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Author: Andreas Graff

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Improvement of GaN HEMT Reliability by Reduction of Intrinsic Oxygen

Improvement of GaN HEMT Reliability by Reduction of Intrinsic Oxygen

Benjamin Weber, Michael Dammann, Peter Brückner, Martina Baeumler, Andreas Graff, Michel Simon-Najasek, Philipp Neininger and Rüdiger Quay

Presentations in this collection: 1
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