ITC 2024: IEEE INTERNATIONAL TEST CONFERENCE
PROGRAM FOR MONDAY, NOVEMBER 4TH: TALK VIEW
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8:30
9:00
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08:30-12:00 3DIC ADVANCED PACKAGING, TEST & SLM
08:30-12:00 ARTIFICIAL INTELLIGENCE SAFETY
08:30-12:00 FUNCTIONAL TESTING TECHNIQUES
10:00-10:30 Tutorial Coffee Break
13:00-16:30 UCIE 2.0 BASED MULTI-CHIPLETS DESIGN & TEST
13:00-16:30 COMPUTATION IN MEMORY: TECHNOLOGIES, DESIGN, TEST AND RELIABILITY
13:00-16:30 IN-FIELD SYSTEM TEST & DEBUG
14:30-15:00 Tutorial Coffee Break
16:30-18:00 Monday Panel: Better Together - United by Technology and Advancing the State of the Art in Semiconductor Test
12:00-13:00 Tutorial Lunch Break (Sapphire Terrace)