Shubhendu Shrivastava received his M.Sc. degree from TU Delft and is currently a DfT Engineer at NXP Semiconductors with 4 years of experience in R&D for the automotive domain. He works on transceivers and PHY modules, with a focus on test quality and reliability. His current research interests include optimization of voltage stress testing and advancing transition test methodology to reduce test cost while ensuring robust quality in advanced CMOS and FinFET technologies.