Jayant D’Souza is the Technical Product Director for yield learning products in the Siemens EDA Tessent® group. Jayant holds an MSEE degree from the University of North Carolina at Charlotte (USA). He has over 20 years of experience in the design-for-test (DFT), automatic test pattern generation (ATPG), scan diagnosis and yield learning areas. He is currently focused on the application of DFT and scan on defect diagnosis and yield learning.