Harry H. Chen is currently IC Testing Scientist at MediaTek Inc. His research interests are in system-level-test (SLT) methodology, transistor-level defect analysis, post-silicon variability profiling, and data analytics to connect device marginalities with system-level parametrics and failures. He has on-going collaborations with university researchers related to the above interests. Harry serves as IEEE Heterogeneous Integration Roadmap (HIR) Test Chapter's SLT section lead, SEMI Taiwan Testing Committee Co-Chair, and technical program committee member for various conferences (VLSI-DAT, ASP-DAC, ITC).