density PCBAs
THB	The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection humidity robustness for high voltage power modules: limiting mechanisms and improvement of lifetime
THBHV-DC	The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection
thermal aging	Shear properties of In-Bi alloy joints with Cu substrates during thermal aging Influence of thermal exposure upon mechanical/electrical properties and microstructure of sintered micro-porous silver
Thermal Analysis	Thermal Modeling of Wire-bonded Power Modules Considering Non-Uniform Temperature and Electric Current Interactions
Thermal balancing	RCD snubber design based on reliability consideration: A case study for thermal balancing in power electronic converters
Thermal characterization	Lock-in Thermography for defect localization and thermal characterization for space application An empirical model for thermal interface materials based on experimental characterizations under realistic conditions GaN transistors efficient cooling by graphene foam
thermal control	Two-thermal-states model predictive control for IGBT in three-phase inverter
Thermal coupling	An Analytical Circuit based Nonlinear Thermal Model for Capacitor Banks A Multi-Port Thermal Coupling Model for Multi-Chip Power Modules Suitable for Circuit Simulators
Thermal Cycle	Effect of solder material thickness on Power MOSFET reliability by Electro-Thermo-Mechanical Simulations
Thermal Cycling	Fundamental Frequency Region-based Thermal Control of Power Electronics Modules in High Power Motor Drive Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
Thermal interface materials	An empirical model for thermal interface materials based on experimental characterizations under realistic conditions GaN transistors efficient cooling by graphene foam
Thermal loading	Mutual and self-aging effects of power semiconductors on the thermal behaviour of DC-DC boost power converter Life consumption of a MMC-STATCOM Supporting Wind Power Plants: Impact of the Modulation Strategies Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications
thermal model	Transient junction temperature estimation of IGBT using improved thermal model
Thermal modeling	Thermal resistance modelling and design optimization of PCB vias GaN transistors efficient cooling by graphene foam
Thermal resistance	An empirical model for thermal interface materials based on experimental characterizations under realistic conditions
thermal runaway	Unified view on energy and electrical failure of the short-circuit operation of IGBTs
thermal shock	Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation structure
Thermal simulation	Water cold plates for high power converters: a software tool for easy optimized design
Thermal stress	Operating-waveform analysis based reliability evaluation of power MOSFETs used for a leg short-circuit initial charge method
thermal stresses	Failure Mechanism Analysis of Fuses Subjected to Manufacturing and Operational Thermal stresses
Thermo-Mechanical Analysis	Influence of the pulse length and temperature swing on the relative lifetime estimation for sintered/soldered chip-on-substrate samples via FE-simulation of power cycles
Thermo-Mechanical-Analysis	Modeling the rate-dependent inelastic deformation behavior of porous polycrystalline silver films
thin films	Characterization of cyclic delamination behavior of thin film multilayers
thin layer	An acoustic emission sensor system for thin layer crack detection
thin metal films	Design and development of MEMS-based structures for in-situ characterization of thermo-mechanical behaviour of thin metal films
three level NPC	Direct power control of three-level NPC grid-connected system combined with fault-tolerant technology
three-phase inverters	ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier
threshold method	Void detection in solder bumps with deep learning
Threshold voltage	In-situ transistor reliability measurements through nanoprobing Process variation dependence of total ionizing dose effects in bulk nFinFETs
Threshold voltage degradation	Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress
threshold voltage drift	Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode
Threshold voltage instability	Measurement and Analysis SiC-MOSFET threshold voltage shift
Threshold voltage shift	Bias temperature instability and condition monitoring in SiC power MOSFETs
Through Silicon Via	Highlighting two integration technologies based on vias: Through Silicon Vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.
TID	The total ionizing dose response of Leading-edge FDSOI NMOSFET Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment The synergetic effects of high temperature gate bias and total ionization dose on 1.2kV SiC devices
Time-domain stability anlysis	An Extensible Stability Analysis Method in Time Domain for Cascaded DC-DC Converters in Electrical Vehicles
time-resolved emission microscope	Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope
Tj estimation	Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
Topgraphy and Deformation Measurements	Highlighting two integration technologies based on vias: Through Silicon Vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.
Topside Interconnections	Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling
torque ripples	A Fault-Tolerant Control Strategy for Switched Reluctance Motor Drive for Electric Vehicles Under Short-Fault Condition
Torsion fatigue	Failure mechanism of Ag nanowire-coated conductive transparent electrode for wearable devices under folding and torsional fatigue condition
Total ionizing dose	Process variation dependence of total ionizing dose effects in bulk nFinFETs Total Ionizing Dose and Single Event Effects of 1Mb HfO2-based Resistive-Random-Access Memory
Trace	PTM-based hybrid error-detection architecture for ARM microprocessors
traction	Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
traction drive system	Reliability of rail transit traction drive system—a review
Traction inverter	On-line Fault Diagnosis Model for Locomotive Traction Inverter Based on Wavelet transform and Support Vector Machine
traction power supply system	Reliability Assessment for Traction Power Supply System Based on Quantification of Margins and Uncertainties
transient fault tolerance	A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems
transient liquid phase bonding	Low temperature transient liquid phase bonded Cu-Sn-Mo and Cu-Sn-Ag-Mo interconnects – a novel approach for hybrid metal baseplates
transistor	The end of gate oxide scaling (for real this time)
Transistor Arrangements	Impact of Different Transistor Arrangements on Gate Variability
trap center	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
trapping	A new electro-optical transmission line measurement method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance
Trapping phenomena	On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs
trapping process	Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors
Traps	Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices
TSEP	Investigating SiC MOSFET body diode’s light emission as Temperature-Sensitive Electrical Parameter Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
tuning	An acoustic emission sensor system for thin layer crack detection
U
UIS	Avalanche ruggedness of parallel SiC power MOSFETs
Uncertainty	Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications
unit-to-unit variability	Manufacturing process-based storage degradation modelling and reliability assessment
unknown dynamic load	A prediction method for discharge voltage of lithium-ion batteries under unknown dynamic loads
urban rail transit	Influence Factors Analysis of Rail Potential in Urban Rail Transit
UV illumination	A new electro-optical transmission line measurement method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance
V
Variability	Analysis of 6T SRAM cell in sub-45nm CMOS and FinFET technologies A Lightweight Write-Assist Scheme for Reduced RRAM Variability and Power
vector analysis	A Novel Fault-tolerant Control for Battery-Energy-Storage System Based on Cascade Multilevel Converter with Battery/BMS Failure
Vertical diodes	Degradation of GaN-on-GaN vertical diodes submitted to high current stress
Vertical leakage	Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs
Vertical transistor	Degradation of vertical GaN-on-GaN fin transistors: step-stress and constant voltage experiments
Vestas' prectice	Vestas’ practice in reliability engineering for power electronics
vf-TLP	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
Via	Thermal resistance modelling and design optimization of PCB vias
Vibration	Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
virtual flux	Direct power control of three-level NPC grid-connected system combined with fault-tolerant technology
Visco-Plasticity	Modeling the rate-dependent inelastic deformation behavior of porous polycrystalline silver films
VLSI	Cross-Layer Approaches for Resilient VLSI System Design
void detection	Void detection in solder bumps with deep learning
voltage change rate	Online Condition Monitoring of IGBT Modules Using Voltage Change Rate Identification
voltage oscillations	Voltage oscillations during surge pulses induced by self-extinguishing non-destructive second breakdown in pn-junction diodes
voltage overshoot	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
Vth Hysteresis	VTH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs
W
W thin film sandwich structure	Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation structure
wafer test	An acoustic emission sensor system for thin layer crack detection
Warpage	Comparison of Experimental, Analytical and Simulation Methods to Estimate Substrate Material Properties for Warpage Reliability Analysis
Wavelet transform	On-line Fault Diagnosis Model for Locomotive Traction Inverter Based on Wavelet transform and Support Vector Machine
WBG power devices	Reliability and reliability investigation of WBG power devices
Weibull model	Statistical Nature of Hard Breakdown Recovery in High-κ Dielectric Stacks Studied using Ramp Voltage Stress
Wide band gap semiconductors	Measurement and Analysis SiC-MOSFET threshold voltage shift
wide band-gap semiconductors	Large area die-attachment by silver stress migration bonding for power device applications
Wide Bandgap Devices	Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules
Wire bond	Mechanism of Wire Bond Shear Testing
wire bond interconnect reliability	Cyclic robustness of heavy wire bonds: Al, AlMg, Cu and CucorAl
Wire bonding	Deriving Lifetime Predictions for Wire Bonds at High Temperatures
WLR	Variation-resilient quantifiable plasma process induced damage monitoring
word-line	Effect of OFF-State stress on Reliability of nMOSFET in SWD circuits of DRAM
Work-Function Fluctuation	Impact of Different Transistor Arrangements on Gate Variability
write assist	A Lightweight Write-Assist Scheme for Reduced RRAM Variability and Power
X
X-ray imaging	Void detection in solder bumps with deep learning
Xray tomography of electronics	Automated Detection of Counterfeit ICs using Machine Learning
Y
Y-source inveter	Lifetime prediction of a modified Y-source inverter in photo-voltaic application
Yellow luminescence	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Yield optimization	Gaussian Process Regression Approach for Robust Design and Yield Enhancement of Self-Assembled Nanostructures
Yttrium Oxide	Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches

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