ESREF 2020: 31ST EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS
Room B

Sessions

  • Session bF1 (Oct 05 09:00-10:20) Silicon power devices, IGBTs, thyristors
  • Session bC (Oct 05 11:10-13:30) Progress in failure analysis - defect detection and analysis
  • Session I (Oct 06 09:00-10:40) Renewable energy systems reliability
  • Session bE-2 (Oct 06 11:00-12:40) Solder joint reliability
  • Session bF3 (Oct 07 09:00-10:40) Power electronic auxiliary circuits and system reliability
  • Session bK-1 (Oct 07 11:30-12:50) Radiation impact on circuits and systems reliability
  • Session bL (Oct 08 11:00-12:20) Batteries, capacitors and passives