PROGRAM FOR THURSDAY, SEPTEMBER 29TH: TALK VIEW
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9:00
9:30
10:00
10:30
11:00
11:30
12:00
12:30
13:00
13:30
14:00
14:30
15:00
09:00-09:10 Award Presentation
09:10-10:00 Keynote Speech 3: What did we learn in 120 years of DFT and test?
10:30-12:00
Yan-Fu Chen, Duo-Yao Kang, Kuen-Jong Lee
10:30-12:00
Mittal, Urban, Chung, Janicki, Cheng, Parley, Sharma, Nicholson
10:30-12:00
Pierre d'Hondt, Aymen Ladhar, Patrick Girard, Arnaud Virazel
10:30-12:00 Special Session on Chiplet Integration
10:30-12:00
Arunachalam, Kizhakkayil, Kundu, Raha, Banerjee, Jin, Su, Basu
10:30-12:00
Chen-Lin Tsai, Shi-Yu Huang
10:30-12:00
Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65 nm CMOS
Ming-Hsien Hsiao, Pin-Tang Wang, Chia-Wei Liang, Hung-Pin Wen
10:30-12:00
Hans Martin von Staudt, Luai Elnawawy, Sarah Wang, Larry Ping, Jung Woo Choi
10:30-12:00
Farrokh Ghani Zadegan, Zilin Zhang, Kim Petersén, Erik Larsson
10:30-12:00
Arani Sinha, Yonsang Cho, Jon Easter, Meizel V. Leiva Rojas
13:30-15:00
Jerzy Tyszer, Grzegorz Mrugalski, Janusz Rajski, Bartosz Wlodarczak
13:30-15:00
Jerin Joe, Nilanjan Mukherjee, Irith Pomeranz, Janusz Rajski
13:30-15:00
W.-C. Lin, C. Chen, C.-H. Hsieh, J.C.-M. Li, E.J.-W. Fang, S.S.-Y. Hsueh
13:30-15:00
Manchukonda, Tsai, Abdel-Hafez, Dsouza, Natarajan, Lai, Hsueh
13:30-15:00 Special Session on Silicon Life-Cycle Management “Design-for-Verification (DfV): A New Direction in Design Qualification”
13:30-15:00 Panel 4: Automotive
13:30-15:00
Sankararao Akkapolu, Vaishnavi G, Sandya Rani Malige
13:30-15:00
Peter Wohl, John Waicukauski, Vijay Kumar K S, Anushree Bhat, Rajit Karmakar
13:30-15:00
Pratishtha Agnihotri, Priyank Kalla, Steve Blair