PROGRAM FOR TUESDAY, NOVEMBER 3RD: TALK VIEW
Days:
next day
all days
View: with abstractssession overview
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
16:30
17:00
17:30
10:00-11:00 Opening Session
11:30-11:50
Qicheng Huang, Chenlei Fang, Shawn Blanton
11:50-12:10
Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu
12:10-12:30
Fei Su, Prashant Goteti, Min Zhang
11:30-11:50
Chen-Hung Wu, Cheng-Yun Hsieh, Jiun-Yun Li, James Chien-Mo Li
11:50-12:10
Vijay Kiran Kalyanam, Eric Mahurin, Michael Spence, Jacob Abraham
12:10-12:30
Pandey, Liao, Nandi, Gupta, Sinha, Natarajan, Singh, Chatterjee
11:30-11:50
Suhasini Komarraju, Abhijit Chatterjee
11:50-12:10
Marampally Saikiran, Mona Ganji, Degang Chen
12:10-12:30
Jun Chen, Masanori Hashimoto
11:45-12:00
Sanchez-Martinez, Lopez-Meyer, Juarez-Hernandez, Desiga-Orenday, Viveros-Wacher
12:00-12:15
Cost-Effective Test Method that can screen out Unexpected Failure in High Speed Serial Interface IPs
S.-U. Ahn, B.-K. Seo, H.-W. Kim, Y.-S. Shin, H.-T. Kim, G.-G. Oh, Y.-D. Kim
12:15-12:30
Ma, Lu, Qian, Han, Wen, Meng, Keim, Yang, Singhal, Huang
13:00-13:20
N. L'Esperance, R. Redburn, B. Nandakumar, A. Malik, A. Chhabra, S. Chillarige
13:20-13:40
Srikanth Venkataaman
13:40-14:00
Zeye Liu, Ronald Blanton
13:00-13:30
Gabriele Boschi, Elisa Spano, Hayk Grigoryan, Arun Kumar, Gurgen Harutyunyan
13:00-13:20
Wei-Hao Chen, Chu-Chun Hsu, Shi-Yu Huang
13:20-13:40
Wei Gao, Tao Jing
13:40-14:00
Muslum Emir Avci, Sule Ozev
13:00-13:15
Kun-Han Tsai, Khen Wee, Uri Shpiro, Justyna Zawada, Xijiang Lin
13:15-13:30
Youngsu Oh, Dongmin Han, Byeongseon Go, Seungtaek Lee, Woosik Jeong
13:30-13:45
Benoit Nadeau-Dostie, Luc Romain
13:45-14:00
J. Yun, B. Nadeau-Dostie, M. Keim, L. Schramm, C. Dray, M. Boujamaa, K. Gelda
15:30-16:30 Panel: Chiplet and Test Trends
16:30-17:30 Panel: The Effect of 2020 on the Test Industry
11:00-11:30 Social/Exhibit Hall
12:30-13:00 Social/Exhibit Hall
14:00-14:30 Social/Exhibit Hall
14:30-15:30 Diamond Support Presentation