Gowsika is a third-year Ph.D. student in Electrical and Computer Engineering at the Georgia Institute of Technology, specializing in digital circuit testing methodologies and design-for-test techniques. She is currently a research intern at Intel as a Circuit Design, Quality & Reliability Engineer. Her research focuses on developing approaches to improve the efficiency, scalability, and robustness of test strategies for modern integrated circuits using AI, with the goal of enhancing fault coverage, reducing test cost, and ensuring long-term system reliability. Beyond core research, her technical interests extend to circuit design, reliability, low-power design techniques, and timing analysis.