Ching-Nen Peng received the MS degree in electrical engineering from National Chung Hsing University in 1998. Since 2000, he has been working at Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, Taiwan, where he is currently a manager at Testing Department. He has been working in the test program development more than 20 years, including advanced nodes (N10/N12/N16) test vehicles test development (SRAM and logic), advanced package technology testing (CoWoS/InFO/UFI/3DIC), embedded DRAM IP testing, CMOS image sensor, AP processor, RF applications, customers testing service, etc. He has more than 28 patents published or issued.