EPEPS 2026: 35TH IEEE CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS
TALK KEYWORD INDEX

This page contains an index consisting of author-provided keywords.

2
2.5D/3D integration
224G/448G SerDes
224Gb/s
3
3D IC packaging
A
Active learning
ADC-based receiver
Advanced package
advanced packaging
Advanced packaging 3D integration
Ag sintered layer
Ag sintering chip attachment
Agents
AI Data Centers
AlGaNGaN
AMB sub strate
AMEn solver
Automation
B
balanced line
Bandwidth
bidirectional
boundary element method
bridged-T coil (BTC)
Bump map
C
channel allocation
Chiplet
chiplets
circuit ports
Co-optimization
Co-packaged Optics
common-mode modulation
Compute-In-Memory system design
correlation
crosstalk
Crosstalk Suppression
Cryogenic
Cu surface roughness
current mode driver
custom base die
D
D-stability
D2D link
Data-driven macromodeling
dataset
DDR5 RDIMM
decoupling capacitor
Deep equilibrium model
Design space exploration
Design Space Exploration (DSE)
die-to-die interconnects
differential tab structures
direct-attach copper cable
DNN inference
DSL
DTC
Dual side cooling
E
electromagnetic modeling
Enhanced SNR
Eye diagram
F
fast Fourier transform
fatigue analysis
fiber-weave
Filtering
finite element analysis
finite-volume modeling
G
Gaussian process regression
Gaussian processes
Generative AI
Graphics processing unit
Ground bounce
H
Harmonic Balance
HBF
HBM
HBM test system
Heat Harvesting
heterogeneous integration
high bandwidth flash
high bandwidth memory
high current
High Density Interconnect (HDI)
high performance computing
High speed signaling
high-bandwidth memory
High-performance computing
high-speed channel
high-speed interconnect
high-speed signalling
High-Step VR
I
impedance
Insertion Loss(IL)
Interconnects
interposer
interposer channel
J
jitter
L
large language model inference
large language models
Liquid Cooling
low-voltage differential signalling
LPDDR
LPDDR5X
M
Machine Learning
Machine Learning (ML)
Macromodeling
Measurement techniques
mechanical
memory interfaces
Method of Moments
millimeter wave circuits
minimum power loss
ML and AI-based approaches
ML and AI-based approaches to interconnect and packaging problems
Model Order Reduction
Modeling
Modeling and simulation
Moment-matching method
Multi-objective Bayesian optimization
Multi-physics
Multiconductor transmission lines
multifin devices
multiphysics modeling
multiphysics simulation
N
nanowire
Neural Networks
NMC
Noisy data
Nonlinear circuits
O
on-chip passives
Optical I/O
optimal condition
P
P/N skew calibration
package
PAM-4 wireline transceiver
Parameterized macromodeling
PDGs
PDN
phase shifter
phase-locked loop
Physics Based
power consumption
power delivery network
power distribution network
power gating
Power Integrity
projection
PSIJ
Q
Quantum systems: interconnection and packaging
R
receiver equalization
Reconfigurable Interconnect
Recurrent neural network
reinforcement learning
retimer-dependence reduction
return path
S
SerDes
SiC power devices
Signal and power integrity
Signal and power integrity issues
signal integrity
signal integrity recovery structure
silicon interposer
Simulation
Simultaneous switching noise (SSN)
SIPI
Spoof Surface Plasmon Polaritons
statistical eye simulation
Steady state analysis
Surrogate model
surrogate modeling
T
TDP
tensor train
Test Fixture
Thermal
thermal distribution
thermal integrity
Thermal Management
Thermal resistance
thermal stress
thermal sweep
Thermal-mechanical simulation
time-dependent density functional theory
Time-Domain Vector Fitting
time-interleaved ADC
Transformer neural network
Transient electrothermal co-simulation
transmission lines
trigate transistors
TX FIR tuning
U
UCIe
Universal Chiplet Interconnect Express-Advanced (UCIe-A)
USB4
V
Vanadium Dioxide
Vertical Power Delivery
Vertical Power Delivery (VPD)
via interconnects
Voltage supply noise
volume integral equation
W
wave ports
Worst-Case Droop
Y
yield-aware design