ITC 2024: IEEE INTERNATIONAL TEST CONFERENCE
PROGRAM FOR MONDAY, NOVEMBER 4TH
Days:
previous day
next day
all days

View: session overviewtalk overview

08:30-12:00 Session Tutorial T7: 3DIC ADVANCED PACKAGING, TEST & SLM

TTEP Tutorial by

Sandeep GOEL (TSMC), Yervant ZORIAN (Synopsys)

More Information: http://ttep.tttc-events.org/ttep/tutorials.html#tutorial7

Location: Sapphire 400
08:30-12:00 Session Tutorial T8: ARTIFICIAL INTELLIGENCE SAFETY

TTEP Tutorial by

Annachiara RUOSPO (Politecnico di Torino), Riccardo MARIANI (NVIDIA)  

More Information: http://ttep.tttc-events.org/ttep/tutorials.html#tutorial8

Location: Sapphire 410
08:30-12:00 Session Tutorial T9: FUNCTIONAL TESTING TECHNIQUES

TTEP Tutorial by

Paolo BERNARDI (Politecnico di Torino) 

More Information: http://ttep.tttc-events.org/ttep/tutorials.html#tutorial9

Location: Sapphire 411
10:00-10:30 Session CB3: Tutorial Coffee Break

Tell your presenter to take a break

12:00-13:00Tutorial Lunch Break (Sapphire Terrace)
13:00-16:30 Session Tutorial T10: UCIE 2.0 BASED MULTI-CHIPLETS DESIGN & TEST

TTEP Tutorial by

Debendra DAS SHARMA (Intel), Yervant ZORIAN (Synopsys) 

More Information: http://ttep.tttc-events.org/ttep/tutorials.html#tutorial10

Location: Sapphire 400
13:00-16:30 Session Tutorial T11: COMPUTATION IN MEMORY: TECHNOLOGIES, DESIGN, TEST AND RELIABILITY

TTEP Tutorial by

Mehdi TAHOORI (Karlsruhe Institute of Technology) 

More Information: http://ttep.tttc-events.org/ttep/tutorials.html#tutorial1

Location: Sapphire 410
13:00-16:30 Session Tutorial T12: IN-FIELD SYSTEM TEST & DEBUG

TTEP Tutorial by

Amit PANDEY (Amazon), Karthik NATARJAN (Synopsys), Sankaran MENON (Intel)

More Information: http://ttep.tttc-events.org/ttep/tutorials.html#tutorial12

Location: Sapphire 411
14:30-15:00 Session CB4: Tutorial Coffee Break

Tell your presenter to take a break

16:30-18:00 Session Panel-Monday: Monday Panel: Better Together - United by Technology and Advancing the State of the Art in Semiconductor Test

Moderators: Seoyeon Kim & Yu Su (UCSB) 

Panelists 

Teresa McLaurin - ARM

Jeff Rearick - AMD

Adam Cron - Synopsys

Steve Sunter - Siemens

Savita Banerjee - Meta

The test community has a long history of embracing diversity and joining forces to further the state of art in test technology. With full-lifecycle product engagement, the test ecosystem plays a pivotal role in a product's success. Hear from industry veterans who have built their careers fighting defects to ensure quality and reliability using tools they have shaped. Learn from their failures and derive inspiration from their resilience and commitment to develop the next generation of innovators. 

 

Location: Sapphire OP