David Keezer received the PhD. degree in electrical and electronic engineering from Carnegie-Mellon University, Pittsburgh, PA, USA. He has held positions as an associate professor, professor, and honorary (emeritus) professor at the Georgia Institute of Technology, Atlanta, GA, USA. He has served as a reviewer and editor for numerous international academic conferences and journals. He has chaired sessions at the IEEE International Test Conference, IEEE VLSI Test Symposium, IEEE Electronic Packaging Technology Conference and other international conferences. From 1990 to 2019, he received the IEEE International Test Conference (ITC, the top international conference in the field of testing) award for his contributions. In 2010, he was elected as an IEEE Fellow and in 2024, he became an IEEE Life Fellow. He has published more than 270 papers in international journals and conferences, supervised 11 PhD students and 19 master's students to successful graduation, participated in more than 100 PhD defense committees, and taught thousands of master's and undergraduate students. He currently serves as a chair professor at Eastern Institute of Technology, Ningbo. His research focuses on high-performance electronic system design and testing methods, high-speed logic system design, and advanced electronic packaging research.