Dr. Martin Keim joined the Tessent product group of Mentor Graphics in 2001, now part of Siemens EDA, where he is Senior Engineering Director responsible for the Memory Testing, Built-In Self-Test Diagnosis products, IJTAG infrastructure, as well as Multi-die testing.

For several years, Dr. Keim has worked on the organizing committee of the International Symposium for Testing and Failure Analysis (ISTFA), for which he was General Chair in 2016. He is past member of the IEEE 1687-2014 working group, member of the IEEEP1687.1, IEEE P3405, and P1838a working groups, and General Chair of the current P1687 Refresh working group.

He holds several national and international patents and is author of numerous technical publications. He received a doctorate in Informatics from the Albert-Ludwigs University in Freiburg im Breisgau, Germany.