ESREF 2018: 29TH EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS
Laugstuen

Room C

Sessions

  • Session T2 (Oct 01 10:50-12:20) Tutorial
  • Session T4 (Oct 01 13:10-14:40) Tutorial
  • Session C-1 (Oct 01 17:00-18:00) Photoemission and Laser Techniques in Defect Analysis
  • Session K-2 (Oct 02 08:40-10:20) System-Level Reliability and Condition Monitoring of Photovoltaic and Wind Systems
  • Session BP1 (Oct 02 11:20-11:40) Best Paper IPFA 2018
  • Session B1-1 (Oct 02 11:40-12:20) Si-Technologies & Nanoelectronics: Hot Carriers, High-K, Gate Materials
  • Session B1-2 (Oct 02 14:20-15:20) Si-Technologies & Nanoelectronics
  • Session BP2 (Oct 02 15:20-15:40) Best Paper IRPS 2018
  • Session B3 (Oct 02 16:20-17:00) EOS and Memory Upset
  • Session SS1-1 (Oct 03 08:40-10:00) State of Health of Li-Ion Batteries
  • Session SS1-2 (Oct 03 11:00-12:20) Automotive Systems Reliability
  • Session SS1-3 (Oct 03 14:00-15:40) Reliability Assessment and Fault Tolerant Control
  • Session G (Oct 04 08:40-10:20) MEMS, Sensors and Organic Electronics reliability
  • Session D (Oct 04 10:40-12:20) Reliability and Qualification of Microwave GaN Technologies