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Author: Saghir Shaikh

This page shows all presentations of this author published in EasyChair Smart Slide.

Chasing Front-End-Of-Line Defects with Cell-Aware Diagnostics in High-Volume Manufacturing

Chasing Front-End-Of-Line Defects with Cell-Aware Diagnostics in High-Volume Manufacturing

Saghir Shaikh, Lay Hoon Loh, Brandon Brea, Palanisamy Prakash, Gaurav Devrani, Jim Lee, Muhammad Waheed and Giyoung Yang

Test Technology Standards Committee Overview & IEEE Std 1450 (STIL) Updates

Test Technology Standards Committee Overview & IEEE Std 1450 (STIL) Updates

Saghir Shaikh and Ric Dokken

Presentations in this collection: 2
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