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Author: Irina Ionica

This page shows all presentations of this author published in EasyChair Smart Slide.

Hot Carrier Degradation Sense Effect at Cryogenic Temperature in 28NM FD-SOI Transistor

Hot Carrier Degradation Sense Effect at Cryogenic Temperature in 28NM FD-SOI Transistor

Goran Durand, Mikaël Cassé, Xavier Federspiel, Philippe Galy, Emmanuel Vincent and Irina Ionica

28nm FD-SOI I/O Transistor Hot-Carrier Injection at Cryogenic Temperature

28nm FD-SOI I/O Transistor Hot-Carrier Injection at Cryogenic Temperature

Goran Durand, Flavio-Enrico Bergamaschi, Mikaël Cassé, Xavier Federspiel, Philippe Galy, Emmanuel Vincent and Irina Ionica

Presentations in this collection: 2
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