Jayesh Kumar Pandey, IEEE Senior Member, is a DFT Lead at NVIDIA Corporation, specializing in In-System Test (IST) and Design-for-Testability (DFX) methodologies for advanced AI and high-performance computing SoCs. He has over 18 years of semiconductor industry experience, with prior roles at Texas Instruments and LSI. His research contributions have been published in IEEE conferences such as ITC and VTS, and he serves as a reviewer and program committee member in the test community.