Room C
Sessions
- Session cF2-1 (Oct 05 09:00-10:50) Wide bandgap power Devices: SiC and Ga2O3 device reliability - Invited Alberto Castellazzi
- Session cB (Oct 05 11:10-13:30) Failure mechanisms and reliability of micro- and nanoelectronics
- Session cG-1 (Oct 06 11:00-12:40) Photonics
- Session cF2-2 (Oct 07 09:00-10:50) Wide bandgap power Devices: GaN and Ga2O3 device level reliability - Invited Kornelius Tetzner
- Session cG-2 (Oct 07 11:30-12:50) MEMS
- Session cH (Oct 08 09:20-10:20) ESD, EOS, Latch-up, EMC-EMI in integrated and power circuits
- Session cG-2 (Oct 08 11:00-12:00) MEMS