PROGRAM FOR WEDNESDAY, FEBRUARY 24TH: TALK VIEW
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8:00
8:30
9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
15:30
16:00
08:00-09:30 Tutorial: Fault Tolerant Techniques for Integrated Circuits
09:30-10:00 Networking
10:00-11:00 Keynote A. Sangiovanni-Vincentelli: The role of innovation in the new normal
12:00-12:20
D. Cordova, W. Cops, Y. Deval, F. Rivet, H. Lapuyade, N. Nodenot, Y. Piccin
12:20-12:40
A. Fernandez Bocco, F. Solis, B.T. Reyes, D.A. Morero, M.R. Hueda
12:40-13:00
Agustin C. Galetto, Benjamin T. Reyes, Damian A. Morero, Mario R. Hueda
13:00-13:20
Guillermo Royo, Carlos Sánchez-Azqueta, Concepción Aldea, Santiago Celma
12:00-12:20
Geancarlo Abich, Ricardo Reis, Luciano Ost
12:20-12:40
M.E. de Melo Hang, C.M. Marques, P.F. Butzen, C. Meinhardt
12:40-13:00
Andrea Floridia, Ernesto Sanchez
13:00-13:20
On-Chip Area and Test Time Effective Weak Resistive Open Defect Detection Technique for Cache Memory
Sheetal Barekar, Madan Mali
13:20-13:40
L.H. Brendler, A.L. Zimpeck, F.L. Kastensmidt, C. Meinhardt, R. Reis
13:40-14:00
Leonardo Moraes, Alexandra Lackmann Zimpeck, Cristina Meinhardt, Ricardo Reis
12:00-12:20
Laura Hernández-Alpizar, Arys Carrasquilla-Batista, Lilliana Sancho-Chavarria
12:20-12:40
François Rivet, Laura Foucaud, Guillaume Ferré
12:40-13:00
Daniel Nicolalde, José Apolinário, Wallace Martins
13:00-13:20
S. Shahabuddin, M.A. Albreem, M.S. Shahabuddin, Z. Khan, M. Juntti
12:00-14:00 Iberchip
14:00-14:30 Networking
14:30-16:00 Prime-LA
11:00-12:00 Break