Prashant Seetharaman is a Technology Enablement Engineer at Siemens in the field of Design for Testability (DFT) and EDA semiconductor technology. He currently specializes in Memory Built-In Self-Test (MBIST) solutions. He holds an M.S. degree in Electrical Engineering and Computer Sciences from the University of California, Berkeley and San Francisco State University. He is a member of several professional organizations, including the IEEE Computer Society, Society of Advanced Optics and Photonics (Optica), and IEEE Circuits and Systems Society. He currently serves as a contributor to the IEEE P2851 standards group for functional safety and interoperability and the UCIe consortium WG.Prashant Seetharaman is a Technology Enablement Engineer at Siemens in the field of Design for Testability (DFT) and EDA semiconductor technology. He currently specializes in Memory Built-In Self-Test (MBIST) solutions. He holds an M.S. degree in Electrical Engineering and Computer Sciences from the University of California, Berkeley and San Francisco State University. He is a member of several professional organizations, including the IEEE Computer Society, Society of Advanced Optics and Photonics (Optica), and IEEE Circuits and Systems Society. He currently serves as a contributor to the IEEE P2851 standards group for functional safety and interoperability and the UCIe consortium WG.