Zine is a PhD candidate in Computer Engineering at Southern Methodist University, specializing in VLSI testing and automation. His research focuses on improving automotive semiconductor reliability through advanced stress techniques and Design-for-Testability (DFT) methodologies. He is currently collaborating with a top-three automotive semiconductor manufacturer to address DFT and VLSI testing challenges. Drawing on three years of combined experience in software and embedded-firmware design, together with advanced coursework in VLSI design, testing, and failure analysis, Zine is also exploring how AI can accelerate design-for-test workflows and is looking forward to engaging with industry leaders and researchers to shape the future of semiconductor testing.