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Conference: ESREF 2026 (37th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis)

This page shows all presentations from this conference published in EasyChair Smart Slide.

Hot Carrier Degradation Sense Effect at Cryogenic Temperature in 28NM FD-SOI Transistor

Hot Carrier Degradation Sense Effect at Cryogenic Temperature in 28NM FD-SOI Transistor

Goran Durand, Mikaël Cassé, Xavier Federspiel, Philippe Galy, Emmanuel Vincent and Irina Ionica

Improvement of GaN HEMT Reliability by Reduction of Intrinsic Oxygen

Improvement of GaN HEMT Reliability by Reduction of Intrinsic Oxygen

Benjamin Weber, Michael Dammann, Peter Brückner, Martina Baeumler, Andreas Graff, Michel Simon-Najasek, Philipp Neininger and Rüdiger Quay

Thermo-Reflectance Monitoring in Laser Voltage Imaging for Effective Bridge Defects Localization

Thermo-Reflectance Monitoring in Laser Voltage Imaging for Effective Bridge Defects Localization

Angelo Antonio Merassi

Presentations in this collection: 3
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