ITC 2024: IEEE INTERNATIONAL TEST CONFERENCE
PROGRAM FOR SUNDAY, NOVEMBER 3RD: TALK VIEW
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8:30
9:00
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12:00
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08:30-12:00 RANDOM PROCESS VARIATIONS, CIRCUIT TIMING MARGINALITIES AND SILENT DATA ERRORS
08:30-12:00 ENHANCING TRUSTWORTHINESS IN THE GLOBAL IC SUPPLY CHAIN
08:30-12:00 HIERARCHICAL AND TILE BASED DFT TECHNIQUES FOR AI AND LARGE SOC
10:00-10:30 Tutorial Coffee Break
13:00-16:30 LLM-ASSISTED ANALYTICS IN SEMICONDUCTOR TEST
13:00-16:30 AUTOMOTIVE FUNCTIONAL SAFETY USING PREDICTIVE MAINTENANCE
13:00-16:30 MIXED-SIGNAL DFT CHALLENGES AND SOLUTIONS
14:30-15:00 Tutorial Coffee Break
12:00-13:00 Tutorial Lunch Break (Sapphire Terrace)