ESREF 2018: 29TH EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS

A
A. Pereira, Heverton	Impact of meteorological variations on the lifetime of grid-connected PV inverters Lifetime Evaluation of a Multifunctional PV Single-Phase Inverter during Harmonic Current Compensation Life consumption of a MMC-STATCOM Supporting Wind Power Plants: Impact of the Modulation Strategies
Abe, Seiya	Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena
Aguiar, Ygor Q.	Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions
Aguirre, Fernando Leonel	Performance-reliability trade-offs in short range RF power amplifier design
Aguirre Morales, Jorge Daniel	Simulation and Modelling of Long Term Reliability of Digital Circuits implemented in FPGA
Ahamadi, Bahar	A novel crowdsourcing platform for microelectronics counterfeit defect detection
Ahilan, A.	Reliable N Sleep Shuffled Phase Damping Design for Ground Bouncing Noise Mitigation Design and Implementation of Reliable Flash ADC for Microwave Applications
Ahmadi, Bahar	Automated Detection of Counterfeit ICs using Machine Learning
Ahsan, S.	Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules
Aichinger, Thomas	Reliability issues in power SiC and GaN
Akbari, Mohsen	Thermal Modeling of Wire-bonded Power Modules Considering Non-Uniform Temperature and Electric Current Interactions
Alatise, Olayiwola	Bias temperature instability and condition monitoring in SiC power MOSFETs
Albandes, Iuri	Design of Approximate-TMR using Approximate Library and Heuristic Approaches
Albert, P.	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Allanic, Fabien	Use of Golden Samples for the Assessment of the Quality and Reproducibility of Scanning Acoustic Microscopy Images of Electronics Samples
Allard, Bruno	The synergetic effects of high temperature gate bias and total ionization dose on 1.2kV SiC devices
Almeida, Roberto	Analysis of 6T SRAM cell in sub-45nm CMOS and FinFET technologies
Altmann, Frank	Analytics for physics of failure in automotive applications
Altuntas, Philippe	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
Ambat, Rajan	Corrosion reliability of lead-free solder systems used in electronics
Ambat, Rajan	Interplay of humidity and electrical functionality imposing reliability problems in electronics
Amini, Elham	IC security and quality improvement by protection of chip backside against hardware attacks Photon emission as a characterization tool for bipolar parasitics in FinFET technology
Antonini, Mattia	GaN transistors efficient cooling by graphene foam
Arabi, Faical	Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
Artola, Laurent	Impact of Different Transistor Arrangements on Gate Variability
Asllani, Besar	VTH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs Avalanche ruggedness of parallel SiC power MOSFETs
Auchlin, Maxime	Reliability assessment and failure mode analysis of MEMS accelerometers for space applications
Autran, Jean-Luc	Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions
Avenas, Yvan	Mutual and self-aging effects of power semiconductors on the thermal behaviour of DC-DC boost power converter
Avino-Salvado, Oriol	Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode
Ayles, T.	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Azambuja, José Rodrigo	Evaluating the reliability of a GPU pipeline to SEU and the impacts of software-based and hardware-based fault tolerance techniques
Azimi, Sarah	On the Analysis of Radiation-induced Single Event Transients on SRAM-based FPGAs
Aziza, Hassen	A Lightweight Write-Assist Scheme for Reduced RRAM Variability and Power
Azzopardi, Stéphane	Effect of short circuit aging on safe operating area of SiC MOSFET
B
Baburske, Roman	Unified view on energy and electrical failure of the short-circuit operation of IGBTs
Baccarani, Giorgio	TCAD Study of DLC Coatings for Large-Area High-Power Diodes Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture
Baeg, Sang	A single event upset tolerant latch design Failure Signature Analysis of Power-Opens in DDR3 SDRAMs
Baeumler, Martina	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
Bahman, Amir Sajjad	Failure Mechanism Analysis of Fuses Subjected to Manufacturing and Operational Thermal stresses Thermal Modeling of Wire-bonded Power Modules Considering Non-Uniform Temperature and Electric Current Interactions
Bahrebar, Sajjad	Reliability Assessment of Power Conditioner Considering Maintenance in a PEM Fuel Cell System
Bak, Geunyong	Failure Signature Analysis of Power-Opens in DDR3 SDRAMs
Baker, Nick	Smart SiC MOSFET accelerated lifetime testing
Balestra, Luigi	TCAD Study of DLC Coatings for Large-Area High-Power Diodes
Balmont, Mickael	Highlighting two integration technologies based on vias: Through Silicon Vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.
Barbato, Marco	Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique
Barletta, Giacomo	Investigation of Degradation Mechanisms in Low-Voltage p-Channel Power MOSFETs Under High Temperature Gate Bias Stress
Barnes, Andrew	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Barros, Rodrigo	Lifetime Evaluation of a Multifunctional PV Single-Phase Inverter during Harmonic Current Compensation
Baszynski, Michal	Experimental studies of: laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate
Bat-Ochir, Bat-Otgon	Envelop Tracking Based Embedded Current Measurement for Monitoring of IGBT and Power Converter System
Battaglia, Anna	Performance increase of tandem amorphous / microcrystalline Si PV devices under variable illumination and temperature conditions
Bayarkhuu, Battuvshin	Envelop Tracking Based Embedded Current Measurement for Monitoring of IGBT and Power Converter System
Bazzano, Gaetano	Effect of solder material thickness on Power MOSFET reliability by Electro-Thermo-Mechanical Simulations
Beaurain, C.	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Beckmeier, Daniel	Variation-resilient quantifiable plasma process induced damage monitoring
Beilenhoff, Klaus	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Ben Hadj Slama, Jaleleddine	Conducted EMI Evolution of power SiC MOSFET in a Back Converter after Short-Circuit Aging Tests
Bensoussan, Alain	Simulation and Modelling of Long Term Reliability of Digital Circuits implemented in FPGA Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stress
Bernardoni, Mirko	Combined experimental and numerical approach to study electro-mechanical resonant phenomena in GaN-on-Si heterostructures
Bey Temsamani, Abdellatif	Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of supercapacitors for industrial applications
Beyreuther, Anne	IC security and quality improvement by protection of chip backside against hardware attacks Photon emission as a characterization tool for bipolar parasitics in FinFET technology
Bezerra, Eduardo	An Efficient EDAC Approach for Handling Multiple Bit Upsets in Memory Array
Bezerra, Francoise	TCAD simulation of radiation-induced leakage current in 1T1C SDRAM
Bhojani, Ritesh	Unified view on energy and electrical failure of the short-circuit operation of IGBTs
Bi, Jinshun	Total Ionizing Dose and Single Event Effects of 1Mb HfO2-based Resistive-Random-Access Memory A single event upset tolerant latch design The synergetic effects of high temperature gate bias and total ionization dose on 1.2kV SiC devices
Bildner, B.	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Birmpiliotis, Dimitrios	Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches
Biscarrat, Jérome	Study of forward AC stress degradation of GaN-on-Si Schottky diodes
Blaabjerg, Frede	Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications System-level Reliability Enhancement of dc/dc Stage of a Single-Phase PV Inverter On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters Simple and Effective Open Switch Fault Diagnosis of Single-Phase PWM Rectifier Thermal resistance modelling and design optimization of PCB vias Thermal stress reduction of quasi-Z source inverter drive by model predictive control Lifetime Prediction of Aluminum Electrolytic Capacitors in LED Drivers Considering Parameter shifts Reliability Assessment of Power Conditioner Considering Maintenance in a PEM Fuel Cell System A Multi-Port Thermal Coupling Model for Multi-Chip Power Modules Suitable for Circuit Simulators Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature swings An empirical model for thermal interface materials based on experimental characterizations under realistic conditions
Blanck, Hervé	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Blaquière, Jean-Marc	Ensure an original and safe “Fail-to-Open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation
Bley, Vincent	Lock-in Thermography for defect localization and thermal characterization for space application
Bocquet, Marc	Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction
Boige, François	Ensure an original and safe “Fail-to-Open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation
Boit, Christian	Device Characterization of 16/14nm FinFETs for Reliability Assessment with Infrared Emission Spectra IC security and quality improvement by protection of chip backside against hardware attacks Detection of Failure Mechanisms in 24-40nm FinFETs with (Spectral) Photon Emission Techniques using InGaAs Camera Photon emission as a characterization tool for bipolar parasitics in FinFET technology
Bojarska, Agata	Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes
Boragno, Luca	On the Analysis of Radiation-induced Single Event Transients on SRAM-based FPGAs
Bord Majek, Isabelle	Highlighting two integration technologies based on vias: Through Silicon Vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.
Borga, Matteo	Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs
Boulzazen, Habib	Conducted EMI Evolution of power SiC MOSFET in a Back Converter after Short-Circuit Aging Tests
Bouw, D.	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Bowers, John E.	Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits
Boyer, Alexandre	New defect detection approach using near electromagnetic field probing for high density PCBAs
Brabec, Christoph	Non-destructive imaging of defects in Ag-sinter die attach layers – a comparative study including X-Ray, Scanning Acoustic Microscopy and thermography
Brandelero, Julio	Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
Breitenbach, Marlies	Reliability investigation of large area solder joints in power electronics modules and its simulative representation
Brenner, Rolf	Voltage oscillations during surge pulses induced by self-extinguishing non-destructive second breakdown in pn-junction diodes
Breuer, Werner	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Briat, Olivier	Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications
Brincker, Mads	Low temperature transient liquid phase bonded Cu-Sn-Mo and Cu-Sn-Ag-Mo interconnects – a novel approach for hybrid metal baseplates
Brito, Erick	Impact of meteorological variations on the lifetime of grid-connected PV inverters Lifetime Evaluation of a Multifunctional PV Single-Phase Inverter during Harmonic Current Compensation
Brunner, Roland	Metallization Defect Detection in 3D Integrated Components using Scanning Acoustic Microscopy and Acoustic Simulations
Brückner, Peter	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
Bu, J.H.	Process variation dependence of total ionizing dose effects in bulk nFinFETs
Buffolo, Matteo	Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits Current induced degradation study on state of the art DUV LEDs Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress
Buonomo, Marco	Effects of stair-case Gate bias stress in IGZO/Al2O3 flexible TFTs Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique
Busatto, Giovanni	Progressive Drain Damage in SiC Power MOSFETs Exposed to Ionizing Radiation Measure of High Frequency Input Impedance to Study the Instability of Power Devices in Short Circuit Failure Analysis of 650V Enhancement Mode GaN HEMT after Short Circuit Tests
Buttay, Cyril	Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode
Butzen, Paulo F.	Analysis of 6T SRAM cell in sub-45nm CMOS and FinFET technologies
Byeon, Jai-Won	Failure mechanism of Ag nanowire-coated conductive transparent electrode for wearable devices under folding and torsional fatigue condition
Béchou, Laurent	Highlighting two integration technologies based on vias: Through Silicon Vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.
Bęczkowski, Szymon	Frequency domain scanning acoustic microscopy for power electronics: physics-based feature identification and selectivity
C
Cai, Hao	Single-Event Transient Effects on Dynamic Comparator in 28nm FDSOI CMOS Technology
Cai, Lei	Lithium-ion battery state of health estimation with short-term current pulse test and support vector machine
Cai, Linlin	Self-heating induced variability and reliability in nanosheet-FETs based SRAM
Cai, X.	The total ionizing dose response of Leading-edge FDSOI NMOSFET
Canato, Eleonora	Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors
Canino, Andrea	Performance increase of tandem amorphous / microcrystalline Si PV devices under variable illumination and temperature conditions
Cantarella, Giuseppe	Effects of stair-case Gate bias stress in IGZO/Al2O3 flexible TFTs
Cardoso Medeiros, Guilherme	A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs
Carmine, Abbate	Progressive Drain Damage in SiC Power MOSFETs Exposed to Ionizing Radiation Measure of High Frequency Input Impedance to Study the Instability of Power Devices in Short Circuit Failure Analysis of 650V Enhancement Mode GaN HEMT after Short Circuit Tests
Castellazzi, Alberto	VTH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules Avalanche ruggedness of parallel SiC power MOSFETs GaN transistors efficient cooling by graphene foam
Cavallaro, Daniela	Effect of solder material thickness on Power MOSFET reliability by Electro-Thermo-Mechanical Simulations
Ceccarelli, Lorenzo	Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules Investigating SiC MOSFET body diode’s light emission as Temperature-Sensitive Electrical Parameter
Ceccarelli, Lorenzo	Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs
Cester, Andrea	Effects of stair-case Gate bias stress in IGZO/Al2O3 flexible TFTs Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique
Chadourne, Nicolas	Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications
Chai, Chunhua	Direct power control of three-level NPC grid-connected system combined with fault-tolerant technology
Chan, Sung-Il	Analysis of Semiconductor Fault using DS (Damped Sinusoidal) HPEM Injection
Chang, Shih-Hsin	MSSCORPS: Inside of 10 nm technology node
Charkaluk, Eric	Importance of Electric Resistance Monitoring in Shear Test
Charles, Alain	On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs
Chartier, Eric	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
Chatry, Nathalie	TCAD simulation of radiation-induced leakage current in 1T1C SDRAM
Chauchat, Bertrand	Implementation of Direct Chip Junction Temperature Measurement in High Power IGBT Module in Operation - Railway Traction Converter
Chehab, Ali	A Lightweight Write-Assist Scheme for Reduced RRAM Variability and Power
Chen, Cen	Fault Location of a Switched Mode Power Supply based on Extended Integer-coded Dictionary Method
Chen, Chuantong	Large area die-attachment by silver stress migration bonding for power device applications Influence of thermal exposure upon mechanical/electrical properties and microstructure of sintered micro-porous silver Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation structure
Chen, Jianjun	Failure Modes and Mechanism Analysis of SiC MOSFET under Short-Circuit Conditions
Chen, Jr-Tai	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Chen, Li	A single event upset tolerant latch design
Chen, Wangyong	Self-heating induced variability and reliability in nanosheet-FETs based SRAM
Chen, Wei	Lifetime estimation of modular cascaded H-bridge MLPVI for grid-connected PV systems considering mission profile
Chen, Wen-Chieh	Surge Protection Design with Surge-to-Digital Converter for Microelectronic Circuits and Systems
Chen, Zhe	Direct power control of three-level NPC grid-connected system combined with fault-tolerant technology
Cheng, Zhihao	A PCH Strong Tracking Control Strategy for Power Coordinated Allocation of Li-SC HESS
Chihani, Omar	Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stress
Chin, Jiann Min	Understanding spatial resolution of laser voltage imaging
Chini, Alessandro	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Chiozzi, Diego	Water cold plates for high power converters: a software tool for easy optimized design
Chiquet, Philippe	Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction
Chithambaram, Shaalini	Failure Analysis on 14nm FinFET Devices with ESD CDM Failure
Chlenov, Aleksandr M.	Impact of elevated temperature applied during low dose rate irradiation on the degradation of BiCMOS operational amplifiers
Cho, Won Ju	Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors
Cho, Yasuo	High resolution observation of defects at SiO2/4H-SiC interfaces by time-resolved scanning nonlinear dielectric microscopy
Choe, Chanyang	Influence of thermal exposure upon mechanical/electrical properties and microstructure of sintered micro-porous silver Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation structure
Choi, Ju-Hwan	Analysis of Semiconductor Fault using DS (Damped Sinusoidal) HPEM Injection
Choi, Ui-Min	Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature swings
Chu, Kaiqi	Statistical analysis of characteristic of ageing precursor of IGBT based on synthetic effect of multi-physical fields
Ciappa, Mauro	Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources Charge and energy deposition in thick silicon depletion layers by environmental ionizing radiation and terrestrial cosmic rays
Cilento, Tommaso	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
Clement, Jean-Claude	Influence of temperature of Storage, Write and Read operations on Multiple Level Cells NAND Flash memories
Constantinescu, Andrei	Importance of Electric Resistance Monitoring in Shear Test
Cornigli, Davide	Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture
Corvasce, Chiara	The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection
Costa, François	Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam
Coutet, Julien	Influence of temperature of Storage, Write and Read operations on Multiple Level Cells NAND Flash memories
Cova, Paolo	Photovoltaic plant maintainability optimization and degradation detection: modelling and characterization GaN transistors efficient cooling by graphene foam Water cold plates for high power converters: a software tool for easy optimized design
Crepel, Oliver	Radiation robustness of normally-off GaN/HEMT power transistors (COTS)
Crespo Marques, Elaine	Single-Event Transient Effects on Dynamic Comparator in 28nm FDSOI CMOS Technology
Croce, Giuseppe	TCAD investigation on hot-electron injection in new-generation technologies
Crocoll, Sonja	NBTI and HCI models for circuit level aging simulations in different EDA environments
Cuenca, Sergio	Design of Approximate-TMR using Approximate Library and Heuristic Approaches SHARC: Efficient Metric for Selective Protection of Software against Soft Errors
Cui, Y.	The total ionizing dose response of Leading-edge FDSOI NMOSFET
Cupertino, Allan	Impact of meteorological variations on the lifetime of grid-connected PV inverters Lifetime Evaluation of a Multifunctional PV Single-Phase Inverter during Harmonic Current Compensation Life consumption of a MMC-STATCOM Supporting Wind Power Plants: Impact of the Modulation Strategies
Czerny, Bernhard	Cyclic robustness of heavy wire bonds: Al, AlMg, Cu and CucorAl
D
Dai, Xixi	A single event upset tolerant latch design
Dammann, Michael	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
Danković, D.	NBTI and irradiation related degradation mechanisms in power VDMOS transistors
Das, Diganta	Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs)
Davari, Pooya	System-level Reliability Enhancement of dc/dc Stage of a Single-Phase PV Inverter Investigation of Acoustic Emission as a Non-invasive Method for Detection of Power Semiconductor Aging
Davenport, Michael L.	Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits
Davidović, V.	NBTI and irradiation related degradation mechanisms in power VDMOS transistors
de Jong, Maurits	Towards Understanding Recovery of Hot-Carrier Induced Degradation
De Santi, Carlo	Degradation of vertical GaN-on-GaN fin transistors: step-stress and constant voltage experiments On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs Degradation of GaN-on-GaN vertical diodes submitted to high current stress Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits Current induced degradation study on state of the art DUV LEDs Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress
De Wolf, Ingrid	Detection of Failure Mechanisms in 24-40nm FinFETs with (Spectral) Photon Emission Techniques using InGaAs Camera Photon emission as a characterization tool for bipolar parasitics in FinFET technology
Debie, Derek	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Decoutere, Stefaan	Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs
Degrenne, Nicolas	Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
Delage, Sylvain	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
Deletage, Jean-Yves	Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
Deletage, Jean-Yves	Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications Creep measurement and choice of creep laws for BGA assemblies' reliability simulation Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stress
Della Marca, Vincenzo	Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction
Delmonte, Nicola	Photovoltaic plant maintainability optimization and degradation detection: modelling and characterization GaN transistors efficient cooling by graphene foam Water cold plates for high power converters: a software tool for easy optimized design
Depetro, Riccardo	TCAD investigation on hot-electron injection in new-generation technologies
Detzel, Thomas	Reliability issues in power SiC and GaN
Dherbecourt, Pascal	Evolution of C-V and I-V characteristics for a commercial 600V GaN GIT power device unde repetitive short-circui tests
Di Natale, Giorgio	Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults
Diao, Jietao	A New Multitime Programmable Non-volatile Memory Cell Using High Voltage NMOS
Dirscherl, Kai	Corrosion reliability of lead-free solder systems used in electronics
Dixon-Luinenburg, Oberon	In-situ transistor reliability measurements through nanoprobing
Djorić-Veljković, S.	NBTI and irradiation related degradation mechanisms in power VDMOS transistors
Dobrzynska, Jagoda	TCAD Study of DLC Coatings for Large-Area High-Power Diodes
Dornic, Nausicaa	Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling
Douzi, Shawki	Conducted EMI Evolution of power SiC MOSFET in a Back Converter after Short-Circuit Aging Tests
Dozolme, Flavien	Influence of temperature of Storage, Write and Read operations on Multiple Level Cells NAND Flash memories
Dreher, Patrick	Non-destructive imaging of defects in Ag-sinter die attach layers – a comparative study including X-Ray, Scanning Acoustic Microscopy and thermography
Driesen, Vital	Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of supercapacitors for industrial applications
Du, B.	On the Analysis of Radiation-induced Single Event Transients on SRAM-based FPGAs
Du, Gang	Self-heating induced variability and reliability in nanosheet-FETs based SRAM
Du, He	Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules
Du, Xiaowei	Reliability design of battery management system for power battery
Dua, Christian	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
Duan, Yuan	Total Ionizing Dose and Single Event Effects of 1Mb HfO2-based Resistive-Random-Access Memory
Dubois, Tristan	Effects of HPEM Stress on GaAs Low-Noise Amplifier from Circuit to Component Scale
Duchamp, Genevieve	Effects of HPEM Stress on GaAs Low-Noise Amplifier from Circuit to Component Scale
Dugarjav, Bayasgalan	Envelop Tracking Based Embedded Current Measurement for Monitoring of IGBT and Power Converter System
Duong, Pham Luu Trung	Gaussian Process Regression Approach for Robust Design and Yield Enhancement of Self-Assembled Nanostructures Application of Multi-Output Gaussian Process Regression for Remaining Useful Life Prediction of Light Emitting Diodes
Dureau, Sandra	Use of Golden Samples for the Assessment of the Quality and Reproducibility of Scanning Acoustic Microscopy Images of Electronics Samples
Durier, André	Simulation and Modelling of Long Term Reliability of Digital Circuits implemented in FPGA Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stress
Dutertre, Jean-Max	Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults
E
Ecoiffier, Diane	INSIDIX: TDM COMPACT3: Multi-physical platform for advanced warpage and strain measurement measurements SELA: Advanced Solutions for Cross-section of visible and buried defects ULTRATEC: ‘In Situ’ Preparation System
Eisele, Ronald	Low temperature transient liquid phase bonded Cu-Sn-Mo and Cu-Sn-Ag-Mo interconnects – a novel approach for hybrid metal baseplates
El Belghiti Alaoui, Nabil	New defect detection approach using near electromagnetic field probing for high density PCBAs
Elharizi, Malika	Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices
Entrena, Luis	PTM-based hybrid error-detection architecture for ARM microprocessors
Escoffier, René	A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
Ewanchuk, Jeffrey	Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
F
Fabiani, Davide	Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture
Fabris, Elena	Degradation of GaN-on-GaN vertical diodes submitted to high current stress
Fan, Peng	Fundamental Frequency Region-based Thermal Control of Power Electronics Modules in High Power Motor Drive
Fang, Xiaochun	Reliability of rail transit traction drive system—a review
Farias, João Victor	Life consumption of a MMC-STATCOM Supporting Wind Power Plants: Impact of the Modulation Strategies
Farooghian, Azin	Modeling the rate-dependent inelastic deformation behavior of porous polycrystalline silver films
Favata, Joseph	A novel crowdsourcing platform for microelectronics counterfeit defect detection
Fayyaz, Asad	VTH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs Avalanche ruggedness of parallel SiC power MOSFETs
Fei, Mei	On-line Fault Diagnosis Model for Locomotive Traction Inverter Based on Wavelet transform and Support Vector Machine
Feng, Ding	Reliability Assessment for Traction Power Supply System Based on Quantification of Margins and Uncertainties
Ferreira de Paiva Leite, Thiago	A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems
Fesquet, Laurent	A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems
Fiegna, Claudio	TCAD investigation on hot-electron injection in new-generation technologies
Fine, Jordan	In-situ transistor reliability measurements through nanoprobing
Flottes, Marie-Lise	Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults
Fouquet, François	Evolution of C-V and I-V characteristics for a commercial 600V GaN GIT power device unde repetitive short-circui tests
Frémont, Hélène	Creep measurement and choice of creep laws for BGA assemblies' reliability simulation Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
Fu, Chuntian	Direct power control of three-level NPC grid-connected system combined with fault-tolerant technology
Fu, Guicui	Life Prediction Methodology of System-in-Package Based on Physics of Failure
Fu, Jian Zhi	Evolution of C-V and I-V characteristics for a commercial 600V GaN GIT power device unde repetitive short-circui tests
Fujiwara, Takashi	Quantification of lead-free solder fatigue by EBSD analysis
G
G, Prathiba	Design and Implementation of Reliable Flash ADC for Microwave Applications
Gadgaard, Kristian	Converter monitoring in a wind turbine application
Gaens, Tim	Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of supercapacitors for industrial applications
Gaillard, Fred	Study of forward AC stress degradation of GaN-on-Si Schottky diodes
Gaillard, Frédéric	A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
Gamarra, Piero	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
Gan, Chee Lip	Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors
Gao, J.	The total ionizing dose response of Leading-edge FDSOI NMOSFET
Gao, Xiang	Degradation of GaN-on-GaN vertical diodes submitted to high current stress
Gao, Yang	Reliability design of battery management system for power battery
Gao, Yu	Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors
Garcia-Valderas, Mario	PTM-based hybrid error-detection architecture for ARM microprocessors
Garg, Reenu	On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs
Gargini, Paolo	How to successfully overcome inflection points, or long live Moore's law
Garnier, Audrey	Exploitation of Laser Voltage techniques for identification and complete characterization of a scan chain transition fail issue using the second harmonic approach
Garros, Xavier	A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
Gatla, Ranjith Kumar	Lifetime estimation of modular cascaded H-bridge MLPVI for grid-connected PV systems considering mission profile
George, Allen Jose	Reliability investigation of large area solder joints in power electronics modules and its simulative representation
Gerardi, Cosimo	Performance increase of tandem amorphous / microcrystalline Si PV devices under variable illumination and temperature conditions
Gevorgyan, Suren A.	Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique
Ghibaudo, Gérard	Study of forward AC stress degradation of GaN-on-Si Schottky diodes
Ghidini, Gabriella	Dielectric reliability in microelectronics: a tight relationship between degradation and technology
Gillot, Charlotte	Study of forward AC stress degradation of GaN-on-Si Schottky diodes
Giovanni, Martines	Further improvements of an extended Hakki-Paoli method
Girard, Maxime	Effects of HPEM Stress on GaAs Low-Noise Amplifier from Circuit to Component Scale
Gnana Malar, A. Jasmine	Reliable N Sleep Shuffled Phase Damping Design for Ground Bouncing Noise Mitigation
Gnani, Elena	TCAD Study of DLC Coatings for Large-Area High-Power Diodes Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture
Gnudi, Antonio	TCAD investigation on hot-electron injection in new-generation technologies TCAD Study of DLC Coatings for Large-Area High-Power Diodes Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture
Goerl, Roger	An Efficient EDAC Approach for Handling Multiple Bit Upsets in Memory Array
Gollhardt, Astrid	Corrosion behaviour of sintered silver under maritime environmental conditions
Golubović, S.	NBTI and irradiation related degradation mechanisms in power VDMOS transistors
Gonçalves, Marcio	Evaluating the reliability of a GPU pipeline to SEU and the impacts of software-based and hardware-based fault tolerance techniques
Graff, A.	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
Graml, Markus	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Greco, Rosario	Effect of solder material thickness on Power MOSFET reliability by Electro-Thermo-Mechanical Simulations
Grunwald, M.	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Grözinger, Tobias	Effect of Joule heating on the reliability of solder joints under power cycling conditions
Grünenpütt, Jan	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Gu, Jingda	Influence Factors Analysis of Rail Potential in Urban Rail Transit
Guetard, Romain	Influence of temperature of Storage, Write and Read operations on Multiple Level Cells NAND Flash memories
Guibaud, Gerald	Ensure an original and safe “Fail-to-Open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation
Guo, Gang	A single event upset tolerant latch design
Guo, Qi	The total ionizing dose response of Leading-edge FDSOI NMOSFET
Guo, Wendi	Life Prediction Methodology of System-in-Package Based on Physics of Failure
Guo, Zhongya	An Extensible Stability Analysis Method in Time Domain for Cascaded DC-DC Converters in Electrical Vehicles
Guédon-Gracia, Alexandrine	Creep measurement and choice of creep laws for BGA assemblies' reliability simulation Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board
Gwoziecki, Romain	Study of forward AC stress degradation of GaN-on-Si Schottky diodes
H
Hachem, Dany	A new electro-optical transmission line measurement method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance
Hajri, Basma	A Lightweight Write-Assist Scheme for Reduced RRAM Variability and Power
Hamdioui, Said	A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs
Hammer, René	Metallization Defect Detection in 3D Integrated Components using Scanning Acoustic Microscopy and Acoustic Simulations
Han, Zhengsheng	Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment Process variation dependence of total ionizing dose effects in bulk nFinFETs
Hao, Shuai	Direct power control of three-level NPC grid-connected system combined with fault-tolerant technology
Hao, Xueling	Remaining useful life prediction for lithium-ion batteries based on an integrated health indicator
Haoyuan, Sha	On-line Fault Diagnosis Model for Locomotive Traction Inverter Based on Wavelet transform and Support Vector Machine
Hasegawa, Kazunori	Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena Envelop Tracking Based Embedded Current Measurement for Monitoring of IGBT and Power Converter System ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier
Haug, Ralf	Effect of Joule heating on the reliability of solder joints under power cycling conditions
He, Ran	Cross-sectional Nanoprobing Sample Preparation on Sub-micron Device with Fast Laser Grooving Technique
He, Zhangqing	A PCH Strong Tracking Control Strategy for Power Coordinated Allocation of Li-SC HESS
He, Zhengyou	Reliability Assessment for Traction Power Supply System Based on Quantification of Margins and Uncertainties
Heliere, Florence	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Helsen, Stijn	Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of supercapacitors for industrial applications
Hepp, Johannes	Non-destructive imaging of defects in Ag-sinter die attach layers – a comparative study including X-Ray, Scanning Acoustic Microscopy and thermography
Herfurth, Norbert	IC security and quality improvement by protection of chip backside against hardware attacks Photon emission as a characterization tool for bipolar parasitics in FinFET technology
Hertl, Michael	Use of Golden Samples for the Assessment of the Quality and Reproducibility of Scanning Acoustic Microscopy Images of Electronics Samples
Hiller, Karla	Reliability Testing of Integrated Low-Temperature PVD PZT Films
Hoffmann, Patrick	Effects of HPEM Stress on GaAs Low-Noise Amplifier from Circuit to Component Scale
Holland, Steffen	Voltage oscillations during surge pulses induced by self-extinguishing non-destructive second breakdown in pn-junction diodes
Hollerith, Christian	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Hollmer, Marc	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Holmer, Rainer	An acoustic emission sensor system for thin layer crack detection
Hook, Michael	Deriving Lifetime Predictions for Wire Bonds at High Temperatures
Hu, Jingge	Transient junction temperature estimation of IGBT using improved thermal model
Hu, Keting	Simple and Effective Open Switch Fault Diagnosis of Single-Phase PWM Rectifier
Hu, Zongyang	Degradation of GaN-on-GaN vertical diodes submitted to high current stress
Huang, Bingxu	Direct power control of three-level NPC grid-connected system combined with fault-tolerant technology
Huang, Chuangmian	A Novel Method of Reliability-Centered Process Optimization for Additive Manufacturing
Huang, Meng	Two-thermal-states model predictive control for IGBT in three-phase inverter Investigation of artificial neural network algorithm based IGBT online condition monitoring Reliability model of bond wire fatigue for IGBT in MMC with system redundancy consideration Transient junction temperature estimation of IGBT using improved thermal model
Huang, Rui	The effect of solar cell internal resistance change on the bus voltage ripple in spacecraft power system
Huang, Shoudao	Fundamental Frequency Region-based Thermal Control of Power Electronics Modules in High Power Motor Drive
Huang, Yang	The total ionizing dose response of Leading-edge FDSOI NMOSFET Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment
Huang, Yunbo	Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment Process variation dependence of total ionizing dose effects in bulk nFinFETs
Hubert, Guillaume	Impact of Different Transistor Arrangements on Gate Variability
Hugger, Alexander	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Huiyu, Miao	On-line Fault Diagnosis Model for Locomotive Traction Inverter Based on Wavelet transform and Support Vector Machine
Hunter, Stevan	Deriving Lifetime Predictions for Wire Bonds at High Temperatures Mechanism of Wire Bond Shear Testing
I
Iannuzzo, Francesco	On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition Smart SiC MOSFET accelerated lifetime testing Failure Mechanism Analysis of Fuses Subjected to Manufacturing and Operational Thermal stresses Simple and Effective Open Switch Fault Diagnosis of Single-Phase PWM Rectifier Thermal Modeling of Wire-bonded Power Modules Considering Non-Uniform Temperature and Electric Current Interactions Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs Investigation of Acoustic Emission as a Non-invasive Method for Detection of Power Semiconductor Aging Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules Investigating SiC MOSFET body diode’s light emission as Temperature-Sensitive Electrical Parameter Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature swings
Ibrahim, Ali	Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices
Imam, Mohamed	On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs
Iman-Eini, Hossein	Mutual and self-aging effects of power semiconductors on the thermal behaviour of DC-DC boost power converter
Irace, Andrea	Avalanche ruggedness of parallel SiC power MOSFETs
Isaza-González, José Iván	SHARC: Efficient Metric for Selective Protection of Software against Soft Errors
Ishii, Hitoshi	Capacitor loss analysis method for power electronics converters
J
Jacquet, Jean-Claude	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
Jancke, Roland	NBTI and HCI models for circuit level aging simulations in different EDA environments
Janvresse, Aurélien	Influence of temperature of Storage, Write and Read operations on Multiple Level Cells NAND Flash memories
Janzen, Sergei	Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated ageing of power electronics
Jaud, Marie-Anne	A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
Javidi, Bahram	Automated Detection of Counterfeit ICs using Machine Learning
Jena, Debdeep	Degradation of GaN-on-GaN vertical diodes submitted to high current stress
Jeong, Yongchae	Analysis of Semiconductor Fault using DS (Damped Sinusoidal) HPEM Injection
Ji, Xiaopeng	A Novel Fault-tolerant Control for Battery-Energy-Storage System Based on Cascade Multilevel Converter with Battery/BMS Failure
Ji, Zhendong	A Novel Fault-tolerant Control for Battery-Energy-Storage System Based on Cascade Multilevel Converter with Battery/BMS Failure
Jiang, Jianguo	A Reliable Speed Controller for Suppressing Low Frequency Concussion of Electric Vehicle
Jiang, Xi	Failure Modes and Mechanism Analysis of SiC MOSFET under Short-Circuit Conditions Detection and Identification of Power Switch Failures for Fault-Tolerant Operation of Flying Capacitor Buck-Boost Converters
Jianyong, Zheng	On-line Fault Diagnosis Model for Locomotive Traction Inverter Based on Wavelet transform and Support Vector Machine
Jiao, Ning	A novel current-limiting circuit based on resistive-type SFCL for fault in DC power system
Jin, Sanghun	Shear properties of In-Bi alloy joints with Cu substrates during thermal aging
Jorgensen, Soren	Converter monitoring in a wind turbine application Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature swings
Jotin, R.	Reliable N Sleep Shuffled Phase Damping Design for Ground Bouncing Noise Mitigation
K
Kaboli, Shahriyar	RCD snubber design based on reliability consideration: A case study for thermal balancing in power electronic converters
Kadi, Moncef	Conducted EMI Evolution of power SiC MOSFET in a Back Converter after Short-Circuit Aging Tests Evolution of C-V and I-V characteristics for a commercial 600V GaN GIT power device unde repetitive short-circui tests
Kanayama, Shutetsu	Shear properties of In-Bi alloy joints with Cu substrates during thermal aging
Kang, Bongkoo	Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress
Kang, Bongkoo	Method to extract parameters of power law for nano-scale SiON pMOSFETs under Negative Bias Temperature Instability
Kanoun, Mehdi	Measurement and Analysis SiC-MOSFET threshold voltage shift
Karl, A.	Non-destructive imaging of defects in Ag-sinter die attach layers – a comparative study including X-Ray, Scanning Acoustic Microscopy and thermography
Kastensmidt, Fernanda	Design of Approximate-TMR using Approximate Library and Heuristic Approaches Impact of Different Transistor Arrangements on Gate Variability
Kauffmann, Steven	Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of supercapacitors for industrial applications
Kawahara, Chihiro	Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique
Keckes, Jozef	Design and development of MEMS-based structures for in-situ characterization of thermo-mechanical behaviour of thin metal films
Kemmer, T.	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
Kempf, Thibault	Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction
Ker, Ming-Dou	Surge Protection Design with Surge-to-Digital Converter for Microelectronic Circuits and Systems
Khan, Hassan	Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules
Khatibi, Golta	Cyclic robustness of heavy wire bonds: Al, AlMg, Cu and CucorAl Characterization of cyclic delamination behavior of thin film multilayers
Khatir, Zoubir	Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices
Kim, Dongjin	Influence of thermal exposure upon mechanical/electrical properties and microstructure of sintered micro-porous silver Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation structure
Kim, Dongshin	Analysis of Semiconductor Fault using DS (Damped Sinusoidal) HPEM Injection
Kim, Gang-Jun	Effect of OFF-State stress on Reliability of nMOSFET in SWD circuits of DRAM Effect of DC/AC stress on the reliability of cell capacitor in DRAM
Kim, Gang-Jun	Method to extract parameters of power law for nano-scale SiON pMOSFETs under Negative Bias Temperature Instability
Kim, H.Y.	Failure mechanism of Ag nanowire-coated conductive transparent electrode for wearable devices under folding and torsional fatigue condition
Kim, Hyeongnam	On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs
Kim, J.Y.	Failure mechanism of Ag nanowire-coated conductive transparent electrode for wearable devices under folding and torsional fatigue condition
Kim, Jongkyun	Effect of DC/AC stress on the reliability of cell capacitor in DRAM
Kim, Jongkyun	Effect of OFF-State stress on Reliability of nMOSFET in SWD circuits of DRAM
Kim, Min-Su	Shear properties of In-Bi alloy joints with Cu substrates during thermal aging
Kim, Sang Woo	Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors
Kimura, Hidehiko	Quantification of lead-free solder fatigue by EBSD analysis
Kinouchi, Shinichi	Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique
Kjær, Philip Carne	Vestas’ practice in reliability engineering for power electronics
Klingler, Markus	Reliability investigation of large area solder joints in power electronics modules and its simulative representation
Knap, Vaclav	Comparison of Lithium-ion Battery Performance at Beginning-of-Life and End-of-Life
Kobayashi, Hiroshi	Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique
Koch, Stephan	ZURICH INSTRUMENTS: Digital Signal Processing for FA
Kohylas, John	Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches
Kolbinger, Elisabeth	Corrosion behaviour of sintered silver under maritime environmental conditions
Kondo, Harufusa	MITSUBISHI: Recent SiC module progress and related applications
Konstanzer, H.	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
Kopta, Arnost	The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection
Kordina, Olof	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Koutsoureli, Matroni	Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches
Kowalsky, J.	Unified view on energy and electrical failure of the short-circuit operation of IGBTs
Kozic, Eva	Metallization Defect Detection in 3D Integrated Components using Scanning Acoustic Microscopy and Acoustic Simulations
Kramer, A.	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Krebs, Frederik C.	Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique
Kremp, Sebastian	humidity robustness for high voltage power modules: limiting mechanisms and improvement of lifetime
Krishnan, Srikanth	Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture
Kristensen, Ole	Investigation of Acoustic Emission as a Non-invasive Method for Detection of Power Semiconductor Aging
Kristensen, Peter K.	Low temperature transient liquid phase bonded Cu-Sn-Mo and Cu-Sn-Ag-Mo interconnects – a novel approach for hybrid metal baseplates
Kroninger, Fred	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Kwon, Hyoungcheol	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
L
Labrousse, Denis	Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode
Lacam, Cédric	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
Lago, Nicolò	Effects of stair-case Gate bias stress in IGZO/Al2O3 flexible TFTs
Lahti, Markku	Reliability assessment and failure mode analysis of MEMS accelerometers for space applications
Lam, Jeffrey	Solving 28nm I/O Circuit Reliability Issue due to Design Weakness
Lancereau, Didier	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
Lang, Klaus-Dieter	Corrosion behaviour of sintered silver under maritime environmental conditions
Lange, Andre	NBTI and HCI models for circuit level aging simulations in different EDA environments
Lanier, Olivier	Effect of Joule heating on the reliability of solder joints under power cycling conditions
Lassmann, Matthias	Moisture Modeling in Complex Systems
Lazzaroni, Massimo	Photovoltaic plant maintainability optimization and degradation detection: modelling and characterization
Lebey, Thierry	Lock-in Thermography for defect localization and thermal characterization for space application
Lebosse, Pierre	Influence of temperature of Storage, Write and Read operations on Multiple Level Cells NAND Flash memories
Lecavelier Des Etangs-Levallois, Aurélien	Importance of Electric Resistance Monitoring in Shear Test
Lee, Chang Hwi	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
Lee, Hosung	Failure Signature Analysis of Power-Opens in DDR3 SDRAMs
Lee, Nam-Hyun	Effect of DC/AC stress on the reliability of cell capacitor in DRAM
Lee, Namhyun	Effect of OFF-State stress on Reliability of nMOSFET in SWD circuits of DRAM
Lee, Seokkiu	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
Lee, Si Woo	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
Lee, Young-Yun	Effect of OFF-State stress on Reliability of nMOSFET in SWD circuits of DRAM
Lee, Yunsung	Effect of DC/AC stress on the reliability of cell capacitor in DRAM
Lee, Yunsung	Effect of OFF-State stress on Reliability of nMOSFET in SWD circuits of DRAM
Lefebvre, Stéphane	Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam Ensure an original and safe “Fail-to-Open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation Effect of short circuit aging on safe operating area of SiC MOSFET Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode
Lei, Baimao	A Novel Method of Reliability-Centered Process Optimization for Additive Manufacturing
Leroux, Paul	Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions
Letz, Sebastian	Modeling the rate-dependent inelastic deformation behavior of porous polycrystalline silver films Influence of the pulse length and temperature swing on the relative lifetime estimation for sintered/soldered chip-on-substrate samples via FE-simulation of power cycles
Li, Binhong	The total ionizing dose response of Leading-edge FDSOI NMOSFET Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment Process variation dependence of total ionizing dose effects in bulk nFinFETs Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory
Li, Bo	Total Ionizing Dose and Single Event Effects of 1Mb HfO2-based Resistive-Random-Access Memory A single event upset tolerant latch design Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment Process variation dependence of total ionizing dose effects in bulk nFinFETs
Li, Caifu	Large area die-attachment by silver stress migration bonding for power device applications
Li, Fei	A Fault-Tolerant Control Strategy for Switched Reluctance Motor Drive for Electric Vehicles Under Short-Fault Condition
Li, Feng	Corrosion reliability of lead-free solder systems used in electronics
Li, Hong	An Extensible Stability Analysis Method in Time Domain for Cascaded DC-DC Converters in Electrical Vehicles
Li, Huimin	Fundamental Frequency Region-based Thermal Control of Power Electronics Modules in High Power Motor Drive
Li, Nga Man Jennifa	Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs)
Li, Pengwei	Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices
Li, Qian	A Novel Method of Reliability-Centered Process Optimization for Additive Manufacturing
Li, Tan	Failure Signature Analysis of Power-Opens in DDR3 SDRAMs
Li, Wenshen	Degradation of GaN-on-GaN vertical diodes submitted to high current stress
Li, Xiangdong	Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs
Li, Xiaolaing	Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices
Li, Yafei	Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory
Li, Yaqiu	A Novel Method of Reliability-Centered Process Optimization for Additive Manufacturing
Li, Zhaojie	Reliability design of battery management system for power battery
Li, Zheng	Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices
Li, Zhongliang	A Prognostic Methodology for Power MOSFETs Under Thermal Stress Using Echo State Network and Particle Filter
Li, Zongjian	Failure Modes and Mechanism Analysis of SiC MOSFET under Short-Circuit Conditions
Liivik, Elizaveta	Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters
Lim, Gabriel	Understanding spatial resolution of laser voltage imaging
Lin, Fei	Reliability of rail transit traction drive system—a review
Lin, Sheng	Reliability Assessment for Traction Power Supply System Based on Quantification of Margins and Uncertainties
Lin, Shuai	Reliability of rail transit traction drive system—a review
Lin, X.W.	TCAD Modelling for Reliability
Lin, Yigang	Manufacturing process-based storage degradation modelling and reliability assessment
Lindemann, Andreas	Combined experimental and numerical approach to study electro-mechanical resonant phenomena in GaN-on-Si heterostructures
Linder, Barry	The end of gate oxide scaling (for real this time)
Lindoso, Almudena	PTM-based hybrid error-detection architecture for ARM microprocessors
Liu, Binghai	Failure Analysis on 14nm FinFET Devices with ESD CDM Failure Cross-sectional Nanoprobing Sample Preparation on Sub-micron Device with Fast Laser Grooving Technique
Liu, Chen	An Extensible Stability Analysis Method in Time Domain for Cascaded DC-DC Converters in Electrical Vehicles
Liu, D.T.	Degradation estimation using feature increment stepwise linear regression for PWM Inverter of Electro-Mechanical Actuator
Liu, Fang	Statistical analysis of characteristic of ageing precursor of IGBT based on synthetic effect of multi-physical fields
Liu, Hongpeng	Lifetime prediction of a modified Y-source inverter in photo-voltaic application
Liu, L.S.	Degradation estimation using feature increment stepwise linear regression for PWM Inverter of Electro-Mechanical Actuator
Liu, Ping	Two-thermal-states model predictive control for IGBT in three-phase inverter Thermal stress reduction of quasi-Z source inverter drive by model predictive control
Liu, Qianshi	Reliability design of battery management system for power battery
Liu, Tianqi	A novel current-limiting circuit based on resistive-type SFCL for fault in DC power system
Liu, Xiaoyan	Self-heating induced variability and reliability in nanosheet-FETs based SRAM
Liu, Yi	Two-thermal-states model predictive control for IGBT in three-phase inverter Thermal stress reduction of quasi-Z source inverter drive by model predictive control Investigation of artificial neural network algorithm based IGBT online condition monitoring
Liu, Yi	Transient junction temperature estimation of IGBT using improved thermal model
Liu, Yi	Reliability model of bond wire fatigue for IGBT in MMC with system redundancy consideration
Liu, Zhao	A Novel Fault-tolerant Control for Battery-Energy-Storage System Based on Cascade Multilevel Converter with Battery/BMS Failure
Liu, Zhigang	Simple and Effective Open Switch Fault Diagnosis of Single-Phase PWM Rectifier
Locatelli, Elsa	Lock-in Thermography for defect localization and thermal characterization for space application
Lombardo, Salvatore	Performance increase of tandem amorphous / microcrystalline Si PV devices under variable illumination and temperature conditions
Longobardi, Giorgia	On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs
Lorin, Thomas	Study of forward AC stress degradation of GaN-on-Si Schottky diodes
Lorin, Thomas	A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
Low, Yi Chao	Solving 28nm I/O Circuit Reliability Issue due to Design Weakness
Lu, Chun-Lin	Stress Analysis of CMOS-MEMS Microphone under Shock Loading by Taguchi Method
Lu, Jiwu	Failure Modes and Mechanism Analysis of SiC MOSFET under Short-Circuit Conditions
Luo, Derong	Fundamental Frequency Region-based Thermal Control of Power Electronics Modules in High Power Motor Drive
Luo, Guangzhao	Lithium-ion battery state of health estimation with short-term current pulse test and support vector machine
Luo, Haoze	On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition Investigating SiC MOSFET body diode’s light emission as Temperature-Sensitive Electrical Parameter
Luo, Jiajun	Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment Process variation dependence of total ionizing dose effects in bulk nFinFETs
Lutz, Josef	Reliability and reliability investigation of WBG power devices Study on power cycling test with different control strategies
Lutz, Josef	Unified view on energy and electrical failure of the short-circuit operation of IGBTs
Lv, He	Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices
M
M, Santhi	Design and Implementation of Reliable Flash ADC for Microwave Applications
Ma, Mingyao	Method of Junction Temperature Estimation and Over Temperature Protection Used for Electric Vehicle’s IGBT Power Modules A Fault-Tolerant Control Strategy for Switched Reluctance Motor Drive for Electric Vehicles Under Short-Fault Condition Statistical analysis of characteristic of ageing precursor of IGBT based on synthetic effect of multi-physical fields
Ma, Ruiqing	An easy-implemented confidence filter for signal processing in the complex electromagnetic environment
Ma, T.	TCAD Modelling for Reliability
Ma, Yinzhe	Failure Analysis on 14nm FinFET Devices with ESD CDM Failure
Maciel, Nilson	Single-Event Transient Effects on Dynamic Comparator in 28nm FDSOI CMOS Technology
Mack, Walter	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Madel, Manfred	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Magnone, Paolo	Investigation of Degradation Mechanisms in Low-Voltage p-Channel Power MOSFETs Under High Temperature Gate Bias Stress
Magrì, Angelo	Investigation of Degradation Mechanisms in Low-Voltage p-Channel Power MOSFETs Under High Temperature Gate Bias Stress
Mahapatrad, S.	TCAD Modelling for Reliability
Mai, Zhihong	Failure Analysis on 14nm FinFET Devices with ESD CDM Failure Cross-sectional Nanoprobing Sample Preparation on Sub-micron Device with Fast Laser Grooving Technique
Maia Filho, Wilson	Importance of Electric Resistance Monitoring in Shear Test
Mandal, Rathin	Comparison of Experimental, Analytical and Simulation Methods to Estimate Substrate Material Properties for Warpage Reliability Analysis
Manić, I.	NBTI and irradiation related degradation mechanisms in power VDMOS transistors
Mannen, Tomoyuki	Operating-waveform analysis based reliability evaluation of power MOSFETs used for a leg short-circuit initial charge method
Manoharan, Subramani	Mechanism of Wire Bond Shear Testing
Manoharan, Subramani	Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs)
Mansour, Mohammad M.	A Lightweight Write-Assist Scheme for Reduced RRAM Variability and Power
Mantegazza, Emanuele	Water cold plates for high power converters: a software tool for easy optimized design
Manzini, Stefano	TCAD investigation on hot-electron injection in new-generation technologies
Marc, François	Simulation and Modelling of Long Term Reliability of Digital Circuits implemented in FPGA Influence of temperature of Storage, Write and Read operations on Multiple Level Cells NAND Flash memories
Marcello, Giulia	Complex Automotive ICs defect localization driven by Quiescent Power Supply Current: three cases study
Marozau, Ivan	Reliability assessment and failure mode analysis of MEMS accelerometers for space applications
Marques, Cleiton M.	Analysis of 6T SRAM cell in sub-45nm CMOS and FinFET technologies
Martin, Andreas	Variation-resilient quantifiable plasma process induced damage monitoring
Martin, Cyril	Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications
Martin-Holgado, Pedro	PTM-based hybrid error-detection architecture for ARM microprocessors
Martins, Mayler	Design of Approximate-TMR using Approximate Library and Heuristic Approaches
Martínez-Álvarez, Antonio	SHARC: Efficient Metric for Selective Protection of Software against Soft Errors
Martínez-Álvarez, Antonio	Design of Approximate-TMR using Approximate Library and Heuristic Approaches
Mataln, Marianne	Combined experimental and numerical approach to study electro-mechanical resonant phenomena in GaN-on-Si heterostructures
Matsumori, Hiroaki	Capacitor loss analysis method for power electronics converters
Mayer, Michael	Deriving Lifetime Predictions for Wire Bonds at High Temperatures
McCluskey, Patrick	Mechanism of Wire Bond Shear Testing Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs)
Meda, Eleonora	Complex Automotive ICs defect localization driven by Quiescent Power Supply Current: three cases study
Medda, Matteo	Complex Automotive ICs defect localization driven by Quiescent Power Supply Current: three cases study
Medgyes, Bálint	Corrosion reliability of lead-free solder systems used in electronics
Mei, Bo	Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices
Mei, Jie	Effect of Joule heating on the reliability of solder joints under power cycling conditions
Mei, Sen	Statistical Nature of Hard Breakdown Recovery in High-κ Dielectric Stacks Studied using Ramp Voltage Stress
Meier, Urban	Reliability evaluation of IGCT from accelerated testing, quality monitoring and field return analysis
Meinhardt, Cristina	Analysis of 6T SRAM cell in sub-45nm CMOS and FinFET technologies Evaluation of Variability using Schmitt Trigger on Full Adders Layout Impact of Different Transistor Arrangements on Gate Variability
Mendes, Victor	Impact of meteorological variations on the lifetime of grid-connected PV inverters Lifetime Evaluation of a Multifunctional PV Single-Phase Inverter during Harmonic Current Compensation
Meneghesso, Gaudenzio	Degradation of vertical GaN-on-GaN fin transistors: step-stress and constant voltage experiments On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits Current induced degradation study on state of the art DUV LEDs Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress
Meneghesso, Gaudenzio	Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors Degradation of GaN-on-GaN vertical diodes submitted to high current stress
Meneghesso, Gaudenzio	Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs
Meneghini, Matteo	Degradation of vertical GaN-on-GaN fin transistors: step-stress and constant voltage experiments On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs Current induced degradation study on state of the art DUV LEDs Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes
Meneghini, Matteo	Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors Degradation of GaN-on-GaN vertical diodes submitted to high current stress Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress
Meneghini, Matteo	Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs
Meng, Jinhao	Lithium-ion battery state of health estimation with short-term current pulse test and support vector machine
Miao, Ying	Reliability design of battery management system for power battery
Michez, Alain	TCAD simulation of radiation-induced leakage current in 1T1C SDRAM
Middendorf, Andreas	Reliability of packages for power devices
Minguet, Armelle	Use of Golden Samples for the Assessment of the Quality and Reproducibility of Scanning Acoustic Microscopy Images of Electronics Samples
Miranda, Enrique	A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory
Mittereder, Tobias	Design and development of MEMS-based structures for in-situ characterization of thermo-mechanical behaviour of thin metal films
Miura, Katsuyoshi	Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope
Mo, Bing	A Novel Method of Reliability-Centered Process Optimization for Additive Manufacturing
Moens, Peter	Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors
Moess, E.	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Mohamed Sathik, Mohamed Halick	Online Condition Monitoring of IGBT Modules Using Voltage Change Rate Identification
Molfese, Antonio	TCAD investigation on hot-electron injection in new-generation technologies
Molin, Quentin	Measurement and Analysis SiC-MOSFET threshold voltage shift
Mollov, Stefan	Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
Monteiro Diniz Reis, Daniel	Reliability Testing of Integrated Low-Temperature PVD PZT Films
Monti, Desiree	Current induced degradation study on state of the art DUV LEDs Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes
Moon, Jung Eon	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
Moraes, Leonardo	Evaluation of Variability using Schmitt Trigger on Full Adders Layout
Morancho, Frédéric	A new electro-optical transmission line measurement method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance
Morel, Hervé	VTH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs Measurement and Analysis SiC-MOSFET threshold voltage shift Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode
Morilla, Yolanda	PTM-based hybrid error-detection architecture for ARM microprocessors
Moroz, V.	TCAD Modelling for Reliability
Morvan, Erwan	A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
Mosbjerg Jensen, Simon	Failure Mechanism Analysis of Fuses Subjected to Manufacturing and Operational Thermal stresses
Motamedi, Babak	Device Characterization of 16/14nm FinFETs for Reliability Assessment with Infrared Emission Spectra
Motzny, S.	TCAD Modelling for Reliability
Mousnier, Morgane	Lock-in Thermography for defect localization and thermal characterization for space application
Moyal, Efrat	LATTICEGEAR: Scribing and cleaving solutions in Nanofab and Research – technologies, workflows and uses cases
Muck, Tobias	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Munk-Nielsen, Stig	Converter monitoring in a wind turbine application Frequency domain scanning acoustic microscopy for power electronics: physics-based feature identification and selectivity
Mura, Giovanna	Reliability concerns from the gray market Further improvements of an extended Hakki-Paoli method
Muydinov, Ruslan	IC security and quality improvement by protection of chip backside against hardware attacks
Muñoz-Gorriz, Jordi	A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory
N
Nagalingam, Dayanand	Failure Analysis on 14nm FinFET Devices with ESD CDM Failure
Nagao, Shijo	Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation structure
Nagler, Oliver	An acoustic emission sensor system for thin layer crack detection
Nakamae, Koji	Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope
Nakamura, Tomonori	Device Characterization of 16/14nm FinFETs for Reliability Assessment with Infrared Emission Spectra Detection of Failure Mechanisms in 24-40nm FinFETs with (Spectral) Photon Emission Techniques using InGaAs Camera Photon emission as a characterization tool for bipolar parasitics in FinFET technology
Naviner, Lirida	Single-Event Transient Effects on Dynamic Comparator in 28nm FDSOI CMOS Technology
Nelhiebel, Michael	Combined experimental and numerical approach to study electro-mechanical resonant phenomena in GaN-on-Si heterostructures Characterization of cyclic delamination behavior of thin film multilayers
Nguyen, Hoang	TCAD simulation of radiation-induced leakage current in 1T1C SDRAM
Nguyen, Luu	Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture
Nguyen, Tien Anh	Effect of short circuit aging on safe operating area of SiC MOSFET
Ni, Pei-Rong	Stress Analysis of CMOS-MEMS Microphone under Shock Loading by Taguchi Method
Niazi, Kamran	Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules
Niedernostheide, Franz-Josef	Unified view on energy and electrical failure of the short-circuit operation of IGBTs
Nielsen, Peter	Converter monitoring in a wind turbine application
Ning, Liu	On-line Fault Diagnosis Model for Locomotive Traction Inverter Based on Wavelet transform and Support Vector Machine
Ninomiya, Tamotsu	Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena
Nirudi, Ramchander	Lifetime estimation of modular cascaded H-bridge MLPVI for grid-connected PV systems considering mission profile
Nishikawa, Hiroshi	Shear properties of In-Bi alloy joints with Cu substrates during thermal aging
Nishizawa, Shin-Ichi	ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier
Niu, Hao	Lifetime Prediction of Aluminum Electrolytic Capacitors in LED Drivers Considering Parameter shifts Manufacturing process-based storage degradation modelling and reliability assessment
Noh, Seungjun	Large area die-attachment by silver stress migration bonding for power device applications Influence of thermal exposure upon mechanical/electrical properties and microstructure of sintered micro-porous silver
Nomoto, Kazuki	Degradation of GaN-on-GaN vertical diodes submitted to high current stress
Nowottnick, Mathias	Reliability investigation of large area solder joints in power electronics modules and its simulative representation
O
Olanrewaju, Olufisayo	Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules
Omura, Ichiro	Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena A fully digital feedback control of gate driver for current balancing of parallel connected power devices Envelop Tracking Based Embedded Current Measurement for Monitoring of IGBT and Power Converter System
Omura, Ichiro	A power cycling degradation inspector of power semiconductor devices ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier
Ortiz Gonzalez, Jose	Bias temperature instability and condition monitoring in SiC power MOSFETs
Oualli, Mourad	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
Ousten, Jean-Pierre	Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices
Ousten, Yves	Highlighting two integration technologies based on vias: Through Silicon Vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.
Outbib, Rachid	A Prognostic Methodology for Power MOSFETs Under Thermal Stress Using Echo State Network and Particle Filter
Outsen, J.-P.	Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling
P
Pagnano, Dario	On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs
Palacios, Tomas	Degradation of vertical GaN-on-GaN fin transistors: step-stress and constant voltage experiments
Palumbo, Felix	Performance-reliability trade-offs in short range RF power amplifier design
Pan, Yanlin	Failure Analysis on 14nm FinFET Devices with ESD CDM Failure Cross-sectional Nanoprobing Sample Preparation on Sub-micron Device with Fast Laser Grooving Technique
Pang, Ying	Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources Charge and energy deposition in thick silicon depletion layers by environmental ionizing radiation and terrestrial cosmic rays
Papadopoulos, Charalampos	The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection
Papaioannou, George	Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches
Paques, Gontran	The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection
Park, Hee Pyung	Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors
Park, Hyunseok	Application of Multi-Output Gaussian Process Regression for Remaining Useful Life Prediction of Light Emitting Diodes
Park, Jong Tae	Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors
Park, Nochang	Analysis of Semiconductor Fault using DS (Damped Sinusoidal) HPEM Injection
Parvari, Ramin	RCD snubber design based on reliability consideration: A case study for thermal balancing in power electronic converters
Pascal, Yoann	Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam
Pastre, Antonin	Influence of temperature of Storage, Write and Read operations on Multiple Level Cells NAND Flash memories
Patard, Olivier	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
Patel, Chandradip	Mechanism of Wire Bond Shear Testing
Pazos, Sebastián Matías	Performance-reliability trade-offs in short range RF power amplifier design
Pecht, Michael	Remaining useful life prediction for lithium-ion batteries based on an integrated health indicator
Pejchal, V.	Reliability assessment and failure mode analysis of MEMS accelerometers for space applications
Pelapurb, Rengarajan	A novel crowdsourcing platform for microelectronics counterfeit defect detection
Pelissier, Serge	Calendar and cycling ageing combination of batteries in electric vehicles
Pellegrino, Gianmario	Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules
Peng, Y.	Degradation estimation using feature increment stepwise linear regression for PWM Inverter of Electro-Mechanical Actuator
Perez, Annie	A Lightweight Write-Assist Scheme for Reduced RRAM Variability and Power
Perlin, Piotr	Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes
Petit, Mickael	Experimental investigation of the reliability of Printed Circuit Board (PCB)-embedded power dies with pressed contact made of metal foam
Petrov, Aleksandr S.	Impact of elevated temperature applied during low dose rate irradiation on the degradation of BiCMOS operational amplifiers
Pey, Kin Leong	Statistical Nature of Hard Breakdown Recovery in High-κ Dielectric Stacks Studied using Ramp Voltage Stress Understanding spatial resolution of laser voltage imaging
Peyghami, Saeed	System-level Reliability Enhancement of dc/dc Stage of a Single-Phase PV Inverter
Peña-Fernandez, Manuel	PTM-based hybrid error-detection architecture for ARM microprocessors
Pfaeffli, Paul	TCAD Modelling for Reliability
Pfaff, Holger	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Pfitzner, Lothar	An acoustic emission sensor system for thin layer crack detection
Pietrobon, Marika	Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits
Pin, Samuel	Creep measurement and choice of creep laws for BGA assemblies' reliability simulation
Piotrowicz, Stéphane	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
Piton, Michel	Implementation of Direct Chip Junction Temperature Measurement in High Power IGBT Module in Operation - Railway Traction Converter
Planson, Dominque	VTH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs
Plissonnier, Marc	A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
Poehls, Letícia	An Efficient EDAC Approach for Handling Multiple Bit Upsets in Memory Array A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs
Popok, Vladimir N.	Low temperature transient liquid phase bonded Cu-Sn-Mo and Cu-Sn-Ag-Mo interconnects – a novel approach for hybrid metal baseplates
Porcher, Nicolas	Use of Golden Samples for the Assessment of the Quality and Reproducibility of Scanning Acoustic Microscopy Images of Electronics Samples
Portesine, Marco	Water cold plates for high power converters: a software tool for easy optimized design
Possamai Bastos, Rodrigo	A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults
Postel-Pellerin, Jérémy	Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction
Potier, Clément	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
Potin, Olivier	Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults
Pou, Josep	Online Condition Monitoring of IGBT Modules Using Voltage Change Rate Identification
Pouget, Vincent	Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions
Poupard, Benoît	Highlighting two integration technologies based on vias: Through Silicon Vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.
Prasanth, Sundararajan	Online Condition Monitoring of IGBT Modules Using Voltage Change Rate Identification
Pribahsnik, Florian Peter	Combined experimental and numerical approach to study electro-mechanical resonant phenomena in GaN-on-Si heterostructures
Prijić, A.	NBTI and irradiation related degradation mechanisms in power VDMOS transistors
Prijić, Z.	NBTI and irradiation related degradation mechanisms in power VDMOS transistors
Principe, Edward L.	Steps toward automated deprocessing of integrated circuits
Q
Qin, Jianhua	The effect of solar cell internal resistance change on the bus voltage ripple in spacecraft power system
Quah, Alfred	Failure Analysis on 14nm FinFET Devices with ESD CDM Failure
Quay, R.	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
Quittard, Olivier	Reliability evaluation of IGCT from accelerated testing, quality monitoring and field return analysis
R
Raghavan, Nagarajan	Statistical Nature of Hard Breakdown Recovery in High-κ Dielectric Stacks Studied using Ramp Voltage Stress Gaussian Process Regression Approach for Robust Design and Yield Enhancement of Self-Assembled Nanostructures Application of Multi-Output Gaussian Process Regression for Remaining Useful Life Prediction of Light Emitting Diodes Comparison of Experimental, Analytical and Simulation Methods to Estimate Substrate Material Properties for Warpage Reliability Analysis
Rahimo, Munaf	The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection
Rannestad, Bjorn	Converter monitoring in a wind turbine application
Rastayesh, Sima	Reliability Assessment of Power Conditioner Considering Maintenance in a PEM Fuel Cell System
Ravikumar, Venkat Krishnan	Understanding spatial resolution of laser voltage imaging
Raynaud, Christophe	Measurement and Analysis SiC-MOSFET threshold voltage shift
Redondo-Iglesias, Eduardo	Calendar and cycling ageing combination of batteries in electric vehicles
Reggiani, Susanna	TCAD investigation on hot-electron injection in new-generation technologies TCAD Study of DLC Coatings for Large-Area High-Power Diodes Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture
Regnier, Arnaud	Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction
Reigosa, Paula	Impact of meteorological variations on the lifetime of grid-connected PV inverters On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition Thermal Modeling of Wire-bonded Power Modules Considering Non-Uniform Temperature and Electric Current Interactions Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules
Reis, Ricardo A. L.	Analysis of 6T SRAM cell in sub-45nm CMOS and FinFET technologies Evaluation of Variability using Schmitt Trigger on Full Adders Layout Impact of Different Transistor Arrangements on Gate Variability
Renso, Nicola	Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress
Restrepo-Calle, Felipe	SHARC: Efficient Metric for Selective Protection of Software against Soft Errors
Revenberg, Kees	MASER: Next generation Accelerated Life test systems for individual sub-40nm node IC’s
Reverdy, Antoine	Exploitation of Laser Voltage techniques for identification and complete characterization of a scan chain transition fail issue using the second harmonic approach
Riccio, Michele	Avalanche ruggedness of parallel SiC power MOSFETs
Ricco Galluzzo, Fabio	Performance increase of tandem amorphous / microcrystalline Si PV devices under variable illumination and temperature conditions
Richard, Isaline	Use of Golden Samples for the Assessment of the Quality and Reproducibility of Scanning Acoustic Microscopy Images of Electronics Samples
Richardeau, Frédéric	Ensure an original and safe “Fail-to-Open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation
Rimmen, Peter	Introduction to the modern Reliability based on physics and statistics
Rivai, Fransiscus	Cross-sectional Nanoprobing Sample Preparation on Sub-micron Device with Fast Laser Grooving Technique
Rizzo, Antonio	Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique
Rodriguez, Axel	TCAD simulation of radiation-induced leakage current in 1T1C SDRAM
Rodriguez Fernandez, Alberto	A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory
Ronzani, Matteo	Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress
Rosc, Jördis	Metallization Defect Detection in 3D Integrated Components using Scanning Acoustic Microscopy and Acoustic Simulations
Rossetti, Mattia	TCAD investigation on hot-electron injection in new-generation technologies
Rouzeyre, Bruno	Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults
Ruzzarin, Maria	Degradation of vertical GaN-on-GaN fin transistors: step-stress and constant voltage experiments
Rydygier, Przemyslaw	Experimental studies of: laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate
Rzepka, Sven	Reliability Testing of Integrated Low-Temperature PVD PZT Films
Rzin, Mehdi	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Rämer, Olaf	Corrosion behaviour of sintered silver under maritime environmental conditions
S
Saghaeian, Fahimeh	Design and development of MEMS-based structures for in-situ characterization of thermo-mechanical behaviour of thin metal films
Saigné, Frédéric	Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions
Saillen, Nicolas	Reliability assessment and failure mode analysis of MEMS accelerometers for space applications
Salm, Cora	Towards Understanding Recovery of Hot-Carrier Induced Degradation
Samavatian, Vahid	Mutual and self-aging effects of power semiconductors on the thermal behaviour of DC-DC boost power converter
Samparisi, F.	Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits
Sanchez, Kévin	Lock-in Thermography for defect localization and thermal characterization for space application
Sangiorgi, Enrico	TCAD investigation on hot-electron injection in new-generation technologies
Sangwongwanich, Ariya	Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters
Sanseverino, Annunziata	Progressive Drain Damage in SiC Power MOSFETs Exposed to Ionizing Radiation Measure of High Frequency Input Impedance to Study the Instability of Power Devices in Short Circuit Failure Analysis of 650V Enhancement Mode GaN HEMT after Short Circuit Tests
Saquetti, Mateus	Evaluating the reliability of a GPU pipeline to SEU and the impacts of software-based and hardware-based fault tolerance techniques
Sartory, Bernhard	Metallization Defect Detection in 3D Integrated Components using Scanning Acoustic Microscopy and Acoustic Simulations
Sasangka, Wardhana	Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors
Sasongko, Firman	Online Condition Monitoring of IGBT Modules Using Voltage Change Rate Identification
Schaffus, Martina	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Schaffus, Tim	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Schildbach, C.	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Schilling, Oliver	humidity robustness for high voltage power modules: limiting mechanisms and improvement of lifetime
Schletz, Andreas	Modeling the rate-dependent inelastic deformation behavior of porous polycrystalline silver films Influence of the pulse length and temperature swing on the relative lifetime estimation for sintered/soldered chip-on-substrate samples via FE-simulation of power cycles
Schmidt, Ralf	Non-destructive imaging of defects in Ag-sinter die attach layers – a comparative study including X-Ray, Scanning Acoustic Microscopy and thermography
Schmitz, Jurriaan	Towards Understanding Recovery of Hot-Carrier Induced Degradation
Schneider, Daniel	The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection
Schneider-Ramelow, Martin	Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated ageing of power electronics
Schrank, Franz	Metallization Defect Detection in 3D Integrated Components using Scanning Acoustic Microscopy and Acoustic Simulations
Schreiber, Kai-Alexander	Design and development of MEMS-based structures for in-situ characterization of thermo-mechanical behaviour of thin metal films
Schulze, Hans-Joachim	Unified view on energy and electrical failure of the short-circuit operation of IGBTs
Scuto, Andrea	Performance increase of tandem amorphous / microcrystalline Si PV devices under variable illumination and temperature conditions
Seko, Atsuki	Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope
Selvanayagam, Cheryl	Comparison of Experimental, Analytical and Simulation Methods to Estimate Substrate Material Properties for Warpage Reliability Analysis
Seo, Ji-Hoon	Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress
Seo, Ji-Hoon	Method to extract parameters of power law for nano-scale SiON pMOSFETs under Negative Bias Temperature Instability
Seok, Jung Eun	Effect of DC/AC stress on the reliability of cell capacitor in DRAM
Seok, Jungeun	Effect of OFF-State stress on Reliability of nMOSFET in SWD circuits of DRAM
Sereda, Olha	Reliability assessment and failure mode analysis of MEMS accelerometers for space applications
Serrano, Alejandro	Design of Approximate-TMR using Approximate Library and Heuristic Approaches
Serre, Pauline	Use of Golden Samples for the Assessment of the Quality and Reproducibility of Scanning Acoustic Microscopy Images of Electronics Samples
Serviere, Jean-François	Implementation of Direct Chip Junction Temperature Measurement in High Power IGBT Module in Operation - Railway Traction Converter
Seung, Manho	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
Shahbazmohamadi, Sina	A novel crowdsourcing platform for microelectronics counterfeit defect detection Automated Detection of Counterfeit ICs using Machine Learning
Shahbeigi-Roodposhti, Peiman	A novel crowdsourcing platform for microelectronics counterfeit defect detection
Shen, Yanfeng	Thermal resistance modelling and design optimization of PCB vias
Shen, Z. John	Detection and Identification of Power Switch Failures for Fault-Tolerant Operation of Flying Capacitor Buck-Boost Converters
Shen, Z. John	Failure Modes and Mechanism Analysis of SiC MOSFET under Short-Circuit Conditions
Shi, Xiao	A new processing method for accelerated degradation data based on quantile regression and pseudo-failure lifetime
Shimizu, Toshihisa	Capacitor loss analysis method for power electronics converters
Shin, Joong Woon	Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors
Shu, Ji	A novel current-limiting circuit based on resistive-type SFCL for fault in DC power system
Shuai, Zhikang	Detection and Identification of Power Switch Failures for Fault-Tolerant Operation of Flying Capacitor Buck-Boost Converters
Siegert, Joerg	Metallization Defect Detection in 3D Integrated Components using Scanning Acoustic Microscopy and Acoustic Simulations
Silva, Fábio R. G.	Analysis of 6T SRAM cell in sub-45nm CMOS and FinFET technologies
Silveira, Fernando	Performance-reliability trade-offs in short range RF power amplifier design
Silvestri, L.	TCAD Modelling for Reliability
Simon, Flaviu-Bogdan	Influence of the pulse length and temperature swing on the relative lifetime estimation for sintered/soldered chip-on-substrate samples via FE-simulation of power cycles
Simon, Flaviu-Bogdan	Modeling the rate-dependent inelastic deformation behavior of porous polycrystalline silver films
Simon-Najasek, M.	Comparison of Reliability of 100 nm AlGaN/GaN HEMTs with T-Gate and SAG-Gate Technology
Sivasankari, B.	Reliable N Sleep Shuffled Phase Damping Design for Ground Bouncing Noise Mitigation
Sommer, Daniel	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Son, Donghee	Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress
Son, Donghee	Method to extract parameters of power law for nano-scale SiON pMOSFETs under Negative Bias Temperature Instability
Souchon, Frederic	Reliability assessment and failure mode analysis of MEMS accelerometers for space applications
Sousa, Renata	Life consumption of a MMC-STATCOM Supporting Wind Power Plants: Impact of the Modulation Strategies
Splettstößer, Jörg	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Stanković, S.	NBTI and irradiation related degradation mechanisms in power VDMOS transistors
Stefenelli, Mario	Characterization of cyclic delamination behavior of thin film multilayers
Stella, Fausto	Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules
Sterpone, Luca	On the Analysis of Radiation-induced Single Event Transients on SRAM-based FPGAs
Stiasny, Thomas	Reliability evaluation of IGCT from accelerated testing, quality monitoring and field return analysis
Stieglauer, Hermann	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
Stockman, Arno	Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors
Stoffels, Steve	Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs
Stojadinovic, Nino	NBTI and irradiation related degradation mechanisms in power VDMOS transistors
Straube, Stefan	Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated ageing of power electronics
Stroe, Ana-Irina	Comparison of Lithium-ion Battery Performance at Beginning-of-Life and End-of-Life
Stroe, Daniel-Ioan	Lithium-ion battery state of health estimation with short-term current pulse test and support vector machine Comparison of Lithium-ion Battery Performance at Beginning-of-Life and End-of-Life
Stuhldreier, Hannes	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Su, Yutai	Life Prediction Methodology of System-in-Package Based on Physics of Failure
Suetake, Aiji	Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation structure
Sugahara, Tohru	Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation structure
Suganuma, Katsuaki	Large area die-attachment by silver stress migration bonding for power device applications Influence of thermal exposure upon mechanical/electrical properties and microstructure of sintered micro-porous silver Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation structure
Sun, Chenchen	Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources
Sun, Jinming	On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs
Sun, Meidi	Fundamental Frequency Region-based Thermal Control of Power Electronics Modules in High Power Motor Drive
Sun, Min	Degradation of vertical GaN-on-GaN fin transistors: step-stress and constant voltage experiments
Sun, Xiaojun	Reliability Assessment for Traction Power Supply System Based on Quantification of Margins and Uncertainties
Sun, Xiaoman	Investigation of artificial neural network algorithm based IGBT online condition monitoring
Sun, Yi	Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices
Sun, Yongquan	Remaining useful life prediction for lithium-ion batteries based on an integrated health indicator
Sun, Zhiyu	Method of Junction Temperature Estimation and Over Temperature Protection Used for Electric Vehicle’s IGBT Power Modules
Suñe, Jordi	A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory
Szyszka, Bernd	IC security and quality improvement by protection of chip backside against hardware attacks
Söhl, Stefan	Low temperature transient liquid phase bonded Cu-Sn-Mo and Cu-Sn-Ag-Mo interconnects – a novel approach for hybrid metal baseplates
T
Tahoori, Mehdi B.	Cross-Layer Approaches for Resilient VLSI System Design
Tajalli, Alaleh	Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors
Takano, Koushi	Capacitor loss analysis method for power electronics converters
Tallarico, Andrea Natale	TCAD investigation on hot-electron injection in new-generation technologies
Tan, Hao	Cross-sectional Nanoprobing Sample Preparation on Sub-micron Device with Fast Laser Grooving Technique
Tan, Pik Kee	Solving 28nm I/O Circuit Reliability Issue due to Design Weakness Failure Analysis on 14nm FinFET Devices with ESD CDM Failure Cross-sectional Nanoprobing Sample Preparation on Sub-micron Device with Fast Laser Grooving Technique
Tan, Soon Leng	Solving 28nm I/O Circuit Reliability Issue due to Design Weakness
Tang, Diyin	A prediction method for discharge voltage of lithium-ion batteries under unknown dynamic loads
Tang, Min	Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices
Tang, Sai	Detection and Identification of Power Switch Failures for Fault-Tolerant Operation of Flying Capacitor Buck-Boost Converters
Tang, Weiqi	A prediction method for discharge voltage of lithium-ion batteries under unknown dynamic loads
Taouil, Mottaqiallah	A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs
Tapero, Konstantin I.	Impact of elevated temperature applied during low dose rate irradiation on the degradation of BiCMOS operational amplifiers
Tavakoli Bina, Mohammad	Thermal Modeling of Wire-bonded Power Modules Considering Non-Uniform Temperature and Electric Current Interactions
Tavousi, Pouya	A novel crowdsourcing platform for microelectronics counterfeit defect detection
Tedesco, Davide	Progressive Drain Damage in SiC Power MOSFETs Exposed to Ionizing Radiation
Tedesco, Davide	Measure of High Frequency Input Impedance to Study the Instability of Power Devices in Short Circuit Failure Analysis of 650V Enhancement Mode GaN HEMT after Short Circuit Tests
Teisseire, Laurent	Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes
Teodorescu, Remus	Lithium-ion battery state of health estimation with short-term current pulse test and support vector machine
Terterian, Arsen	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
Thompson, Carl V.	Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors
Théolier, Loïc	Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stress
Tiwari, R.	TCAD Modelling for Reliability
Tlig, Mohamed	Conducted EMI Evolution of power SiC MOSFET in a Back Converter after Short-Circuit Aging Tests
Torres, Alphonse	A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
Torto, Lorenzo	Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique
Tosi, Carlo	TCAD Study of DLC Coatings for Large-Area High-Power Diodes
Touboul, Antoine D.	Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions
Toulon, Gaëtan	A new electro-optical transmission line measurement method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance
Tounsi, Patrick	New defect detection approach using near electromagnetic field probing for high density PCBAs
Trampert, Stefan	Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated ageing of power electronics
Tran, S.H.	Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling
Tripathi, Ravi Nath	A fully digital feedback control of gate driver for current balancing of parallel connected power devices
Trivellin, Nicola	Current induced degradation study on state of the art DUV LEDs
Trémouilles, David	A new electro-optical transmission line measurement method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance
Tsukuda, Masanori	Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena A fully digital feedback control of gate driver for current balancing of parallel connected power devices Envelop Tracking Based Embedded Current Measurement for Monitoring of IGBT and Power Converter System
Tu, Chunming	Failure Modes and Mechanism Analysis of SiC MOSFET under Short-Circuit Conditions
Tuncer, Enis	Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture
U
Udrea, Florin	On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs
Uhrenfeldt, Christian	Frequency domain scanning acoustic microscopy for power electronics: physics-based feature identification and selectivity
Ulimov, Viktor N.	Impact of elevated temperature applied during low dose rate irradiation on the degradation of BiCMOS operational amplifiers
Unterreitmeier, Marianne	An acoustic emission sensor system for thin layer crack detection
Urata, Kazuki	Capacitor loss analysis method for power electronics converters
V
Vaccaro, Filippo	Water cold plates for high power converters: a software tool for easy optimized design
Van Hove, Marleen	Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs
van Veenhuizen, Marc	Void detection in solder bumps with deep learning
Vandendaele, William	A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
Vandendaele, William	Study of forward AC stress degradation of GaN-on-Si Schottky diodes
Vandevelde, Benjamin	TCAD simulation of radiation-induced leakage current in 1T1C SDRAM
Vanzi, Massimo	Further improvements of an extended Hakki-Paoli method
Vargas, Fabian	An Efficient EDAC Approach for Handling Multiple Bit Upsets in Memory Array
Vargas, Fabian Luis	A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs
Varghese, Dhanoop	Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture
Velarde Gonzalez, Fabio Alberto	NBTI and HCI models for circuit level aging simulations in different EDA environments
Velardi, Francesco	Progressive Drain Damage in SiC Power MOSFETs Exposed to Ionizing Radiation Measure of High Frequency Input Impedance to Study the Instability of Power Devices in Short Circuit Failure Analysis of 650V Enhancement Mode GaN HEMT after Short Circuit Tests
Venet, Pascal	Calendar and cycling ageing combination of batteries in electric vehicles
Verdingovas, Vadimas	Corrosion reliability of lead-free solder systems used in electronics
Vernica, Ionut	Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications
Vetter, Andreas	Non-destructive imaging of defects in Ag-sinter die attach layers – a comparative study including X-Ray, Scanning Acoustic Microscopy and thermography
Viard, Arnaud	New defect detection approach using near electromagnetic field probing for high density PCBAs
Viera, Raphael	Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults
Villa, Emanuele	Exploitation of Laser Voltage techniques for identification and complete characterization of a scan chain transition fail issue using the second harmonic approach
Villa, Paulo	An Efficient EDAC Approach for Handling Multiple Bit Upsets in Memory Array
Villar, P.	Qualification of GaN microwave transistors for the European Space Agency Biomass mission
Vinassa, Jean-Michel	Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications
Vivet, Nicolas	Use of Golden Samples for the Assessment of the Quality and Reproducibility of Scanning Acoustic Microscopy Images of Electronics Samples
Vobecky, Jan	TCAD Study of DLC Coatings for Large-Area High-Power Diodes
Vogel, Dietmar	Reliability assessment and failure mode analysis of MEMS accelerometers for space applications
Vogt, Ivo	Device Characterization of 16/14nm FinFETs for Reliability Assessment with Infrared Emission Spectra Detection of Failure Mechanisms in 24-40nm FinFETs with (Spectral) Photon Emission Techniques using InGaAs Camera
W
Wada, Keiji	Operating-waveform analysis based reliability evaluation of power MOSFETs used for a leg short-circuit initial charge method
Wada, Yukihiko	Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique
Wagner, Stefan	Corrosion behaviour of sintered silver under maritime environmental conditions
Walter, J.	Influence of Sample Preparation on Intrinsic Stresses inside a Model Chip - First Results of Partial Decapsulation
Walter, Thomas	Characterization of cyclic delamination behavior of thin film multilayers
Waltisberg, Ch.	Reliability evaluation of IGCT from accelerated testing, quality monitoring and field return analysis
Wan, Bo	Life Prediction Methodology of System-in-Package Based on Physics of Failure
Wan, Fayu	Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment
Wan, Jiuqing	A prediction method for discharge voltage of lithium-ion batteries under unknown dynamic loads
Wang, Chunhui	A Novel Method of Reliability-Centered Process Optimization for Additive Manufacturing
Wang, Daming	Detection and Identification of Power Switch Failures for Fault-Tolerant Operation of Flying Capacitor Buck-Boost Converters
Wang, H.	Reliability Assessment of Power Conditioner Considering Maintenance in a PEM Fuel Cell System
Wang, Haibin	A single event upset tolerant latch design Process variation dependence of total ionizing dose effects in bulk nFinFETs
Wang, Haoran	An Analytical Circuit based Nonlinear Thermal Model for Capacitor Banks
Wang, Hongyi	Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory A New Multitime Programmable Non-volatile Memory Cell Using High Voltage NMOS
Wang, Huai	Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications System-level Reliability Enhancement of dc/dc Stage of a Single-Phase PV Inverter Fundamental Frequency Region-based Thermal Control of Power Electronics Modules in High Power Motor Drive Thermal resistance modelling and design optimization of PCB vias Two-thermal-states model predictive control for IGBT in three-phase inverter Thermal stress reduction of quasi-Z source inverter drive by model predictive control Lifetime Prediction of Aluminum Electrolytic Capacitors in LED Drivers Considering Parameter shifts An Analytical Circuit based Nonlinear Thermal Model for Capacitor Banks A Multi-Port Thermal Coupling Model for Multi-Chip Power Modules Suitable for Circuit Simulators An empirical model for thermal interface materials based on experimental characterizations under realistic conditions
Wang, Jian	The total ionizing dose response of Leading-edge FDSOI NMOSFET
Wang, Jianing	Method of Junction Temperature Estimation and Over Temperature Protection Used for Electric Vehicle’s IGBT Power Modules A Fault-Tolerant Control Strategy for Switched Reluctance Motor Drive for Electric Vehicles Under Short-Fault Condition
Wang, Jun	Failure Modes and Mechanism Analysis of SiC MOSFET under Short-Circuit Conditions Detection and Identification of Power Switch Failures for Fault-Tolerant Operation of Flying Capacitor Buck-Boost Converters
Wang, Kunliang	Self-heating induced variability and reliability in nanosheet-FETs based SRAM
Wang, Li	The effect of solar cell internal resistance change on the bus voltage ripple in spacecraft power system
Wang, Mengjun	Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory
Wang, Panbao	Lifetime prediction of a modified Y-source inverter in photo-voltaic application
Wang, Qingmin	Manufacturing process-based storage degradation modelling and reliability assessment
Wang, Rui	Method of Junction Temperature Estimation and Over Temperature Protection Used for Electric Vehicle’s IGBT Power Modules A Fault-Tolerant Control Strategy for Switched Reluctance Motor Drive for Electric Vehicles Under Short-Fault Condition
Wang, Shuai	A Novel Fault-tolerant Control for Battery-Energy-Storage System Based on Cascade Multilevel Converter with Battery/BMS Failure
Wang, Shujuan	Lifetime Prediction of Aluminum Electrolytic Capacitors in LED Drivers Considering Parameter shifts
Wang, Shunliang	A novel current-limiting circuit based on resistive-type SFCL for fault in DC power system
Wang, Wei	Lifetime prediction of a modified Y-source inverter in photo-voltaic application
Wang, Xiaofan	Reliability of rail transit traction drive system—a review
Wang, Yanbo	A novel current-limiting circuit based on resistive-type SFCL for fault in DC power system
Wang, Yangsheng	A single event upset tolerant latch design
Wang, Ye	Method of Junction Temperature Estimation and Over Temperature Protection Used for Electric Vehicle’s IGBT Power Modules Statistical analysis of characteristic of ageing precursor of IGBT based on synthetic effect of multi-physical fields
Wang, Ye	Life Prediction Methodology of System-in-Package Based on Physics of Failure
Wang, Zhongxu	A Multi-Port Thermal Coupling Model for Multi-Chip Power Modules Suitable for Circuit Simulators An empirical model for thermal interface materials based on experimental characterizations under realistic conditions
Watanabe, Akihiko	A power cycling degradation inspector of power semiconductor devices
Weigel, Robert	An acoustic emission sensor system for thin layer crack detection
Weisser, Ludger	PARK SYSTEMS: Automatizing Atomic Force Microscopy – Newest technological solutions in advanced applications for failure analysis
Wenisch-Kober, Felix	Study on power cycling test with different control strategies
Wittler, Olaf	Reliability of packages for power devices
Wo, H.Y.	TCAD Modelling for Reliability
Woirgard, Eric	Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stress
Wojcik, Mariusz	Experimental studies of: laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation rate
Wong, Hei	Statistical Nature of Hard Breakdown Recovery in High-κ Dielectric Stacks Studied using Ramp Voltage Stress
Wrachien, Nicola	Effects of stair-case Gate bias stress in IGZO/Al2O3 flexible TFTs Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique
Wrobel, Frédéric	Analysis of the charge sharing effect in the SET sensitivity of bulk 45nm standard cell layouts under heavy ions TCAD simulation of radiation-induced leakage current in 1T1C SDRAM
Wu, Hui	Lifetime prediction of a modified Y-source inverter in photo-voltaic application
Wu, Jianfei	Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment A New Multitime Programmable Non-volatile Memory Cell Using High Voltage NMOS
Wu, Jianfei	Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory
Wu, Tiezhou	A PCH Strong Tracking Control Strategy for Power Coordinated Allocation of Li-SC HESS
Wu, Wentao	Lifetime prediction of a modified Y-source inverter in photo-voltaic application
Wuest, Felix	Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated ageing of power electronics
X
Xi, Kai	Total Ionizing Dose and Single Event Effects of 1Mb HfO2-based Resistive-Random-Access Memory
Xie, Yunyun	A Novel Fault-tolerant Control for Battery-Energy-Storage System Based on Cascade Multilevel Converter with Battery/BMS Failure
Xing, Huili Grace	Degradation of GaN-on-GaN vertical diodes submitted to high current stress
Xu, Guoningxu	Reliability design of battery management system for power battery
Xu, Liewei	The total ionizing dose response of Leading-edge FDSOI NMOSFET
Xu, Shunqiang	A New Multitime Programmable Non-volatile Memory Cell Using High Voltage NMOS
Xu, X.	TCAD Modelling for Reliability
Xu, Xuechu	Gaussian Process Regression Approach for Robust Design and Yield Enhancement of Self-Assembled Nanostructures
Xuan, Feng	Statistical Nature of Hard Breakdown Recovery in High-κ Dielectric Stacks Studied using Ramp Voltage Stress
Xue, Yaoting	An easy-implemented confidence filter for signal processing in the complex electromagnetic environment
Y
Yamagishi, Yuji	High resolution observation of defects at SiO2/4H-SiC interfaces by time-resolved scanning nonlinear dielectric microscopy
Yamamoto, Ken	Quantification of lead-free solder fatigue by EBSD analysis
Yang, Guoliang	Direct power control of three-level NPC grid-connected system combined with fault-tolerant technology
Yang, Joel K.W.	Understanding spatial resolution of laser voltage imaging
Yang, Jun	A new processing method for accelerated degradation data based on quantile regression and pseudo-failure lifetime
Yang, Ling	Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment Process variation dependence of total ionizing dose effects in bulk nFinFETs
Yang, Qing	Gaussian Process Regression Approach for Robust Design and Yield Enhancement of Self-Assembled Nanostructures
Yang, S.S.	The effect of solar cell internal resistance change on the bus voltage ripple in spacecraft power system
Yang, Shuying	A Fault-Tolerant Control Strategy for Switched Reluctance Motor Drive for Electric Vehicles Under Short-Fault Condition
Yang, T.	TCAD Modelling for Reliability
Yang, Won-Jon	Failure mechanism of Ag nanowire-coated conductive transparent electrode for wearable devices under folding and torsional fatigue condition
Yang, Xiaofeng	Influence Factors Analysis of Rail Potential in Urban Rail Transit
Yang, Xin	Detection and Identification of Power Switch Failures for Fault-Tolerant Operation of Flying Capacitor Buck-Boost Converters
Yang, Xin	Failure Modes and Mechanism Analysis of SiC MOSFET under Short-Circuit Conditions
Yang, Yongheng	Impact of meteorological variations on the lifetime of grid-connected PV inverters Hotspots and performance evaluation of crystalline-silicon and thin-film photovoltaic modules An easy-implemented confidence filter for signal processing in the complex electromagnetic environment
Yang, Zhongping	Reliability of rail transit traction drive system—a review
Yang, Zineng	Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules
Ye, Xuerong	Lifetime Prediction of Aluminum Electrolytic Capacitors in LED Drivers Considering Parameter shifts Fault Location of a Switched Mode Power Supply based on Extended Integer-coded Dictionary Method Manufacturing process-based storage degradation modelling and reliability assessment
Ye, Zhipeng	A Novel Method of Reliability-Centered Process Optimization for Additive Manufacturing
Yeh, Meng-Kao	Stress Analysis of CMOS-MEMS Microphone under Shock Loading by Taguchi Method
Yeom, Jeyun	Large area die-attachment by silver stress migration bonding for power device applications
Yi, Haitao	Direct power control of three-level NPC grid-connected system combined with fault-tolerant technology
Yi, Pan	On-line Fault Diagnosis Model for Locomotive Traction Inverter Based on Wavelet transform and Support Vector Machine
Yin, Huaxiang	Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment Process variation dependence of total ionizing dose effects in bulk nFinFETs
Yoo, Ki-Tae	Failure mechanism of Ag nanowire-coated conductive transparent electrode for wearable devices under folding and torsional fatigue condition
Yu, Fang	The total ionizing dose response of Leading-edge FDSOI NMOSFET
Yu, Jinsong	A prediction method for discharge voltage of lithium-ion batteries under unknown dynamic loads
Yu, Qingkui	Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs devices
Yun, Chan-Su	Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation
Yun, Yeohyeok	Method to extract parameters of power law for nano-scale SiON pMOSFETs under Negative Bias Temperature Instability Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress
Z
Zaki, Fadi	Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices
Zanella, Stéphane	Importance of Electric Resistance Monitoring in Shear Test
Zanoni, Enrico	Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors Degradation of GaN-on-GaN vertical diodes submitted to high current stress
Zanoni, Enrico	On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits Current induced degradation study on state of the art DUV LEDs Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress
Zanoni, Enrico	Degradation of vertical GaN-on-GaN fin transistors: step-stress and constant voltage experiments
Zanoni, Enrico	Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs
Zarghani, Mostafa	RCD snubber design based on reliability consideration: A case study for thermal balancing in power electronic converters
Zeng, Dingjun	Lifetime estimation of modular cascaded H-bridge MLPVI for grid-connected PV systems considering mission profile
Zeng, Guang	Study on power cycling test with different control strategies
Zerarka, Moustafa	Radiation robustness of normally-off GaN/HEMT power transistors (COTS)
Zha, Xiaoming	Two-thermal-states model predictive control for IGBT in three-phase inverter Transient junction temperature estimation of IGBT using improved thermal model
Zha, Xiaoming	Reliability model of bond wire fatigue for IGBT in MMC with system redundancy consideration
Zha, Xiaoming	Investigation of artificial neural network algorithm based IGBT online condition monitoring
Zhai, Guofu	Fault Location of a Switched Mode Power Supply based on Extended Integer-coded Dictionary Method Manufacturing process-based storage degradation modelling and reliability assessment
Zhan, Mingyue	Statistical analysis of characteristic of ageing precursor of IGBT based on synthetic effect of multi-physical fields
Zhang, Chao	Detection and Identification of Power Switch Failures for Fault-Tolerant Operation of Flying Capacitor Buck-Boost Converters
Zhang, Dan	A Reliable Speed Controller for Suppressing Low Frequency Concussion of Electric Vehicle
Zhang, Hao	Large area die-attachment by silver stress migration bonding for power device applications
Zhang, Jianchun	A new processing method for accelerated degradation data based on quantile regression and pseudo-failure lifetime
Zhang, Jiasheng	A PCH Strong Tracking Control Strategy for Power Coordinated Allocation of Li-SC HESS
Zhang, Qingzhu	Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment Process variation dependence of total ionizing dose effects in bulk nFinFETs
Zhang, Teng	The synergetic effects of high temperature gate bias and total ionization dose on 1.2kV SiC devices
Zhang, Xiaojun	Reliability design of battery management system for power battery
Zhang, Xing	Self-heating induced variability and reliability in nanosheet-FETs based SRAM
Zhang, Y.J.	Degradation estimation using feature increment stepwise linear regression for PWM Inverter of Electro-Mechanical Actuator
Zhang, Yi	A Multi-Port Thermal Coupling Model for Multi-Chip Power Modules Suitable for Circuit Simulators An empirical model for thermal interface materials based on experimental characterizations under realistic conditions
Zhang, Yuanci	Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications
Zhang, Zhen	An easy-implemented confidence filter for signal processing in the complex electromagnetic environment
Zhang, Zhongqing	Life Prediction Methodology of System-in-Package Based on Physics of Failure
Zhao, Kai	The total ionizing dose response of Leading-edge FDSOI NMOSFET
Zhao, Ming	Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs
Zhao, Yuzhe	Solving 28nm I/O Circuit Reliability Issue due to Design Weakness Failure Analysis on 14nm FinFET Devices with ESD CDM Failure Cross-sectional Nanoprobing Sample Preparation on Sub-micron Device with Fast Laser Grooving Technique
Zheng, Liming	A New Multitime Programmable Non-volatile Memory Cell Using High Voltage NMOS
Zheng, Minxin	Reliability design of battery management system for power battery
Zheng, Qiwen	The total ionizing dose response of Leading-edge FDSOI NMOSFET
Zheng, Tao	Reliability model of bond wire fatigue for IGBT in MMC with system redundancy consideration
Zheng, Trillion Q.	An Extensible Stability Analysis Method in Time Domain for Cascaded DC-DC Converters in Electrical Vehicles Influence Factors Analysis of Rail Potential in Urban Rail Transit
Zheng, Zhixue	A Prognostic Methodology for Power MOSFETs Under Thermal Stress Using Echo State Network and Particle Filter
Zheng, Zhongshan	Process variation dependence of total ionizing dose effects in bulk nFinFETs
Zhou, Dao	Mission profile resolution impacts on the thermal stress and reliability of power devices in PV inverters Reliability Assessment of Power Conditioner Considering Maintenance in a PEM Fuel Cell System
Zhou, Yapeng	Remaining useful life prediction for lithium-ion batteries based on an integrated health indicator
Zhu, Guorong	Lifetime estimation of modular cascaded H-bridge MLPVI for grid-connected PV systems considering mission profile
Zhu, Huiping	Process variation dependence of total ionizing dose effects in bulk nFinFETs
Zhu, Jiawei	A Novel Method of Reliability-Centered Process Optimization for Additive Manufacturing
Zhu, Wei	Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory
Ziaei, Afshin	Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches
Zimmermann, André	Effect of Joule heating on the reliability of solder joints under power cycling conditions
Zimpeck, Alexandra	Evaluation of Variability using Schmitt Trigger on Full Adders Layout Impact of Different Transistor Arrangements on Gate Variability
Zipprich, Juergen	Reliability investigation of large area solder joints in power electronics modules and its simulative representation