Room A
Sessions
- Session aA-1 (Oct 05 09:00-10:20) Quality and reliability assessment techniques and methods for devices and systems
- Session aE-1 (Oct 05 11:10-13:20) Reliability of die-attach, modules and assemblies - Invited Nicola Delmonte
- Session D (Oct 06 09:00-10:40) Reliability of microwave devices and circuits
- Session aA-2 (Oct 06 11:00-12:40) Quality and reliability assessment techniques and methods for devices and systems
- Session aJ (Oct 07 09:00-10:40) Modeling for Reliability
- Session A-3 (Oct 07 11:30-12:50) Quality and reliability assessment techniques and methods for devices and systems
- Session aK-2 (Oct 08 09:00-10:20) Radiation impact on circuits and systems reliability
- Session aF2-3 (Oct 08 11:00-12:50) Power electronic auxiliary circuits and system reliability - Invited Martin Kuball