ESREF 2020: 31ST EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS
Poster Room

Sessions

  • Session Poster 1a (Oct 05 14:00-15:30) A - Quality and reliability assessment techniques and methods for devices and systems
  • Session Poster 1b (Oct 05 14:00-15:30) I - Renewable energy systems reliability
  • Session Poster 1c (Oct 05 14:00-15:30) K -Radiation impact on circuits and systems reliability
  • Session Poster 2a (Oct 06 14:00-15:30) F1 - Silicon power devices, IGBTs, thyristors
  • Session Poster 2b (Oct 06 14:00-15:30) F2 - Wide bandgap power Devices
  • Session Poster 2c (Oct 06 14:00-15:30) F3 - Power electronic auxiliary circuits and system reliability
  • Session Poster 3a (Oct 07 14:00-15:30) B - Failure mechanisms and reliability of micro- and nanoelectronics
  • Session Poster 3b (Oct 07 14:00-15:30) C - Progress in failure analysis: defect detection and analysis
  • Session Poster 3c (Oct 07 14:00-15:30) E - Packaging and assembly reliability and failure analysis
  • Session Poster 3e (Oct 07 14:00-15:30) H - ESD, EOS, Latch-up, EMC-EMI in integrated and power circuits
  • Session Poster 3f (Oct 07 14:00-15:30) L - Batteries, capacitors & passives