ESREF2025: ESREF 2025 : 36TH EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS
PROGRAM FOR MONDAY, OCTOBER 6TH
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13:50-14:30 Session KN: Keynote
13:50
SAFETY in cars

ABSTRACT. Functional Safety and reliability have always been tightly connected. The Hardware integrity of a safe system is fully dependent on the hardware random faults, which drastically influence the Safety concept based on very old reliability handbooks (SN29500, former IEC61508, FIDES). The upcoming so-called Software Defined Vehicle (SDV) becomes a game changer that does heavily impact the approach of Functional Safety. The balance between hardware and software must be revisited while the hardware safety concept moves to different challenges, mostly related to dependability and availability. Electrification, and in the future autonomous driving, do change the operating lifetime of the system. The extended mission profile does have an impact on the Safety related residual failure rate and therefore on the safety concept. The main challenge is then to define more realistic base failure rate of the semiconductor elements.

15:30-15:50Coffee Break
15:50-17:20 Session T1: Tutorial
15:50
Reliability aspects of novel device architectures

ABSTRACT. This talk will address front-end reliability considerations and the associated challenges arising from the transition to Gate-All-Around (GAA) MOSFET architectures in advanced logic technologies. We will also explore emerging device architectures—such as Forksheet FETs—that enable continued logic cell scaling. The tutorial will further delve into the unique integration challenges introduced by these novel structures and assess their implications on both time-zero and time-dependent device performance.