Program for Tuesday, November 3rd: Session View

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ITC2020: INTERNATIONAL TEST CONFERENCE 2020

PROGRAM AUTHORS KEYWORDS

PROGRAM FOR TUESDAY, NOVEMBER 3RD: SESSION VIEW

Days:

View: with abstracts talk overview

10:00

10:30

11:00

11:30

12:00

12:30

13:00

13:30

14:00

14:30

15:00

15:30

16:00

16:30

17:00

17:30

10:00-11:00

Session Plenary1

Opening Session

Main-Stage Room (Virtual Ball Room)

11:30-12:30

Learning for Failure Analysis and Prediction

Technical Presentation Room A

11:30-12:30

Novel Test Pattern Generation

Technical Presentation Room B

11:30-12:30

Test and Mitigation with Analog and RF

Technical Presentation Room C

11:30-12:30

Interconnect Testing & Test Access (IP Papers)

Technical Presentation Room D

13:00-14:00

Enhancing Yield and Diagnosis

Technical Presentation Room A

13:00-14:00

Special Session on Chiplet

Technical Presentation Room B

13:00-14:00

Sensing and Modeling for Analog & RF

Technical Presentation Room C

13:00-14:00

Microprocessor & Memory Test (IP Papers)

Technical Presentation Room D

15:30-16:30

Panel: Chiplet and Test Trends

Main-Stage Room (Virtual Ball Room)

16:30-17:30

Panel: The Effect of 2020 on the Test Industry

Main-Stage Room (Virtual Ball Room)

11:00-11:30 Social/Exhibit Hall

12:30-13:00 Social/Exhibit Hall

14:00-14:30 Social/Exhibit Hall

14:30-15:30 Diamond Support Presentation

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