Paolo Bernardi (MS'02 and PhD'06 in Computer Science) is an Associate Professor of Politecnico di Torino University, where he works in the Electronic CAD and Reliability research group. His current interests include System-on-Chip tests and reliability. Prof. Bernardi is the Program Chair of the IEEE International Test Conference 2025 and he has been  the General Chair of the IEEE European Test Symposium 2023. He is an IEEE senior member.