ESREF 2020: 31ST EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS

This page contains an index consisting of author-provided keywords.

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- Copper layer	New power module concept in PCB-Embedded technology with silver sintering die attach
- Packaging	New power module concept in PCB-Embedded technology with silver sintering die attach
- PCB-Embedded	New power module concept in PCB-Embedded technology with silver sintering die attach
- Power module	New power module concept in PCB-Embedded technology with silver sintering die attach
- Silver sintering	New power module concept in PCB-Embedded technology with silver sintering die attach
2
2N	Gold Wire Bond Study for Automotive Application
3
3-D thermal network model	A 3-D thermal network model for the temperature monitoring of thermal grease as interface material
3D flash memory	Profiling of carriers in a 3D flash memory cell with nanometer-level resolution using scanning nonlinear dielectric microscopy
3D ICs	Heavy ion track straggling effect in single event effect numerical simulation of 3D stacked devices
3D Image processing	Non-destructive Automatic Die-Level Defect Detection of Counterfeit Microelectronics using Machine Vision
3D NAND flash	Research on 3D NAND flash reliability from the perspective of threshold voltage distribution
3D NAND flash memory	FPGA-based reliability testing and analysis for 3D NAND flash memory A high-efficiency threshold voltage distribution test method based on the reliability of 3D NAND flash memory
4
4N	Gold Wire Bond Study for Automotive Application
A
accelerated aging test	Accelerated aging test for gate oxide degradation in SiC MOSFETs for condition monitoring
accelerated life tests	A novel accelerated life-test method under thermal cyclic loadings for electronic devices considering multiple failure mechanisms
Accelerated Stress Testing	Monitoring of Parameter Stability of SiC MOSFETs in Real Application Tests
accelerated testing	Optimal Sampling for Accelerated Testing in 14nm FinFET Ring Oscillators A lifetime assessment and prediction method for large area solder joints
acceptor ionization	OFF-state Trapping Phenomena in GaN HEMTs: Interplay Between Gate Trapping, Acceptor Ionization and Positive Charge Redistribution
Accumulative testing	Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing
acoustic microscopy	On the replacement of water as coupling medium in scanning acoustic microscopy analysis of sensitive electronics components
active thermal management	An active thermal management strategy for switched reluctance drive system with minimizing current sampling delay
Adaptive Bias	Hot-carrier-injection resilient RF power amplifier using adaptive bias
Adaptive DE	Solving Time-dependent Reliability-based Design Optimization by Adaptive Differential Evolution Algorithm and Time-dependent Polynomial Chaos Expansions(ADE-T-PCE)
Addtive manufacturing	CFD Modelling of Additive Manufacturing Liquid Cold Plates for More Reliable Power Press-Pack Assemblies
adhesion strength degradation	Combined Experimental and Numerical Approach for Investigating the Mechanical Degradation of the Interface between Thin Film Metallization and Si-Substrate after Temperature Cycling Test
AEC-Q	Gold Wire Bond Study for Automotive Application
Aging	AC stress reliability study on a novel vertical MOS transistor for non-volatile memory technology Conducted EMI Susceptibility Analysis of a COTS Processor as Function of Aging Thermal Behaviour Evolution of an IGBT Chip After Aging Measured by Thermoreflectance A Novel BIST for Monitoring Aging / Temperature by Self-Triggered Scheme to Improve the Reliability of STT-MRAM
Aging indicator	Using of Bond-Wire Resistance as Ageing Indicator of Semiconductor Power Modules
AIA	Novel Failure Traces beyond the Barrier on the Floating Device
AlGaN barrier	Role of the AlGaN barrier on the long-term gate reliability of power HEMTs with p-GaN gate
AlGaN/GaN HEMTs	Degradation mechanism of 0.15 um AlGaN/GaN HETMs: the effects of hot electrons
ALT	A rapid life-prediction approach for solder joints based on modified Engelmaier fatigue model
Aluminum Electrolytic Capacitor	Reliability-Oriented Optimization of Aluminum Electrolytic Capacitor Considering Uncertain Mission Profile
Analog simulation	Analog and Mixed-Signal Circuits simulation for product level EMMI analysis
analysis of catastrophic failure	Modeling and analysis of the catastrophic failure and degradation data
analysis of degradation data	Modeling and analysis of the catastrophic failure and degradation data
analytical method	Comparing Analytical and Monte-Carlo-based Simulation Methods for Logic Gates SET Sensitivity Evaluation
Anisotropy	Effects of anisotropy on the reliability of TSV microstructure Impact of Crystalline Orientation of Lead-Free Solder Joints on Thermomechanical Response and Reliability of Ball Grid Array Components
anneal optimization	Effect of integrated anneal optimizations of electroplated Cu thin films Interconnects
AP-SoC	On the Analysis of radiation-induced Failures in the AXI Interconnect Module
Application Stress Testing	Monitoring of Parameter Stability of SiC MOSFETs in Real Application Tests
Arrhenius	Analysis of trap states in AlGaN/GaN self-switching diodes via impedance measurements
Artificial intelligence	Non-destructive Automatic Die-Level Defect Detection of Counterfeit Microelectronics using Machine Vision
asynchronous circuits	Asynchronous early output majority voter and a relative-timed asynchronous TMR implementation
Au wire	Gold Wire Bond Study for Automotive Application
AuPd wire	Gold Wire Bond Study for Automotive Application
Automatic Defect detection	Non-destructive Automatic Die-Level Defect Detection of Counterfeit Microelectronics using Machine Vision
automotive electronics packaging	Reliability improvement for palladium coated copper wire using additive element
avalanche breakdown	Single-pulse observation of photoemission during avalanche breakdown in insulated gate bipolar transistor
avalanche mode	Gate drive circuit for current balancing of parallel-connected SiC-JFETs under avalanche mode
Avalanche Ruggedness	UIS performance and ruggedness of stand-alone and cascode SiC JFETs
AXI	On the Analysis of radiation-induced Failures in the AXI Interconnect Module
B
Backside Si trenching	Reliable Endpoint Technique on Si trenching for Backside Circuit Edit
Ball bond shear test	Interface characterization of Cu-Cu ball bonds by a fast shear fatigue method
BAMFIT	Interface characterization of Cu-Cu ball bonds by a fast shear fatigue method
Bar	0.5µm GaN RF power bar technology space evaluation
Battery degradation	Ultrasonic monitoring performance degradation of lithium ion battery
Bayesian parameter estimation	A power transfer model-based method for lithium-ion battery discharge time prediction of electric rotatory-wing UAV
BEOL thermal distribution	Methodology to Evaluate the Critical Blocks in an Integrated Circuit based on the Temperature
BIMOS transistor	Experimental results on gated diodes and BIMOS ESD devices in 28nm FD-SOI under TLP & TID radiation
body diode SiC MOSFET	A non-invasive SiC MOSFET Junction Temperature Estimation Method based on the Transient Light Emission from the Intrinsic Body Diode
Bond wire	Gold Wire Bond Study for Automotive Application
Bond wires degradation	Using of Bond-Wire Resistance as Ageing Indicator of Semiconductor Power Modules
Bonding	Gold Wire Bond Study for Automotive Application
bonding wire	Reliability improvement for palladium coated copper wire using additive element
breakdown meachanisms	Role of the AlGaN barrier on the long-term gate reliability of power HEMTs with p-GaN gate
bridges in parallel	System-level Reliability Assessment for a Direct-drive PMSG Based Wind Turbine with Multiple Converters
BTI	Reliability Prediction of FinFET FPGAs by MTOL A Single-Trap Study of PBTI in SiON nMOS Transistors
BTS	Novel Failure Traces beyond the Barrier on the Floating Device Ageing of glass passivated TRIAC devices under thermal and electrical stress
buffer trapping	OFF-state Trapping Phenomena in GaN HEMTs: Interplay Between Gate Trapping, Acceptor Ionization and Positive Charge Redistribution
Burn-in	Conducted EMI Susceptibility Analysis of a COTS Processor as Function of Aging
C
C-rate dependency	Lithium-ion battery SoH estimation based on incremental capacity peak tracking at several current levels for online application
C-V analysis	OFF-state Trapping Phenomena in GaN HEMTs: Interplay Between Gate Trapping, Acceptor Ionization and Positive Charge Redistribution
Capacitive RF-MEMS	A study of hopping transport during discharging in SiNx films for MEMS capacitive switches
Capacitors	A Method to Extract Lumped Thermal Networks of Capacitors for Reliability Oriented Design
Capasitive MEMS	Field emission induced-damage in the actuation paths of MEMS capacitive structures
Carrier multiplication factor	On the use of soft gamma radiation to characterize the pre-breakdown carrier multiplication in SiC power MOSFETs and its correlation to the TCR failure rate as measured by neutron irradiation
carrier profiling	Profiling of carriers in a 3D flash memory cell with nanometer-level resolution using scanning nonlinear dielectric microscopy
Cascode	Analysis of cyclic spontaneous switchings in GaN & SiC cascodes by snappy turn-off currents
CdTe solar cells	Influence of copper and CdTe thickness in the reliability of CdS/CdTe solar cells
CFD	CFD Modelling of Additive Manufacturing Liquid Cold Plates for More Reliable Power Press-Pack Assemblies
channel size	Single event upset for monolithic 3-D integrated 6T SRAM based on a 22 nm FD-SOI technology: Effects of channel size and temperature
Charge trapping	Reliability of H-terminated diamond MESFETs in high power dissipation operating condition A Single-Trap Study of PBTI in SiON nMOS Transistors
Circuit Design	Reliability-driven pin assingment optimization to improve in-orbit soft-error rate
Circuit-level design	Circuit Design using Schmitt Trigger to Reliability Improvement
clustering	Analysis of the successive breakdown statistics of multilayer Al2O3/HfO2 gate stacks using the time-dependent clustering model
CMOS	Hot-carrier-injection resilient RF power amplifier using adaptive bias Asynchronous early output majority voter and a relative-timed asynchronous TMR implementation
CMUT	Capacitive micromachined ultrasonic transducers leak detection by dye penetrant test
cohesive zone model	Combined Experimental and Numerical Approach for Investigating the Mechanical Degradation of the Interface between Thin Film Metallization and Si-Substrate after Temperature Cycling Test
Cold plate	CFD Modelling of Additive Manufacturing Liquid Cold Plates for More Reliable Power Press-Pack Assemblies
collector-emitter voltage	Short-circuit and open-circuit faults monitoring of IGBTs in SST using collector-emitter voltage
Combined aging	Effect of Thermal and Vibrational Combined Ageing on QFN Terminal Pads Solder Reliability
compact
Compact thermal network	Online Junction Temperature Estimation Using Integrated NTC Thermistor in IGBT Modules for PMSM Drives
compensation	Improved Workflows in Topside and Backside Mechanical Sample Preparation
complex system	Title –High-resolution non-destructive three-dimensional imaging of integrated circuits
component	On the replacement of water as coupling medium in scanning acoustic microscopy analysis of sensitive electronics components
Component-of-the-Shelf (COTS)	Conducted EMI Susceptibility Analysis of a COTS Processor as Function of Aging
Condition monitoring	Parameters sensitivity analysis of Silicon Carbide buck converters to extract features for condition monitoring IGBT Aging Monitoring and Remaining Lifetime Prediction Based on Long Short-Term Memory (LSTM) Networks Accelerated aging test for gate oxide degradation in SiC MOSFETs for condition monitoring Monitoring of Parameter Stability of SiC MOSFETs in Real Application Tests
Conducted EMI	Conducted EMI Susceptibility Analysis of a COTS Processor as Function of Aging Conducted EMI mitigation in transformerless PV inverters based on intrinsic MOSFET parameters
Connectors	Vibration-induced dynamic characteristics modeling of electrical contact resistance for connectors Fretting wear reliability assessment methodology of gold-plated electrical connectors considering manufacture parameters distribution
constitutive model	Damage based PoF model of solder joints under temperature cycling and electric coupling condition
Contact Resistance	Remaining Useful Lifetime estimation for Electronic Power modules using an analytical degradation model
converters	Parameters sensitivity analysis of Silicon Carbide buck converters to extract features for condition monitoring 3D and compact thermal modeling in power electronics: an overview
converters in parallel	System-level Reliability Assessment for a Direct-drive PMSG Based Wind Turbine with Multiple Converters
copper contacts degradation	Influence of copper and CdTe thickness in the reliability of CdS/CdTe solar cells
Copula function	A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula function
Correlative microscopy	Correlative microscopy workflow for precise targeted failure analysis of multi-layer ceramic capacitors
corrosion	Investigation of the mechanical properties of corroded sintered silver layers by using Nanoindentation
Cortex-M4 processor	Conducted EMI Susceptibility Analysis of a COTS Processor as Function of Aging
COTS	Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing
counterfeit detection	Analysis of counterfeit electronics
counterfeit electronics	Analysis of counterfeit electronics
coupling liquid	On the replacement of water as coupling medium in scanning acoustic microscopy analysis of sensitive electronics components
Crack	Analysis of the aging mechanism occurring at the bond-wire contact of IGBT power devices during power cycling Fault diagnosis of cracks in crystalline silicon photovoltaic modules through I-V curve
crack growth	A lifetime assessment and prediction method for large area solder joints
Crack Propagation	Remaining Useful Lifetime estimation for Electronic Power modules using an analytical degradation model
Cracks	Effects of anisotropy on the reliability of TSV microstructure
Critical energy	New definition of critical energy for SiC MOSFET robustness under short circuit operations: the repetitive critical energy
cross-sectional nanoindentation	Combined Experimental and Numerical Approach for Investigating the Mechanical Degradation of the Interface between Thin Film Metallization and Si-Substrate after Temperature Cycling Test
Crystal Defects	Reliability Limitations from Crystal Defects in Thick GaN Epitaxial Layers for Power Electronics
crystalline silicon solar cell
Cu-Al ball bond	Interface characterization of Cu-Cu ball bonds by a fast shear fatigue method
current balance	Gate drive circuit for current balancing of parallel-connected SiC-JFETs under avalanche mode
current collapse	Investigation of the Current Collapse behaviour in GaN Power HEMTs with highly adjustable pulse and measurement concept
current filament	Single-pulse observation of photoemission during avalanche breakdown in insulated gate bipolar transistor
Current Flow Reversal Control	Simplified Hybrid Reliability Simulation Approach of a VSC DC Grid with Integration of an Improved DC Current Flow Controller
Current reference circuit	A comparison study on electromagnetic susceptibility of current reference circuits with scaling-down technologies and schemes
current sampling delay	An active thermal management strategy for switched reluctance drive system with minimizing current sampling delay
current surge	Surge Current Capability of Ultra-Wide-Bandgap Ga2O3 Schottky Diodes
cyclic stress test in design	A novel accelerated life-test method under thermal cyclic loadings for electronic devices considering multiple failure mechanisms
D
damage	Damage based PoF model of solder joints under temperature cycling and electric coupling condition
damage effects	Field emission induced-damage in the actuation paths of MEMS capacitive structures
Damage Mechanism	Analysis of the aging mechanism occurring at the bond-wire contact of IGBT power devices during power cycling
Damage Model	FEM-Aided Damage Model Calibration Method For Experimental Results
Damage Model Calibration	FEM-Aided Damage Model Calibration Method For Experimental Results
Damage Model Fitting	FEM-Aided Damage Model Calibration Method For Experimental Results
Damage recovery	Gate-damage accumulation and off-line recovery in SiC power MOSFETs with soft short-circuit failure mode Fail-to-open short-circuit failure mode in SiC power MOSFETs, device characterization and system level exploitaton
DC shift	A comparison study on electromagnetic susceptibility of current reference circuits with scaling-down technologies and schemes
DC/DC	Single-event induced failure mode of PWM in DC/DC converter
DDR4 memory	FBGA solder ball defect effect on DDR4 data signal rise time and ISI measured by loading the data line with a capacitor
de-trapped carrier	Study of temperature dependence of breakdown voltage and AC TDDB reliability for thick insulator film deposited by plasma process
Deep levels	Reliability of H-terminated diamond MESFETs in high power dissipation operating condition
Defect	Smart Manufacturing through Predictive FA
Defect oriented testing	A Novel BIST for Monitoring Aging / Temperature by Self-Triggered Scheme to Improve the Reliability of STT-MRAM
Defects	Non Thermally-Activated Transients and Buffer Traps in GaN Transistors With p-Type Gate: a New Method for Extracting the Activation Energy III-Nitrides Substrates and Defect Characterization in Nitride Materials for Power Devices
defects behaviour under electron beam irradation	Radiation-enhanced glide of 30o Shockley partial dislocations in gallium nitride heterostructures
defects reduction	Effect of integrated anneal optimizations of electroplated Cu thin films Interconnects
Degradation	Degradation mechanism of 0.15 um AlGaN/GaN HETMs: the effects of hot electrons GaN-based high-periodicity multiple quantum well solar cells: degradation under optical and electrical stress Degradation mechanisms in high power InGaN semiconductor lasers investigated by electrical, optical, spectral and C-DLTS measurements PV system performance and failure evaluation of 10 year field-aged 1-MW PV power plant
Degradation Monitoring	Monitoring of Parameter Stability of SiC MOSFETs in Real Application Tests
degradation process	An Improved Lifetime Prediction Method for Metallized Film Capacitor Considering Harmonics and Degradation Process
Derating factor	On the use of soft gamma radiation to characterize the pre-breakdown carrier multiplication in SiC power MOSFETs and its correlation to the TCR failure rate as measured by neutron irradiation
devices	III-Nitrides Substrates and Defect Characterization in Nitride Materials for Power Devices
Diamond	Reliability of H-terminated diamond MESFETs in high power dissipation operating condition
Die attach	Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing
dielectric	Ageing of glass passivated TRIAC devices under thermal and electrical stress Exploration of Gate Trench Module for Vertical GaN devices
Dielectric charging	A study of material stoichiometry on charging properties of SiNx films for potential application in RF MEMS capacitive switches
different thickness CdTe	Influence of copper and CdTe thickness in the reliability of CdS/CdTe solar cells
different thickness Cu	Influence of copper and CdTe thickness in the reliability of CdS/CdTe solar cells
digital circuits	Asynchronous early output majority voter and a relative-timed asynchronous TMR implementation
digital twin	Lithium-ion Battery Performance Degradation Evaluation in Dynamic Operating Conditions based on a Digital Twin Model
Diode-clamped three-level inverter；	Three-level inverters improve reliability based on equivalent input disturbance and repetitive control combinations
direct bonded copper layout	Impact of stray-inductance imbalance on short-circuit capability of multi-chip SiC power modules
discolations	Radiation-enhanced glide of 30o Shockley partial dislocations in gallium nitride heterostructures
Double Pulse	Modular dynamic pulse stress test system for discrete high power semiconductors
double-sided cooled	Combined Experimental-FEM Investigation of Electrical Ruggedness in Double-Sided Cooled Power Modules
DPA	Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing
Drift zone	Hot-Carrier Degradation in P- and N- Channel EDMOS for Smart Power Application
dye penetrant test	Capacitive micromachined ultrasonic transducers leak detection by dye penetrant test
Dynamic characteristics	Vibration-induced dynamic characteristics modeling of electrical contact resistance for connectors
dynamic operational condition	A power transfer model-based method for lithium-ion battery discharge time prediction of electric rotatory-wing UAV
Dynamic R_DSON	A Novel On-Wafer Approach to Test the Stability of GaN-based Devices in Hard Switching Conditions: Study of Hot-Electron Effects
dynamic RDSon	Investigation of the Current Collapse behaviour in GaN Power HEMTs with highly adjustable pulse and measurement concept
dynamic recurrent neural network
Dynamic Response	Effect of Thermal and Vibrational Combined Ageing on QFN Terminal Pads Solder Reliability
E
E-Mode	Design of E-Mode GaN HEMTs by the Polarization Super Junction (PSJ) Technology
Effective temperature	A study of hopping transport during discharging in SiNx films for MEMS capacitive switches
Electrical contact resistance	Vibration-induced dynamic characteristics modeling of electrical contact resistance for connectors
electrical ruggedness	Combined Experimental-FEM Investigation of Electrical Ruggedness in Double-Sided Cooled Power Modules
electrification projects	Reliability in the era of electrification in aviation: a systems approach
electro-thermal model	Electro-thermal Evaluation and Comparison of Quasi-Z Source Inverter Using Different Modulation Methods in Wind Power System
electro-thermal modelling	Surge Current Capability of Ultra-Wide-Bandgap Ga2O3 Schottky Diodes
electrochemical impedance spectroscopy	Health monitoring of mechanically fatigued flexible lithium ion battery by electrochemical impedance spectroscopy
electrochemical plating	Effect of integrated anneal optimizations of electroplated Cu thin films Interconnects
electroluminescence	A non-invasive SiC MOSFET Junction Temperature Estimation Method based on the Transient Light Emission from the Intrinsic Body Diode
electromigration	Methodology to Evaluate the Critical Blocks in an Integrated Circuit based on the Temperature
Electron devices	Life-cycle Reliability Design Optimization of High-power DC Electromagnet-ic Devices Based on Time-dependent Non-probabilistic Convex Model Pro-cess Solving Time-dependent Reliability-based Design Optimization by Adaptive Differential Evolution Algorithm and Time-dependent Polynomial Chaos Expansions(ADE-T-PCE)
electronic converters	Challenges to Overcome Breakdown Limitations in lateral β-Ga2O3 MOSFET Devices
electronic devices	A novel accelerated life-test method under thermal cyclic loadings for electronic devices considering multiple failure mechanisms
Electronic failure analysis	Non-destructive Automatic Die-Level Defect Detection of Counterfeit Microelectronics using Machine Vision
electronics	On the replacement of water as coupling medium in scanning acoustic microscopy analysis of sensitive electronics components
emc	Conducted EMI mitigation in transformerless PV inverters based on intrinsic MOSFET parameters Coupled simulations for lifetime prediction of board level packages encapsulated by thermoset injection moulding based on the Coffin-Manson relation
Emission microscopy	Analog and Mixed-Signal Circuits simulation for product level EMMI analysis
Emission simulation	Analog and Mixed-Signal Circuits simulation for product level EMMI analysis
End-pointing	Reliable Endpoint Technique on Si trenching for Backside Circuit Edit
Energy-absorption impedance	Reliability analysis of excitation control modes of a synchronous condenser during grid-integration at the speed-falling stage
Enhancing Reliability	An error detecting scheme with input offset regulation for Enhancing Reliability of ultralow-voltage SRAM
equivalent input disturbance；	Three-level inverters improve reliability based on equivalent input disturbance and repetitive control combinations
error	Extraction of Wearout Model Parameters using On-Line Test of an SRAM
error detecting scheme	An error detecting scheme with input offset regulation for Enhancing Reliability of ultralow-voltage SRAM
error detection and correction	Mitigating single event upset of FPGA for the onboard bus control of satellite
ESD	Experimental results on gated diodes and BIMOS ESD devices in 28nm FD-SOI under TLP & TID radiation
established technologies	Challenges to Overcome Breakdown Limitations in lateral β-Ga2O3 MOSFET Devices
Etch selectivity	Microstructure Evolutions upon Ni(Pt) Silicidation and the Different Responses to the Metal Etch
Evaluation	0.5µm GaN RF power bar technology space evaluation
Excitation control modes	Reliability analysis of excitation control modes of a synchronous condenser during grid-integration at the speed-falling stage
Experimental platform based on FPGA	FPGA-based reliability testing and analysis for 3D NAND flash memory
experiments	Combined Experimental-FEM Investigation of Electrical Ruggedness in Double-Sided Cooled Power Modules
Extended Drain MOSFET	Hot-Carrier Degradation in P- and N- Channel EDMOS for Smart Power Application
F
Failure Analyses	Correlative microscopy workflow for precise targeted failure analysis of multi-layer ceramic capacitors
Failure analysis	Smart Manufacturing through Predictive FA Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis Failure-analysis method of soldering interfaces in light-emitting diode packages based on time-domain transient thermal response On the replacement of water as coupling medium in scanning acoustic microscopy analysis of sensitive electronics components Investigation of critical parameters in power supplies components failure due to electric pulse
Failure Analysis Tool	Smart Manufacturing through Predictive FA
Failure diagnosis	PV system performance and failure evaluation of 10 year field-aged 1-MW PV power plant
failure mechanism	Multiple Failure Modes Identification of SiC planar MOSFETs in Short-circuit Operation Single event upset for monolithic 3-D integrated 6T SRAM based on a 22 nm FD-SOI technology: Effects of channel size and temperature
Failure modes	Parameters sensitivity analysis of Silicon Carbide buck converters to extract features for condition monitoring Gate-damage accumulation and off-line recovery in SiC power MOSFETs with soft short-circuit failure mode Fail-to-open short-circuit failure mode in SiC power MOSFETs, device characterization and system level exploitaton
Failure rate	On the use of soft gamma radiation to characterize the pre-breakdown carrier multiplication in SiC power MOSFETs and its correlation to the TCR failure rate as measured by neutron irradiation
Fault diagnosis	Fault diagnosis of cracks in crystalline silicon photovoltaic modules through I-V curve Modeling and Fault Diagnosis of Multi-phase Winding Inter-turn Short Circuit for Five-phase PMSM based on Improved Trust Region
fault injection	Evaluating the Soft Error Sensitivity of a GPU-based SoC for Matrix Multiplication On the Analysis of radiation-induced Failures in the AXI Interconnect Module
Fault isolation	Analog and Mixed-Signal Circuits simulation for product level EMMI analysis
Fault tolerance	Improving GPU register file reliability with a comprehensive ISA extension Asynchronous early output majority voter and a relative-timed asynchronous TMR implementation
fault-diagnosis	A fault tolerant switched reluctance motor drive for electric vehicles under multi-switches open-fault conditions
Fault-tolerant control	A fault tolerant switched reluctance motor drive for electric vehicles under multi-switches open-fault conditions Multi-modal Fault-tolerant Control for Single-phase Cascade Off-gird PV-storage System with PV Failure Using Hybrid Modulation
FBGA solder ball defect	FBGA solder ball defect effect on DDR4 data signal rise time and ISI measured by loading the data line with a capacitor
FC PVC	Novel Failure Traces beyond the Barrier on the Floating Device
FD-SOI	Experimental results on gated diodes and BIMOS ESD devices in 28nm FD-SOI under TLP & TID radiation
FDSOI	Novel Failure Traces beyond the Barrier on the Floating Device
FE Simulations	Thermo-Mechanical Assessment of Silver Sintering for Attaching Power Components in Embedded PCB
FEA	Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing
FEM	Effects of Solder Degradation on the Die Temperature Measurement via Internal Gate Resistance FEM-Aided Damage Model Calibration Method For Experimental Results Coupled simulations for lifetime prediction of board level packages encapsulated by thermoset injection moulding based on the Coffin-Manson relation
FEM Simulations	Combined Experimental-FEM Investigation of Electrical Ruggedness in Double-Sided Cooled Power Modules Effect of Thermal and Vibrational Combined Ageing on QFN Terminal Pads Solder Reliability
FEOL TDDB	Extraction of Wearout Model Parameters using On-Line Test of an SRAM
ferroelectric tunneling-field-effect-transistor	Accumulative total ionizing dose (TID) and transient dose rate (TDR) effects on planar and vertical ferroelectric tunneling-field-effect-transistors (TFET)
FGPA	On the Analysis of radiation-induced Failures in the AXI Interconnect Module
Fiber optic diamond sensor probe
Field emission	Field emission induced-damage in the actuation paths of MEMS capacitive structures
Field Plate failure	Peculiar Failure Mechanisms in GaN Power Transistors
field plate type UMOSFET	Effect of the cell size reduction on the threshold voltage of UMOSFETs
field programmable gate array	Mitigating single event upset of FPGA for the onboard bus control of satellite
film	High Throughput Ultrasonic Inspection Apparatus Using Quasi-static Water Surface Contact
FinFET	An Investigation of FinFET Single-Event Latch-up Characteristic and Mitigation Method Reliability Prediction of FinFET FPGAs by MTOL Optimal Sampling for Accelerated Testing in 14nm FinFET Ring Oscillators Circuit Design using Schmitt Trigger to Reliability Improvement
Finite Element Methods	FEM-Aided Damage Model Calibration Method For Experimental Results
Finite element modeling	A Method to Extract Lumped Thermal Networks of Capacitors for Reliability Oriented Design
finite element simulation	Packaging Reliability Estimation of High-Power Device Modules by Utilizing Silver Sintering Technology A 3-D thermal network model for the temperature monitoring of thermal grease as interface material Combined Experimental and Numerical Approach for Investigating the Mechanical Degradation of the Interface between Thin Film Metallization and Si-Substrate after Temperature Cycling Test
Flash memory cell	Research on 3D NAND flash reliability from the perspective of threshold voltage distribution
flexible lithium ion battery	Health monitoring of mechanically fatigued flexible lithium ion battery by electrochemical impedance spectroscopy
Floquet theory	A Time-domain Stability Analysis Method for Paralleled LLC Resonant Converter System Based on Floquet Theory A time-domain stability analysis method for LLC resonant converter based on Floquet theory
fluoresence	Capacitive micromachined ultrasonic transducers leak detection by dye penetrant test
fluorocarbon	On the replacement of water as coupling medium in scanning acoustic microscopy analysis of sensitive electronics components
FPGA	Reliability Prediction of FinFET FPGAs by MTOL
Fretting wear	Fretting wear reliability assessment methodology of gold-plated electrical connectors considering manufacture parameters distribution
Front-end time dependent dielectric breakdown	Optimal Sampling for Accelerated Testing in 14nm FinFET Ring Oscillators
G
Gallium Nitride	Analysis of cyclic spontaneous switchings in GaN & SiC cascodes by snappy turn-off currents Investigation of the Current Collapse behaviour in GaN Power HEMTs with highly adjustable pulse and measurement concept GaN-based high-periodicity multiple quantum well solar cells: degradation under optical and electrical stress Gallium Nitride on Diamond
GaN	Degradation mechanisms in high power InGaN semiconductor lasers investigated by electrical, optical, spectral and C-DLTS measurements Exploration of Gate Trench Module for Vertical GaN devices Non Thermally-Activated Transients and Buffer Traps in GaN Transistors With p-Type Gate: a New Method for Extracting the Activation Energy Gate leakage current sensing for in situ temperature monitoring of p-GaN gate HEMTs 0.5µm GaN RF power bar technology space evaluation
GaN HEMT	Analysis Of Drain Current Transient Stability Of AlGaN/GaN HEMT stressed under HTOL & HTRB, By Random Telegraph Noise And Low Frequency Noise Characterizations
GaN HEMTs	OFF-state Trapping Phenomena in GaN HEMTs: Interplay Between Gate Trapping, Acceptor Ionization and Positive Charge Redistribution
GaN High Electron Mobility Transistors (HEMTs)	Design of E-Mode GaN HEMTs by the Polarization Super Junction (PSJ) Technology
GaN micropipes	Peculiar Failure Mechanisms in GaN Power Transistors
GaN Power amplifiers	Peculiar Failure Mechanisms in GaN Power Transistors
GaN power HEMT	Investigation of the Current Collapse behaviour in GaN Power HEMTs with highly adjustable pulse and measurement concept
GaN vertical	Vertical GaN devices and reliability
GaN-HEMTs	Gate Threshold Voltage Instability and On-resistance Degradation under Reverse Current Conduction Stress on E-mode GaN-HEMTs
gate contact length	Effect of the cell size reduction on the threshold voltage of UMOSFETs
Gate driver	Gate drive circuit for current balancing of parallel-connected SiC-JFETs under avalanche mode Gate leakage current sensing for in situ temperature monitoring of p-GaN gate HEMTs
gate oxide	Accelerated aging test for gate oxide degradation in SiC MOSFETs for condition monitoring
Gate threshold voltage instability	Gate Threshold Voltage Instability and On-resistance Degradation under Reverse Current Conduction Stress on E-mode GaN-HEMTs
gate trapping	OFF-state Trapping Phenomena in GaN HEMTs: Interplay Between Gate Trapping, Acceptor Ionization and Positive Charge Redistribution
gate trench module	Exploration of Gate Trench Module for Vertical GaN devices
gate-drive circuits	Shoot-through protection for an inverter consisting of the next-generation IGBTs with gate impedance reduction
Gated diode	Experimental results on gated diodes and BIMOS ESD devices in 28nm FD-SOI under TLP & TID radiation
Gaussian Process Regression	Assessing Multi-Output Gaussian Process Regression for Modeling of Non-Monotonic Degradation Trends of Light Emitting Diodes in Storage
GeSbTe	Reliability Analysis in GeTe and GeSbTe based Phase-Change Memory 4kb Arrays targeting Storage Class Memory Applications
GeTe	Reliability Analysis in GeTe and GeSbTe based Phase-Change Memory 4kb Arrays targeting Storage Class Memory Applications
GH50	0.5µm GaN RF power bar technology space evaluation
glass	Ageing of glass passivated TRIAC devices under thermal and electrical stress
GPU	Improving GPU register file reliability with a comprehensive ISA extension
Graphene	Impact of electrical stress on total ionizing dose effects on graphene nano-disc non-volatile memory devices
gray market	Analysis of counterfeit electronics
H
H5 inverter	Conducted EMI mitigation in transformerless PV inverters based on intrinsic MOSFET parameters
Hamming code	Mitigating single event upset of FPGA for the onboard bus control of satellite
Hard Switching	A Novel On-Wafer Approach to Test the Stability of GaN-based Devices in Hard Switching Conditions: Study of Hot-Electron Effects
hardening techniques	Improving GPU register file reliability with a comprehensive ISA extension
Heatsink	CFD Modelling of Additive Manufacturing Liquid Cold Plates for More Reliable Power Press-Pack Assemblies
heavy ion	Heavy Ion and Proton Induced Single Event Upsets in 3D SRAM Heavy ion track straggling effect in single event effect numerical simulation of 3D stacked devices
Hemt	Non Thermally-Activated Transients and Buffer Traps in GaN Transistors With p-Type Gate: a New Method for Extracting the Activation Energy Gate leakage current sensing for in situ temperature monitoring of p-GaN gate HEMTs
High Frequency (100 kHz)	A Novel On-Wafer Approach to Test the Stability of GaN-based Devices in Hard Switching Conditions: Study of Hot-Electron Effects
high humidity high temperature power cycling	Influence of Temperature and Humidity on Power Cycling Capability of Power Modules
High power module	Packaging Reliability Estimation of High-Power Device Modules by Utilizing Silver Sintering Technology
High sensitivity measurement
high temperature	Multiple Failure Modes Identification of SiC planar MOSFETs in Short-circuit Operation Robustness of a M&NEMS Pressure Sensor up to 522°C
high temperature electronics	Reliability improvement for palladium coated copper wire using additive element
High temperature reverse bias	Reliability test for Subsea Power Semiconductors
high-K	Analysis of the successive breakdown statistics of multilayer Al2O3/HfO2 gate stacks using the time-dependent clustering model
Hopping conduction	A study of hopping transport during discharging in SiNx films for MEMS capacitive switches
Hot Carriers	Hot-carrier-injection resilient RF power amplifier using adaptive bias
Hot Electrons	A Novel On-Wafer Approach to Test the Stability of GaN-based Devices in Hard Switching Conditions: Study of Hot-Electron Effects
Hot-Carrier	Hot-Carrier Degradation in P- and N- Channel EDMOS for Smart Power Application
hot-electron	Degradation mechanism of 0.15 um AlGaN/GaN HETMs: the effects of hot electrons
Hotspot	PV system performance and failure evaluation of 10 year field-aged 1-MW PV power plant
HTOL	Analysis Of Drain Current Transient Stability Of AlGaN/GaN HEMT stressed under HTOL & HTRB, By Random Telegraph Noise And Low Frequency Noise Characterizations
HTRB	Ageing of glass passivated TRIAC devices under thermal and electrical stress Analysis Of Drain Current Transient Stability Of AlGaN/GaN HEMT stressed under HTOL & HTRB, By Random Telegraph Noise And Low Frequency Noise Characterizations
HTSL	Gold Wire Bond Study for Automotive Application
Hybrid modulation	Multi-modal Fault-tolerant Control for Single-phase Cascade Off-gird PV-storage System with PV Failure Using Hybrid Modulation
I
I-V characteristic	Fault diagnosis of cracks in crystalline silicon photovoltaic modules through I-V curve
IC debug	Reliable Endpoint Technique on Si trenching for Backside Circuit Edit
IEMI	Investigation of critical parameters in power supplies components failure due to electric pulse
IGBT	Using of Bond-Wire Resistance as Ageing Indicator of Semiconductor Power Modules Effects of Solder Degradation on the Die Temperature Measurement via Internal Gate Resistance FEM-Aided Damage Model Calibration Method For Experimental Results Single-pulse observation of photoemission during avalanche breakdown in insulated gate bipolar transistor
IGBT module	A 3-D thermal network model for the temperature monitoring of thermal grease as interface material Wear-out Failure of an IGBT Module in Motor Drives due to Uneven Thermal Impedance of Power Semiconductor Devices
IGBT Power Module	Analysis of the aging mechanism occurring at the bond-wire contact of IGBT power devices during power cycling
IGBT Semiconductors	Remaining Useful Lifetime estimation for Electronic Power modules using an analytical degradation model
IGBTs	Shoot-through protection for an inverter consisting of the next-generation IGBTs with gate impedance reduction
Image Alignment	Smart Manufacturing through Predictive FA
impedance measurements	Analysis of trap states in AlGaN/GaN self-switching diodes via impedance measurements
impedance-source inverter	Thermal Optimized Discontinuous Modulation Strategy for Three Phase Impedance Source Inverter
Improved DC Current Flow Controller (CFC)	Simplified Hybrid Reliability Simulation Approach of a VSC DC Grid with Integration of an Improved DC Current Flow Controller
Improved Ideal DC Current Source	Simplified Hybrid Reliability Simulation Approach of a VSC DC Grid with Integration of an Improved DC Current Flow Controller
Incremental Capacity	Lithium-ion battery SoH estimation based on incremental capacity peak tracking at several current levels for online application
Inspection	Smart Manufacturing through Predictive FA
insulated gate bipolar transistor	Single-pulse observation of photoemission during avalanche breakdown in insulated gate bipolar transistor
Insulated gate bipolar transistor modules (IGBT)	Thermal Behaviour Evolution of an IGBT Chip After Aging Measured by Thermoreflectance
Integrating electric	Reliability in the era of electrification in aviation: a systems approach
inter-turn short circuit	Modeling and Fault Diagnosis of Multi-phase Winding Inter-turn Short Circuit for Five-phase PMSM based on Improved Trust Region
interface defect	Spatial scale dependent impact of non-uniform interface defect distribution on field effect mobility in SiC MOSFETs
Interface reliability	Interface characterization of Cu-Cu ball bonds by a fast shear fatigue method
interference between word lines	A high-efficiency threshold voltage distribution test method based on the reliability of 3D NAND flash memory
Intermittent errors	FBGA solder ball defect effect on DDR4 data signal rise time and ISI measured by loading the data line with a capacitor
internal gate resistance	Effects of Solder Degradation on the Die Temperature Measurement via Internal Gate Resistance
Intersymbol interference(ISI)	FBGA solder ball defect effect on DDR4 data signal rise time and ISI measured by loading the data line with a capacitor
Inverter	Comparative evaluation of mission profile based reliability assessment methods of power modules in motor drive inverter
inverters	Shoot-through protection for an inverter consisting of the next-generation IGBTs with gate impedance reduction
Ion flux data	Prediction of Solar Particle Events with SRAM-Based Soft Error Rate Monitor and Supervised Machine Learning
ISA extension	Improving GPU register file reliability with a comprehensive ISA extension
isopropanol	On the replacement of water as coupling medium in scanning acoustic microscopy analysis of sensitive electronics components
J
J integral	Effects of anisotropy on the reliability of TSV microstructure
junction breakdown junction engineering	AC stress reliability study on a novel vertical MOS transistor for non-volatile memory technology
Junction temperature	Failure-analysis method of soldering interfaces in light-emitting diode packages based on time-domain transient thermal response A non-invasive SiC MOSFET Junction Temperature Estimation Method based on the Transient Light Emission from the Intrinsic Body Diode
L
l=Lifetime Prediction	Reliability-Oriented Optimization of Aluminum Electrolytic Capacitor Considering Uncertain Mission Profile
Large-signal EMI	A comparison study on electromagnetic susceptibility of current reference circuits with scaling-down technologies and schemes
Laser	Degradation mechanisms in high power InGaN semiconductor lasers investigated by electrical, optical, spectral and C-DLTS measurements
Latent damages	Physical Mechanisms for Gate Damages Induced by Heavy Ions in SiC power MOSFET
layouts	Comparing Analytical and Monte-Carlo-based Simulation Methods for Logic Gates SET Sensitivity Evaluation
Lead-free solder joint	Impact of Crystalline Orientation of Lead-Free Solder Joints on Thermomechanical Response and Reliability of Ball Grid Array Components
lectronic equipment	Reliability in the era of electrification in aviation: a systems approach
LFN	Analysis Of Drain Current Transient Stability Of AlGaN/GaN HEMT stressed under HTOL & HTRB, By Random Telegraph Noise And Low Frequency Noise Characterizations
Li-ion battery
LICA	Magnetic field imaging and light induced capacitance alteration for failure analysis of Cu-TSV interconnects
life prediction	A rapid life-prediction approach for solder joints based on modified Engelmaier fatigue model Damage based PoF model of solder joints under temperature cycling and electric coupling condition
lifetime	Extraction of Wearout Model Parameters using On-Line Test of an SRAM Role of the AlGaN barrier on the long-term gate reliability of power HEMTs with p-GaN gate Comparative evaluation of mission profile based reliability assessment methods of power modules in motor drive inverter
lifetime modelling	A lifetime assessment and prediction method for large area solder joints
Lifetime prediction	Assessing Multi-Output Gaussian Process Regression for Modeling of Non-Monotonic Degradation Trends of Light Emitting Diodes in Storage IGBT Aging Monitoring and Remaining Lifetime Prediction Based on Long Short-Term Memory (LSTM) Networks Mission profile-oriented configuration of PV panels for lifetime and cost-efficiency of PV inverters An Improved Lifetime Prediction Method for Metallized Film Capacitor Considering Harmonics and Degradation Process
Lifetime prognostic	Using of Bond-Wire Resistance as Ageing Indicator of Semiconductor Power Modules
Light Emitting Diode	Assessing Multi-Output Gaussian Process Regression for Modeling of Non-Monotonic Degradation Trends of Light Emitting Diodes in Storage
Limitations	Reliability Limitations from Crystal Defects in Thick GaN Epitaxial Layers for Power Electronics
Lithium-ion battery	Lithium-ion battery SoH estimation based on incremental capacity peak tracking at several current levels for online application Lithium-ion Battery Performance Degradation Evaluation in Dynamic Operating Conditions based on a Digital Twin Model
lithium-ion battery discharge time	A power transfer model-based method for lithium-ion battery discharge time prediction of electric rotatory-wing UAV
LLC resonant converter	A time-domain stability analysis method for LLC resonant converter based on Floquet theory
Local deep level transient spectroscopy	Spatial scale dependent impact of non-uniform interface defect distribution on field effect mobility in SiC MOSFETs
Logical Masking Effect	Design Exploration of Majority Voter Architectures based on the Signal Probability for TMR Strategy Optimization in Space Applications
long short-term memory	Lithium-ion Battery Performance Degradation Evaluation in Dynamic Operating Conditions based on a Digital Twin Model
long-term reliability	Role of the AlGaN barrier on the long-term gate reliability of power HEMTs with p-GaN gate
Long-term reliability prediction	Conducted EMI Susceptibility Analysis of a COTS Processor as Function of Aging
low power	An error detecting scheme with input offset regulation for Enhancing Reliability of ultralow-voltage SRAM
low power design	Asynchronous early output majority voter and a relative-timed asynchronous TMR implementation
low TMR and low voltage	CSME: A Novel Cycle-Sensing Margin Enhancement Scheme for High Yield STT-MRAM
Lumen Degradation	Assessing Multi-Output Gaussian Process Regression for Modeling of Non-Monotonic Degradation Trends of Light Emitting Diodes in Storage
M
M3D	Single event upset for monolithic 3-D integrated 6T SRAM based on a 22 nm FD-SOI technology: Effects of channel size and temperature
Machine learning	IGBT Aging Monitoring and Remaining Lifetime Prediction Based on Long Short-Term Memory (LSTM) Networks Non-destructive Automatic Die-Level Defect Detection of Counterfeit Microelectronics using Machine Vision Prediction of Solar Particle Events with SRAM-Based Soft Error Rate Monitor and Supervised Machine Learning
machine side converter (MSC)	System-level Reliability Assessment for a Direct-drive PMSG Based Wind Turbine with Multiple Converters
magnesium concentration	Exploration of Gate Trench Module for Vertical GaN devices
magnetic field imaging	Magnetic field imaging and light induced capacitance alteration for failure analysis of Cu-TSV interconnects
Majority voter	Design Exploration of Majority Voter Architectures based on the Signal Probability for TMR Strategy Optimization in Space Applications
Manufacture parameters	Fretting wear reliability assessment methodology of gold-plated electrical connectors considering manufacture parameters distribution
materials for harsh environments	Reliability improvement for palladium coated copper wire using additive element
matrix eigenvalue	A time-domain stability analysis method for LLC resonant converter based on Floquet theory
mechanical	Improved Workflows in Topside and Backside Mechanical Sample Preparation
mechanical fatigue	Health monitoring of mechanically fatigued flexible lithium ion battery by electrochemical impedance spectroscopy
mechanical properties	Investigation of the mechanical properties of corroded sintered silver layers by using Nanoindentation
MEMS	Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing Effects of gamma radiation on suspended silicon nanogauges bridge used for MEMS transduction Capacitive micromachined ultrasonic transducers leak detection by dye penetrant test Robustness of a M&NEMS Pressure Sensor up to 522°C
Meshed Multi-terminal HVDC (M2TDC)	Simplified Hybrid Reliability Simulation Approach of a VSC DC Grid with Integration of an Improved DC Current Flow Controller
Metal etch	Microstructure Evolutions upon Ni(Pt) Silicidation and the Different Responses to the Metal Etch
Metallized film capacitor (MFC)	An Improved Lifetime Prediction Method for Metallized Film Capacitor Considering Harmonics and Degradation Process
mibot	Electrical nanoprobing and EBIC/EBAC technique integrated in your EFA workflow
micoelectronics reliability	Impact of Crystalline Orientation of Lead-Free Solder Joints on Thermomechanical Response and Reliability of Ball Grid Array Components
Microelectronics reliability	Effect of Thermal and Vibrational Combined Ageing on QFN Terminal Pads Solder Reliability
microstructure	Impact of Crystalline Orientation of Lead-Free Solder Joints on Thermomechanical Response and Reliability of Ball Grid Array Components
Mission Profile	Reliability-Oriented Optimization of Aluminum Electrolytic Capacitor Considering Uncertain Mission Profile Mission profile-oriented configuration of PV panels for lifetime and cost-efficiency of PV inverters
mixed-signal simulation	Analog and Mixed-Signal Circuits simulation for product level EMMI analysis
mobile ion	Ageing of glass passivated TRIAC devices under thermal and electrical stress
mode identification	Mode Identification for Reliability Improvement of MMC
model-based prognostics	A power transfer model-based method for lithium-ion battery discharge time prediction of electric rotatory-wing UAV
modeling	Modeling and Fault Diagnosis of Multi-phase Winding Inter-turn Short Circuit for Five-phase PMSM based on Improved Trust Region
modified Engelmaier fatigue model	A rapid life-prediction approach for solder joints based on modified Engelmaier fatigue model
modular multilevel converter (MMC)	Mode Identification for Reliability Improvement of MMC
Modular Test System	Monitoring of Parameter Stability of SiC MOSFETs in Real Application Tests
modulation strategy	Thermal Optimized Discontinuous Modulation Strategy for Three Phase Impedance Source Inverter
Moisture	Study of Moisture Transport in Silicone Gel for IGBT Modules
moisture uptake	Influence of Temperature and Humidity on Power Cycling Capability of Power Modules
Monte Carlo analysis	Comparative evaluation of mission profile based reliability assessment methods of power modules in motor drive inverter
MOSFET	Parameters sensitivity analysis of Silicon Carbide buck converters to extract features for condition monitoring
Motor drives	Wear-out Failure of an IGBT Module in Motor Drives due to Uneven Thermal Impedance of Power Semiconductor Devices
multi-chip SiC power module	Impact of stray-inductance imbalance on short-circuit capability of multi-chip SiC power modules
multi-field coupling	Damage based PoF model of solder joints under temperature cycling and electric coupling condition
Multi-layer ceramic capacitors	Correlative microscopy workflow for precise targeted failure analysis of multi-layer ceramic capacitors
multi-performance degradation products	A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula function
Multi-phase PMSM	Modeling and Fault Diagnosis of Multi-phase Winding Inter-turn Short Circuit for Five-phase PMSM based on Improved Trust Region
multi-switches faults	A fault tolerant switched reluctance motor drive for electric vehicles under multi-switches open-fault conditions
multiphysics	3D and compact thermal modeling in power electronics: an overview
multiple failure mechanisms	A novel accelerated life-test method under thermal cyclic loadings for electronic devices considering multiple failure mechanisms
Multiple quantum well	GaN-based high-periodicity multiple quantum well solar cells: degradation under optical and electrical stress
Multiple short-circuits	Investigation of Multiple Short-Circuits Characteristics and Reliability in SiC Power Devices used for a Start-up Method of Power Converters
MUT	Capacitive micromachined ultrasonic transducers leak detection by dye penetrant test
N
Nanoindentation	Investigation of the mechanical properties of corroded sintered silver layers by using Nanoindentation
nanolaminate	Analysis of the successive breakdown statistics of multilayer Al2O3/HfO2 gate stacks using the time-dependent clustering model
Nickel	Microstructure Evolutions upon Ni(Pt) Silicidation and the Different Responses to the Metal Etch
nMOS	A Single-Trap Study of PBTI in SiON nMOS Transistors
non-intrusive sensing method	A non-invasive SiC MOSFET Junction Temperature Estimation Method based on the Transient Light Emission from the Intrinsic Body Diode
Non-volatile memory	Impact of electrical stress on total ionizing dose effects on graphene nano-disc non-volatile memory devices
Nondestructive evaluation	Ultrasonic monitoring performance degradation of lithium ion battery
NTC	Online Junction Temperature Estimation Using Integrated NTC Thermistor in IGBT Modules for PMSM Drives
O
Off-grid cascade photovoltaic-storage system	Multi-modal Fault-tolerant Control for Single-phase Cascade Off-gird PV-storage System with PV Failure Using Hybrid Modulation
OFF-state trapping	OFF-state Trapping Phenomena in GaN HEMTs: Interplay Between Gate Trapping, Acceptor Ionization and Positive Charge Redistribution
Online junction temperature estimation	Online Junction Temperature Estimation Using Integrated NTC Thermistor in IGBT Modules for PMSM Drives
operating mode	Mode Identification for Reliability Improvement of MMC
Operating modes analysis	Multi-modal Fault-tolerant Control for Single-phase Cascade Off-gird PV-storage System with PV Failure Using Hybrid Modulation
Optical Interference fringe	Reliable Endpoint Technique on Si trenching for Backside Circuit Edit
P
p-GaN gate	OFF-state Trapping Phenomena in GaN HEMTs: Interplay Between Gate Trapping, Acceptor Ionization and Positive Charge Redistribution
p-type GaN HEMT	A Novel On-Wafer Approach to Test the Stability of GaN-based Devices in Hard Switching Conditions: Study of Hot-Electron Effects
package	On the replacement of water as coupling medium in scanning acoustic microscopy analysis of sensitive electronics components
Packaging	Packaging Reliability Estimation of High-Power Device Modules by Utilizing Silver Sintering Technology Effect of Thermal and Vibrational Combined Ageing on QFN Terminal Pads Solder Reliability
parallel connection	Gate drive circuit for current balancing of parallel-connected SiC-JFETs under avalanche mode
paralleled LLC resonant converter system	A Time-domain Stability Analysis Method for Paralleled LLC Resonant Converter System Based on Floquet Theory
parasitic parameters	Shoot-through protection for an inverter consisting of the next-generation IGBTs with gate impedance reduction
partial discharge	An Improved Lifetime Prediction Method for Metallized Film Capacitor Considering Harmonics and Degradation Process
particle swarm optimization
passivation	Ageing of glass passivated TRIAC devices under thermal and electrical stress
PCB Embedding	Thermo-Mechanical Assessment of Silver Sintering for Attaching Power Components in Embedded PCB
PCB-Embedding	Robustness Evaluation Of PCB-Embedded Power Dies Using Solderless Pressed Metal Foam
PCC wire	Reliability improvement for palladium coated copper wire using additive element
PCM	Reliability Analysis in GeTe and GeSbTe based Phase-Change Memory 4kb Arrays targeting Storage Class Memory Applications
PDSOI	A comparison study on electromagnetic susceptibility of current reference circuits with scaling-down technologies and schemes
Peak Tracking	Lithium-ion battery SoH estimation based on incremental capacity peak tracking at several current levels for online application
Performance	III-Nitrides Substrates and Defect Characterization in Nitride Materials for Power Devices
performance degradation	Comparisons of SnO2 Gas Sensor Degradation under Elevated Storage and Working Conditions Methodology to Evaluate the Critical Blocks in an Integrated Circuit based on the Temperature
performance degradation evaluation	Lithium-ion Battery Performance Degradation Evaluation in Dynamic Operating Conditions based on a Digital Twin Model
permanent-magnet synchronous generator (PMSG)	System-level Reliability Assessment for a Direct-drive PMSG Based Wind Turbine with Multiple Converters
pGaN HEMT	Role of the AlGaN barrier on the long-term gate reliability of power HEMTs with p-GaN gate
phase change memory	Reliability Analysis in GeTe and GeSbTe based Phase-Change Memory 4kb Arrays targeting Storage Class Memory Applications
Phase transformation	Microstructure Evolutions upon Ni(Pt) Silicidation and the Different Responses to the Metal Etch
photoemission	Single-pulse observation of photoemission during avalanche breakdown in insulated gate bipolar transistor
photomultiplier tube	Single-pulse observation of photoemission during avalanche breakdown in insulated gate bipolar transistor
Photovoltaic (PV) module	Fault diagnosis of cracks in crystalline silicon photovoltaic modules through I-V curve
Physical Model	Remaining Useful Lifetime estimation for Electronic Power modules using an analytical degradation model
physics of failure model	Damage based PoF model of solder joints under temperature cycling and electric coupling condition
Piezoresistive transduction	Effects of gamma radiation on suspended silicon nanogauges bridge used for MEMS transduction
Pin Assignment	Reliability-driven pin assingment optimization to improve in-orbit soft-error rate
Planar-gate SiC-MOSFET	Investigation of Multiple Short-Circuits Characteristics and Reliability in SiC Power Devices used for a Start-up Method of Power Converters
plasma generation	Field emission induced-damage in the actuation paths of MEMS capacitive structures
Platinum	Microstructure Evolutions upon Ni(Pt) Silicidation and the Different Responses to the Metal Etch
PMSM	Online Junction Temperature Estimation Using Integrated NTC Thermistor in IGBT Modules for PMSM Drives
Point defects	Degradation mechanisms in high power InGaN semiconductor lasers investigated by electrical, optical, spectral and C-DLTS measurements
Polarization Super Junction Technology	Design of E-Mode GaN HEMTs by the Polarization Super Junction (PSJ) Technology
positive charge storage	OFF-state Trapping Phenomena in GaN HEMTs: Interplay Between Gate Trapping, Acceptor Ionization and Positive Charge Redistribution
potential-induced degradation
Power	0.5µm GaN RF power bar technology space evaluation
Power converter	Wear-out Failure of an IGBT Module in Motor Drives due to Uneven Thermal Impedance of Power Semiconductor Devices
Power Cycling	Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis Analysis of the aging mechanism occurring at the bond-wire contact of IGBT power devices during power cycling Impact of Sensing Current Density on PN-Junction Based Temperature Estimation Methods for Si and SiC Power Devices
Power cycling test	Comparative evaluation of mission profile based reliability assessment methods of power modules in motor drive inverter
Power device	Comparative evaluation of mission profile based reliability assessment methods of power modules in motor drive inverter
Power devices	Experimental setup to monitor non-destructive single ionization events caused in power devices by terrestrial cosmic radiation.
Power die	Robustness Evaluation Of PCB-Embedded Power Dies Using Solderless Pressed Metal Foam
Power electronics	Comparative evaluation of mission profile based reliability assessment methods of power modules in motor drive inverter
Power modules	Study of Moisture Transport in Silicone Gel for IGBT Modules Combined Experimental-FEM Investigation of Electrical Ruggedness in Double-Sided Cooled Power Modules
Power Modules Aging	Using of Bond-Wire Resistance as Ageing Indicator of Semiconductor Power Modules
Power semiconductor device	Wear-out Failure of an IGBT Module in Motor Drives due to Uneven Thermal Impedance of Power Semiconductor Devices
Power SiC device reliability	On the use of soft gamma radiation to characterize the pre-breakdown carrier multiplication in SiC power MOSFETs and its correlation to the TCR failure rate as measured by neutron irradiation
Power supplies	Investigation of critical parameters in power supplies components failure due to electric pulse
Pre-insertion scheme	Reliability analysis of excitation control modes of a synchronous condenser during grid-integration at the speed-falling stage
Press-pack	CFD Modelling of Additive Manufacturing Liquid Cold Plates for More Reliable Power Press-Pack Assemblies
Pressure and liquid tolerant	Reliability test for Subsea Power Semiconductors
pressure sensor	Robustness of a M&NEMS Pressure Sensor up to 522°C
Process variability	Circuit Design using Schmitt Trigger to Reliability Improvement
process variation	Extraction of Wearout Model Parameters using On-Line Test of an SRAM
Prognostics	Remaining Useful Lifetime estimation for Electronic Power modules using an analytical degradation model
proton	Heavy Ion and Proton Induced Single Event Upsets in 3D SRAM
Pull test	Gold Wire Bond Study for Automotive Application
pulsed drain current	OFF-state Trapping Phenomena in GaN HEMTs: Interplay Between Gate Trapping, Acceptor Ionization and Positive Charge Redistribution
pulsed I-V	OFF-state Trapping Phenomena in GaN HEMTs: Interplay Between Gate Trapping, Acceptor Ionization and Positive Charge Redistribution
punch-through effect	Effect of the cell size reduction on the threshold voltage of UMOSFETs
PV inverter	Mission profile-oriented configuration of PV panels for lifetime and cost-efficiency of PV inverters
PV modules	PV system performance and failure evaluation of 10 year field-aged 1-MW PV power plant
PV panels	Smart Soiling Sensor for PV Modules
PWM	Single-event induced failure mode of PWM in DC/DC converter
Q
quality GaN	Vertical GaN devices and reliability
quasi	High Throughput Ultrasonic Inspection Apparatus Using Quasi-static Water Surface Contact
quasi Z source inverter	Electro-thermal Evaluation and Comparison of Quasi-Z Source Inverter Using Different Modulation Methods in Wind Power System
R
Radiation	0.5µm GaN RF power bar technology space evaluation
radiation effect	On the Analysis of radiation-induced Failures in the AXI Interconnect Module Heavy ion track straggling effect in single event effect numerical simulation of 3D stacked devices
Radiation immunity	Effects of gamma radiation on suspended silicon nanogauges bridge used for MEMS transduction
Radiation-Hardening-By-Design (RHBD)	Reliability-driven pin assingment optimization to improve in-orbit soft-error rate
Rail potential	Faults and Reliability Analysis of Negative Resistance Converter Traction Power System
real-time monitoring	A Novel BIST for Monitoring Aging / Temperature by Self-Triggered Scheme to Improve the Reliability of STT-MRAM
Rectifier bridge	Investigation of critical parameters in power supplies components failure due to electric pulse
Rectifier diode	Investigation of critical parameters in power supplies components failure due to electric pulse
Redistribution of charge	Degradation mechanisms in high power InGaN semiconductor lasers investigated by electrical, optical, spectral and C-DLTS measurements
relaxation mechanism	Analysis of trap states in AlGaN/GaN self-switching diodes via impedance measurements
Reliability	Reliability of H-terminated diamond MESFETs in high power dissipation operating condition Evaluating the Soft Error Sensitivity of a GPU-based SoC for Matrix Multiplication Remaining Useful Lifetime estimation for Electronic Power modules using an analytical degradation model Multiple Failure Modes Identification of SiC planar MOSFETs in Short-circuit Operation Ageing of glass passivated TRIAC devices under thermal and electrical stress Effects of anisotropy on the reliability of TSV microstructure Degradation mechanism of 0.15 um AlGaN/GaN HETMs: the effects of hot electrons Circuit Design using Schmitt Trigger to Reliability Improvement Gold Wire Bond Study for Automotive Application Thermal Behaviour Evolution of an IGBT Chip After Aging Measured by Thermoreflectance Wear-out Failure of an IGBT Module in Motor Drives due to Uneven Thermal Impedance of Power Semiconductor Devices CSME: A Novel Cycle-Sensing Margin Enhancement Scheme for High Yield STT-MRAM On the replacement of water as coupling medium in scanning acoustic microscopy analysis of sensitive electronics components Analysis of the aging mechanism occurring at the bond-wire contact of IGBT power devices during power cycling A Novel BIST for Monitoring Aging / Temperature by Self-Triggered Scheme to Improve the Reliability of STT-MRAM Thermo-Mechanical Assessment of Silver Sintering for Attaching Power Components in Embedded PCB Coupled simulations for lifetime prediction of board level packages encapsulated by thermoset injection moulding based on the Coffin-Manson relation 0.5µm GaN RF power bar technology space evaluation Comparative evaluation of mission profile based reliability assessment methods of power modules in motor drive inverter PV system performance and failure evaluation of 10 year field-aged 1-MW PV power plant Reliability Limitations from Crystal Defects in Thick GaN Epitaxial Layers for Power Electronics
reliability analysis	Faults and Reliability Analysis of Negative Resistance Converter Traction Power System Reliability analysis of excitation control modes of a synchronous condenser during grid-integration at the speed-falling stage Reliability Analysis in GeTe and GeSbTe based Phase-Change Memory 4kb Arrays targeting Storage Class Memory Applications A 3-D thermal network model for the temperature monitoring of thermal grease as interface material Thermal Optimized Discontinuous Modulation Strategy for Three Phase Impedance Source Inverter
Reliability assessment	Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing Fretting wear reliability assessment methodology of gold-plated electrical connectors considering manufacture parameters distribution
Reliability based design optimization	Life-cycle Reliability Design Optimization of High-power DC Electromagnet-ic Devices Based on Time-dependent Non-probabilistic Convex Model Pro-cess
reliability evaluation	A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula function
Reliability for Subsea Power Semiconductors	Reliability test for Subsea Power Semiconductors
reliability issue	Analysis of counterfeit electronics
Reliability modeling	Modeling and analysis of the catastrophic failure and degradation data
Reliability Optimization	Reliability-Oriented Optimization of Aluminum Electrolytic Capacitor Considering Uncertain Mission Profile
Reliability Simulation	Simplified Hybrid Reliability Simulation Approach of a VSC DC Grid with Integration of an Improved DC Current Flow Controller
Reliability testing and analysis	FPGA-based reliability testing and analysis for 3D NAND flash memory
reliability；	Three-level inverters improve reliability based on equivalent input disturbance and repetitive control combinations
repetitive control；	Three-level inverters improve reliability based on equivalent input disturbance and repetitive control combinations
Repetitive critical energy	New definition of critical energy for SiC MOSFET robustness under short circuit operations: the repetitive critical energy
responsivity	Analysis of trap states in AlGaN/GaN self-switching diodes via impedance measurements
retention time	Row hammer avoidance analysis of DDR3 SDRAM
Reverse conduction	Gate Threshold Voltage Instability and On-resistance Degradation under Reverse Current Conduction Stress on E-mode GaN-HEMTs
Review	Smart Manufacturing through Predictive FA
RF MEMS switches	A study of material stoichiometry on charging properties of SiNx films for potential application in RF MEMS capacitive switches
RF PA	Hot-carrier-injection resilient RF power amplifier using adaptive bias
Ring Oscillator	Optimal Sampling for Accelerated Testing in 14nm FinFET Ring Oscillators
roadmap	ThermoFisher Static Optical Fault Isolation Roadmap and Lock- In Thermography for Automotive
robotic	Electrical nanoprobing and EBIC/EBAC technique integrated in your EFA workflow
Robustness	New definition of critical energy for SiC MOSFET robustness under short circuit operations: the repetitive critical energy
RON increase	OFF-state Trapping Phenomena in GaN HEMTs: Interplay Between Gate Trapping, Acceptor Ionization and Positive Charge Redistribution
rotatory-wing unmanned aerial vehicles	A power transfer model-based method for lithium-ion battery discharge time prediction of electric rotatory-wing UAV
Row hammer	Row hammer avoidance analysis of DDR3 SDRAM
Rsd increase	Hot-Carrier Degradation in P- and N- Channel EDMOS for Smart Power Application
RTN	Analysis Of Drain Current Transient Stability Of AlGaN/GaN HEMT stressed under HTOL & HTRB, By Random Telegraph Noise And Low Frequency Noise Characterizations
Ruggedness	Multiple Failure Modes Identification of SiC planar MOSFETs in Short-circuit Operation
S
sample size	Extraction of Wearout Model Parameters using On-Line Test of an SRAM
Sampling	Optimal Sampling for Accelerated Testing in 14nm FinFET Ring Oscillators
scanning nonlinear dielectric microscopy	Profiling of carriers in a 3D flash memory cell with nanometer-level resolution using scanning nonlinear dielectric microscopy
SCM	Novel Failure Traces beyond the Barrier on the Floating Device
SCR	An Investigation of FinFET Single-Event Latch-up Characteristic and Mitigation Method
SDRAM	Row hammer avoidance analysis of DDR3 SDRAM
SEE	Single-event induced failure mode of PWM in DC/DC converter
SEGR	Physical Mechanisms for Gate Damages Induced by Heavy Ions in SiC power MOSFET
SEL	An Investigation of FinFET Single-Event Latch-up Characteristic and Mitigation Method
self-activated BIST	A Novel BIST for Monitoring Aging / Temperature by Self-Triggered Scheme to Improve the Reliability of STT-MRAM
Self-Switching Diodes	Analysis of trap states in AlGaN/GaN self-switching diodes via impedance measurements
semi-full-bridge (SFB) submodule	Mode Identification for Reliability Improvement of MMC
semi-insulating	Ageing of glass passivated TRIAC devices under thermal and electrical stress
semiconductor	Title –High-resolution non-destructive three-dimensional imaging of integrated circuits
semiconductor DC circuit breaker	Gate drive circuit for current balancing of parallel-connected SiC-JFETs under avalanche mode
Semiconductor material	Challenges to Overcome Breakdown Limitations in lateral β-Ga2O3 MOSFET Devices
sensing current	Impact of Sensing Current Density on PN-Junction Based Temperature Estimation Methods for Si and SiC Power Devices
sensing margin	CSME: A Novel Cycle-Sensing Margin Enhancement Scheme for High Yield STT-MRAM
sensitivity analysis	Parameters sensitivity analysis of Silicon Carbide buck converters to extract features for condition monitoring
sensitivity evaluation of single event transient	Comparing Analytical and Monte-Carlo-based Simulation Methods for Logic Gates SET Sensitivity Evaluation
sensor reliability	Comparisons of SnO2 Gas Sensor Degradation under Elevated Storage and Working Conditions
SET	Single-event induced failure mode of PWM in DC/DC converter
SEU	Single event upset for monolithic 3-D integrated 6T SRAM based on a 22 nm FD-SOI technology: Effects of channel size and temperature
SEUs	On the Analysis of radiation-induced Failures in the AXI Interconnect Module
SHE	Reliability Prediction of FinFET FPGAs by MTOL
Shear Test	Thermo-Mechanical Assessment of Silver Sintering for Attaching Power Components in Embedded PCB
shoot-through protection	Shoot-through protection for an inverter consisting of the next-generation IGBTs with gate impedance reduction
short channel effects	Degradation mechanism of 0.15 um AlGaN/GaN HETMs: the effects of hot electrons
Short circuit	Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis Multiple Failure Modes Identification of SiC planar MOSFETs in Short-circuit Operation Modular dynamic pulse stress test system for discrete high power semiconductors
Short-circuit	New definition of critical energy for SiC MOSFET robustness under short circuit operations: the repetitive critical energy
short-circuit capability	Impact of stray-inductance imbalance on short-circuit capability of multi-chip SiC power modules
Short-circuit degradation	Investigation of Multiple Short-Circuits Characteristics and Reliability in SiC Power Devices used for a Start-up Method of Power Converters
Short-circuit robustness	Impact of stray-inductance imbalance on short-circuit capability of multi-chip SiC power modules Gate-damage accumulation and off-line recovery in SiC power MOSFETs with soft short-circuit failure mode Fail-to-open short-circuit failure mode in SiC power MOSFETs, device characterization and system level exploitaton
shrinking	Presentation of the new SMARPROBE LX nanoprober system
Si heterojunction solar cell	Barrier properties analysis of Cu/TiW/ITO electrode for Si heterojunction solar cell under thermal aging
Si_MOSFET	Conducted EMI mitigation in transformerless PV inverters based on intrinsic MOSFET parameters
SiC Cascode	UIS performance and ruggedness of stand-alone and cascode SiC JFETs
SiC JFET	UIS performance and ruggedness of stand-alone and cascode SiC JFETs
SiC MOSFET	Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis New definition of critical energy for SiC MOSFET robustness under short circuit operations: the repetitive critical energy Multiple Failure Modes Identification of SiC planar MOSFETs in Short-circuit Operation Spatial scale dependent impact of non-uniform interface defect distribution on field effect mobility in SiC MOSFETs Monitoring of Parameter Stability of SiC MOSFETs in Real Application Tests
SiC MOSFETs	Accelerated aging test for gate oxide degradation in SiC MOSFETs for condition monitoring
SiC power devices	Investigation of Multiple Short-Circuits Characteristics and Reliability in SiC Power Devices used for a Start-up Method of Power Converters
SiC Power MOSFET	Physical Mechanisms for Gate Damages Induced by Heavy Ions in SiC power MOSFET
SiC power MOSFETs	A non-invasive SiC MOSFET Junction Temperature Estimation Method based on the Transient Light Emission from the Intrinsic Body Diode Gate-damage accumulation and off-line recovery in SiC power MOSFETs with soft short-circuit failure mode Fail-to-open short-circuit failure mode in SiC power MOSFETs, device characterization and system level exploitaton
SiC-JFET	Investigation of Multiple Short-Circuits Characteristics and Reliability in SiC Power Devices used for a Start-up Method of Power Converters Gate drive circuit for current balancing of parallel-connected SiC-JFETs under avalanche mode
Signal Probability	Design Exploration of Majority Voter Architectures based on the Signal Probability for TMR Strategy Optimization in Space Applications
signal rise time	FBGA solder ball defect effect on DDR4 data signal rise time and ISI measured by loading the data line with a capacitor
significantly	3D and compact thermal modeling in power electronics: an overview
Silicidation	Microstructure Evolutions upon Ni(Pt) Silicidation and the Different Responses to the Metal Etch
silicon	Impact of Sensing Current Density on PN-Junction Based Temperature Estimation Methods for Si and SiC Power Devices
silicon carbide	Analysis of cyclic spontaneous switchings in GaN & SiC cascodes by snappy turn-off currents Impact of Sensing Current Density on PN-Junction Based Temperature Estimation Methods for Si and SiC Power Devices
Silicon Carbide (SiC)	Parameters sensitivity analysis of Silicon Carbide buck converters to extract features for condition monitoring
Silicon nanogauges	Effects of gamma radiation on suspended silicon nanogauges bridge used for MEMS transduction
Silicon Nitride	A study of material stoichiometry on charging properties of SiNx films for potential application in RF MEMS capacitive switches A study of hopping transport during discharging in SiNx films for MEMS capacitive switches
Silicone gel	Study of Moisture Transport in Silicone Gel for IGBT Modules
Simplified Hybrid Modelling Approach	Simplified Hybrid Reliability Simulation Approach of a VSC DC Grid with Integration of an Improved DC Current Flow Controller
simulation	Heavy ion track straggling effect in single event effect numerical simulation of 3D stacked devices
simulation method	Comparing Analytical and Monte-Carlo-based Simulation Methods for Logic Gates SET Sensitivity Evaluation
simulation methodology	Single event upset for monolithic 3-D integrated 6T SRAM based on a 22 nm FD-SOI technology: Effects of channel size and temperature
simulation verification	Short-circuit and open-circuit faults monitoring of IGBTs in SST using collector-emitter voltage
single event effect	Heavy ion track straggling effect in single event effect numerical simulation of 3D stacked devices
Single Event Effects	Physical Mechanisms for Gate Damages Induced by Heavy Ions in SiC power MOSFET
single event upset	Mitigating single event upset of FPGA for the onboard bus control of satellite
Single Event Upset(SEU)	Heavy Ion and Proton Induced Single Event Upsets in 3D SRAM
Single-defects	A Single-Trap Study of PBTI in SiON nMOS Transistors
Single-Event Effects	Reliability-driven pin assingment optimization to improve in-orbit soft-error rate
Single-Event Transient	Design Exploration of Majority Voter Architectures based on the Signal Probability for TMR Strategy Optimization in Space Applications
sinter silver	Investigation of the mechanical properties of corroded sintered silver layers by using Nanoindentation
Sintered Ag	Packaging Reliability Estimation of High-Power Device Modules by Utilizing Silver Sintering Technology
smarprobe	Presentation of the new SMARPROBE LX nanoprober system
Smart-Power	Hot-Carrier Degradation in P- and N- Channel EDMOS for Smart Power Application
Smartgrids	Smart Soiling Sensor for PV Modules
smt	Coupled simulations for lifetime prediction of board level packages encapsulated by thermoset injection moulding based on the Coffin-Manson relation
SnO2 gas sensor	Comparisons of SnO2 Gas Sensor Degradation under Elevated Storage and Working Conditions
SoC	Evaluating the Soft Error Sensitivity of a GPU-based SoC for Matrix Multiplication
Soft error	Circuit Design using Schmitt Trigger to Reliability Improvement
Soft error rate	Prediction of Solar Particle Events with SRAM-Based Soft Error Rate Monitor and Supervised Machine Learning
Soft gamma radiation	On the use of soft gamma radiation to characterize the pre-breakdown carrier multiplication in SiC power MOSFETs and its correlation to the TCR failure rate as measured by neutron irradiation
soft switching operation	Investigation of the Current Collapse behaviour in GaN Power HEMTs with highly adjustable pulse and measurement concept
Soiling sensor	Smart Soiling Sensor for PV Modules
Solar cells	GaN-based high-periodicity multiple quantum well solar cells: degradation under optical and electrical stress
Solar particle event	Prediction of Solar Particle Events with SRAM-Based Soft Error Rate Monitor and Supervised Machine Learning
solder ball void	FBGA solder ball defect effect on DDR4 data signal rise time and ISI measured by loading the data line with a capacitor
Solder crack	Failure-analysis method of soldering interfaces in light-emitting diode packages based on time-domain transient thermal response
Solder Fatigue	Thermo-Mechanical Assessment of Silver Sintering for Attaching Power Components in Embedded PCB Effect of Thermal and Vibrational Combined Ageing on QFN Terminal Pads Solder Reliability
solder joint	A rapid life-prediction approach for solder joints based on modified Engelmaier fatigue model Damage based PoF model of solder joints under temperature cycling and electric coupling condition
solder joints	A lifetime assessment and prediction method for large area solder joints
Solderless packaging	Robustness Evaluation Of PCB-Embedded Power Dies Using Solderless Pressed Metal Foam
solutions	ThermoFisher Static Optical Fault Isolation Roadmap and Lock- In Thermography for Automotive
Space	0.5µm GaN RF power bar technology space evaluation
Space applications	Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing
Spectrometer chain	Experimental setup to monitor non-destructive single ionization events caused in power devices by terrestrial cosmic radiation.
Speed-falling stage	Reliability analysis of excitation control modes of a synchronous condenser during grid-integration at the speed-falling stage
spin transfer torque magnetic random access memory (STT-MRAM)	A Novel BIST for Monitoring Aging / Temperature by Self-Triggered Scheme to Improve the Reliability of STT-MRAM
SRAM	Single event upset for monolithic 3-D integrated 6T SRAM based on a 22 nm FD-SOI technology: Effects of channel size and temperature Extraction of Wearout Model Parameters using On-Line Test of an SRAM Prediction of Solar Particle Events with SRAM-Based Soft Error Rate Monitor and Supervised Machine Learning
SST’s structural composition	Short-circuit and open-circuit faults monitoring of IGBTs in SST using collector-emitter voltage
Stability	Comparisons of SnO2 Gas Sensor Degradation under Elevated Storage and Working Conditions Barrier properties analysis of Cu/TiW/ITO electrode for Si heterojunction solar cell under thermal aging
stability analysis	A time-domain stability analysis method for LLC resonant converter based on Floquet theory
standard cells	Asynchronous early output majority voter and a relative-timed asynchronous TMR implementation
state of charge	Health monitoring of mechanically fatigued flexible lithium ion battery by electrochemical impedance spectroscopy
State of Health	Lithium-ion battery SoH estimation based on incremental capacity peak tracking at several current levels for online application
static	High Throughput Ultrasonic Inspection Apparatus Using Quasi-static Water Surface Contact
Stator voltage establishment	Reliability analysis of excitation control modes of a synchronous condenser during grid-integration at the speed-falling stage
storage	Comparisons of SnO2 Gas Sensor Degradation under Elevated Storage and Working Conditions
storage class memory	Reliability Analysis in GeTe and GeSbTe based Phase-Change Memory 4kb Arrays targeting Storage Class Memory Applications
Storage reliability	A high-efficiency threshold voltage distribution test method based on the reliability of 3D NAND flash memory Research on 3D NAND flash reliability from the perspective of threshold voltage distribution
Stray current	Faults and Reliability Analysis of Negative Resistance Converter Traction Power System
stray-inductance imbalance	Impact of stray-inductance imbalance on short-circuit capability of multi-chip SiC power modules
stress test methods	Modular dynamic pulse stress test system for discrete high power semiconductors
Surface scanning radiation emission measurement Magnetic field measurement
switched reluctance drive system	An active thermal management strategy for switched reluctance drive system with minimizing current sampling delay
switched reluctance motor	A fault tolerant switched reluctance motor drive for electric vehicles under multi-switches open-fault conditions
switching frequency reduction	An active thermal management strategy for switched reluctance drive system with minimizing current sampling delay
System-level reliability	System-level Reliability Assessment for a Direct-drive PMSG Based Wind Turbine with Multiple Converters
T
TC	Gold Wire Bond Study for Automotive Application
TCAD	An Investigation of FinFET Single-Event Latch-up Characteristic and Mitigation Method
TCAD simulation	AC stress reliability study on a novel vertical MOS transistor for non-volatile memory technology
TDDB	Study of temperature dependence of breakdown voltage and AC TDDB reliability for thick insulator film deposited by plasma process
technologies	Electrical nanoprobing and EBIC/EBAC technique integrated in your EFA workflow
technology	Presentation of the new SMARPROBE LX nanoprober system
Technology node	A comparison study on electromagnetic susceptibility of current reference circuits with scaling-down technologies and schemes
temperature	Single event upset for monolithic 3-D integrated 6T SRAM based on a 22 nm FD-SOI technology: Effects of channel size and temperature Analysis of trap states in AlGaN/GaN self-switching diodes via impedance measurements
Temperature cycling	Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing
temperature dependence modeling	A novel accelerated life-test method under thermal cyclic loadings for electronic devices considering multiple failure mechanisms
temperature estimation	Impact of Sensing Current Density on PN-Junction Based Temperature Estimation Methods for Si and SiC Power Devices
Temperature monitoring	Gate leakage current sensing for in situ temperature monitoring of p-GaN gate HEMTs
temperature variation	A Novel BIST for Monitoring Aging / Temperature by Self-Triggered Scheme to Improve the Reliability of STT-MRAM
Terrestrial cosmic radiation	Experimental setup to monitor non-destructive single ionization events caused in power devices by terrestrial cosmic radiation.
Terrestrial cosmic rays	On the use of soft gamma radiation to characterize the pre-breakdown carrier multiplication in SiC power MOSFETs and its correlation to the TCR failure rate as measured by neutron irradiation
the equivalent resistance	Short-circuit and open-circuit faults monitoring of IGBTs in SST using collector-emitter voltage
the Wiener process	A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula function
thermal
Thermal aging	Interface characterization of Cu-Cu ball bonds by a fast shear fatigue method Barrier properties analysis of Cu/TiW/ITO electrode for Si heterojunction solar cell under thermal aging
Thermal and Mechanical Simulation	Robustness Evaluation Of PCB-Embedded Power Dies Using Solderless Pressed Metal Foam
Thermal cycling	Robustness Evaluation Of PCB-Embedded Power Dies Using Solderless Pressed Metal Foam
thermal interface material	Influence of Temperature and Humidity on Power Cycling Capability of Power Modules A 3-D thermal network model for the temperature monitoring of thermal grease as interface material
thermal loading	Electro-thermal Evaluation and Comparison of Quasi-Z Source Inverter Using Different Modulation Methods in Wind Power System
thermal management	Surge Current Capability of Ultra-Wide-Bandgap Ga2O3 Schottky Diodes
Thermal modeling	A Method to Extract Lumped Thermal Networks of Capacitors for Reliability Oriented Design CFD Modelling of Additive Manufacturing Liquid Cold Plates for More Reliable Power Press-Pack Assemblies
Thermal network	A Method to Extract Lumped Thermal Networks of Capacitors for Reliability Oriented Design
thermal runaway	Surge Current Capability of Ultra-Wide-Bandgap Ga2O3 Schottky Diodes
Thermal shocks	Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing
thermal stability	Surge Current Capability of Ultra-Wide-Bandgap Ga2O3 Schottky Diodes
thermal stress	Thermal Optimized Discontinuous Modulation Strategy for Three Phase Impedance Source Inverter
ThermoFisher	ThermoFisher Static Optical Fault Isolation Roadmap and Lock- In Thermography for Automotive
thermomechanical fatigue	Impact of Crystalline Orientation of Lead-Free Solder Joints on Thermomechanical Response and Reliability of Ball Grid Array Components
thermoset injection moulding	Coupled simulations for lifetime prediction of board level packages encapsulated by thermoset injection moulding based on the Coffin-Manson relation
Thermosonic copper wire bonding	Interface characterization of Cu-Cu ball bonds by a fast shear fatigue method
thin film metallization	Combined Experimental and Numerical Approach for Investigating the Mechanical Degradation of the Interface between Thin Film Metallization and Si-Substrate after Temperature Cycling Test
Though SiC	Gallium Nitride on Diamond
Three dimensional SRAM	Heavy Ion and Proton Induced Single Event Upsets in 3D SRAM
Threshold voltage distribution	Research on 3D NAND flash reliability from the perspective of threshold voltage distribution
threshold voltage distribution test	A high-efficiency threshold voltage distribution test method based on the reliability of 3D NAND flash memory
threshold voltage rise phenomena	Effect of the cell size reduction on the threshold voltage of UMOSFETs
throughput	An error detecting scheme with input offset regulation for Enhancing Reliability of ultralow-voltage SRAM
TID radiation	Experimental results on gated diodes and BIMOS ESD devices in 28nm FD-SOI under TLP & TID radiation
Time-dependent convex model process	Life-cycle Reliability Design Optimization of High-power DC Electromagnet-ic Devices Based on Time-dependent Non-probabilistic Convex Model Pro-cess
Time-dependent PCE	Solving Time-dependent Reliability-based Design Optimization by Adaptive Differential Evolution Algorithm and Time-dependent Polynomial Chaos Expansions(ADE-T-PCE)
Time-dependent RBDO	Solving Time-dependent Reliability-based Design Optimization by Adaptive Differential Evolution Algorithm and Time-dependent Polynomial Chaos Expansions(ADE-T-PCE)
time-domain analysis	A time-domain stability analysis method for LLC resonant converter based on Floquet theory
time-domain stability analysis	A Time-domain Stability Analysis Method for Paralleled LLC Resonant Converter System Based on Floquet Theory
timing error detection	An error detecting scheme with input offset regulation for Enhancing Reliability of ultralow-voltage SRAM
TiW diffusion barrier	Barrier properties analysis of Cu/TiW/ITO electrode for Si heterojunction solar cell under thermal aging
TLP	Experimental results on gated diodes and BIMOS ESD devices in 28nm FD-SOI under TLP & TID radiation
Tomography	Correlative microscopy workflow for precise targeted failure analysis of multi-layer ceramic capacitors
total ionizing dose effects	Accumulative total ionizing dose (TID) and transient dose rate (TDR) effects on planar and vertical ferroelectric tunneling-field-effect-transistors (TFET) Impact of electrical stress on total ionizing dose effects on graphene nano-disc non-volatile memory devices
transient dose rate effects	Accumulative total ionizing dose (TID) and transient dose rate (TDR) effects on planar and vertical ferroelectric tunneling-field-effect-transistors (TFET)
transient drain current	Analysis Of Drain Current Transient Stability Of AlGaN/GaN HEMT stressed under HTOL & HTRB, By Random Telegraph Noise And Low Frequency Noise Characterizations
Transient thermal response	Failure-analysis method of soldering interfaces in light-emitting diode packages based on time-domain transient thermal response
Transmission electron microscopy techiques	Radiation-enhanced glide of 30o Shockley partial dislocations in gallium nitride heterostructures
trap	Degradation mechanism of 0.15 um AlGaN/GaN HETMs: the effects of hot electrons
trap carrier	Study of temperature dependence of breakdown voltage and AC TDDB reliability for thick insulator film deposited by plasma process
trapping effects	Analysis Of Drain Current Transient Stability Of AlGaN/GaN HEMT stressed under HTOL & HTRB, By Random Telegraph Noise And Low Frequency Noise Characterizations
Traps	Analysis of trap states in AlGaN/GaN self-switching diodes via impedance measurements Non Thermally-Activated Transients and Buffer Traps in GaN Transistors With p-Type Gate: a New Method for Extracting the Activation Energy
Trench-gate SiC-MOSFET	Investigation of Multiple Short-Circuits Characteristics and Reliability in SiC Power Devices used for a Start-up Method of Power Converters
TRIAC	Ageing of glass passivated TRIAC devices under thermal and electrical stress
triple modular redundancy	Mitigating single event upset of FPGA for the onboard bus control of satellite Asynchronous early output majority voter and a relative-timed asynchronous TMR implementation
Triple-Modular Redundancy	Design Exploration of Majority Voter Architectures based on the Signal Probability for TMR Strategy Optimization in Space Applications
Trsnforming	Gallium Nitride on Diamond
TSEP	Effects of Solder Degradation on the Die Temperature Measurement via Internal Gate Resistance
TSV	Effects of anisotropy on the reliability of TSV microstructure Magnetic field imaging and light induced capacitance alteration for failure analysis of Cu-TSV interconnects
U
uHAST	Gold Wire Bond Study for Automotive Application
ultra	Improved Workflows in Topside and Backside Mechanical Sample Preparation
ultralow-voltage SRAM	An error detecting scheme with input offset regulation for Enhancing Reliability of ultralow-voltage SRAM
Ultrasonic wave	Ultrasonic monitoring performance degradation of lithium ion battery
Uncertainties	Life-cycle Reliability Design Optimization of High-power DC Electromagnet-ic Devices Based on Time-dependent Non-probabilistic Convex Model Pro-cess
Unclamped Inductive Switching	UIS performance and ruggedness of stand-alone and cascode SiC JFETs Modular dynamic pulse stress test system for discrete high power semiconductors
Urban rail transit	Faults and Reliability Analysis of Negative Resistance Converter Traction Power System
usage variation	Extraction of Wearout Model Parameters using On-Line Test of an SRAM
V
variability	A Novel BIST for Monitoring Aging / Temperature by Self-Triggered Scheme to Improve the Reliability of STT-MRAM
Vbd	Study of temperature dependence of breakdown voltage and AC TDDB reliability for thick insulator film deposited by plasma process
vce-method	Impact of Sensing Current Density on PN-Junction Based Temperature Estimation Methods for Si and SiC Power Devices
Vertical	Exploration of Gate Trench Module for Vertical GaN devices
vertical MOS devices	AC stress reliability study on a novel vertical MOS transistor for non-volatile memory technology
Vibration	Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing Vibration-induced dynamic characteristics modeling of electrical contact resistance for connectors
virtual junction temperature measurement	Effects of Solder Degradation on the Die Temperature Measurement via Internal Gate Resistance
vsd-method	Impact of Sensing Current Density on PN-Junction Based Temperature Estimation Methods for Si and SiC Power Devices
VTH transient	OFF-state Trapping Phenomena in GaN HEMTs: Interplay Between Gate Trapping, Acceptor Ionization and Positive Charge Redistribution
VTH variation	OFF-state Trapping Phenomena in GaN HEMTs: Interplay Between Gate Trapping, Acceptor Ionization and Positive Charge Redistribution
W
Wavelet	Title –High-resolution non-destructive three-dimensional imaging of integrated circuits
Weibull	Analysis of the successive breakdown statistics of multilayer Al2O3/HfO2 gate stacks using the time-dependent clustering model
Weibull statistics	Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing
wideband gap	Vertical GaN devices and reliability
wind power system	Electro-thermal Evaluation and Comparison of Quasi-Z Source Inverter Using Different Modulation Methods in Wind Power System
wind turbine	System-level Reliability Assessment for a Direct-drive PMSG Based Wind Turbine with Multiple Converters
Wire Bond	Analysis of the aging mechanism occurring at the bond-wire contact of IGBT power devices during power cycling
X
X-ray irradiation	Impact of electrical stress on total ionizing dose effects on graphene nano-disc non-volatile memory devices
Z
Zynq-7000	On the Analysis of radiation-induced Failures in the AXI Interconnect Module

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