Ron Press is a Senior Director of Technology Enablement for Tessent products within Siemens EDA.  He is a 30-year veteran of the test and DFT industry has presented seminars on DFT and test throughout the world. Mr. Press co-authored patents on clock switching, reduced pin count testing, and 3D test. Ron has published many papers in the field of test.  He is a member of the ITC Steering Committee and was the general chair of ITC multiple years.  Ron is a Golden Core Member of the IEEE Computer Society and an IEEE Senior Member.