Hall East

Room A

Session OP (Oct 01 14:40-15:20) Conference Opening
Session KN (Oct 01 15:20-16:40) Keynotes
Session E1-1 (Oct 01 17:00-18:00) Capacitor Reliability
Session E1-2 (Oct 02 08:40-10:20) Power Semiconductor Reliability
Session INV1 (Oct 02 10:40-11:20) Invited
Session E1-3 (Oct 02 11:20-12:20) System Application Reliability
Session INV2 (Oct 02 13:40-14:20) Invited
Session E2-1 (Oct 02 14:20-16:00) SiC and GaN Device Reliability (1)
Session E2-2 (Oct 02 16:20-17:40) GaN/SiC Trapping and Failure
Session E2-3 (Oct 03 08:40-10:00) SiC and GaN device reliability (2)
Session INV4 (Oct 03 10:20-11:00) Invited
Session F-2 (Oct 03 11:00-12:20) Device Internal Solder Joints
Session INV6 (Oct 03 13:20-14:00) Invited
Session F-3 (Oct 03 14:00-15:40) Material & Construction
Session C-2 (Oct 04 08:40-10:20) Defect Detection Using Microscopy and Probing Techniques
Session C-3 (Oct 04 10:40-12:00) Manufacturing Weaknesses Leading to Failure
Session END (Oct 04 12:20-13:00) Conference closing
Session APETT (Oct 04 13:00-17:30) APETT Symposium