ITC 2026: 2026 IEEE INTERNATIONAL TEST CONFERENCE
PROGRAM FOR MONDAY, OCTOBER 12TH: TALK VIEW
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08:30-12:00 From LLMs to AI Agents: Foundations for Semiconductor Engineering
08:30-12:00 3DIC Advanced Packaging, Test & SLM
08:30-12:00 Timing Tests, Process Variations, Circuit Marginalities and Silent Data Corruption
08:30-12:00 Beyond Standard DFT and Test: What Is Needed for Today's Custom Chips?
13:00-16:30 From LLMs to Agentic AI: Applications and Architectures for Test Data Analytics
13:00-16:30 UCIe based Multi-Chiplets Design & Test
13:00-16:30 Device-Aware-Test: A Strategic Solution for Unmodeled Faults
13:00-16:30 In-Field System Test & Debug
17:00-18:00 Monday Panel
10:00-10:30 Tutorial Break (Texas Ballroom Prefunction)
12:00-13:00 Tutorial Lunch (Presido ABC)
14:30-15:00 Tutorial Break (Texas Ballroom Prefunction)
16:30-17:00 Panel Break (Texas Ballroom Prefunction)