Program for Monday, October 5th: Talk View

PROGRAM FOR MONDAY, OCTOBER 5TH: TALK VIEW

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View: with abstracts session overview

9:00

9:30

10:00

10:30

11:00

11:30

12:00

12:30

13:00

13:30

14:00

14:30

15:00

15:30

09:00-09:20

Impact of electrical stress on total ionizing dose effects on graphene nano-disc non-volatile memory

Kai Xi, Jinshun Bi

09:20-09:40

CSME: A Novel Cycle-Sensing Margin Enhancement Scheme for High Yield STT-MRAM

Mingyue Liu, Hao Cai, Yongliang Zhou, Bo Liu, Lirida Naviner

09:40-10:00

A Novel BIST for Monitoring Aging / Temperature by Self-Triggered Scheme to Improve the Reliability of

Yongliang Zhou, Hao Cai, Mengdi Zhang, Lirida Naviner, Jun Yang

10:00-10:20

Monitoring of Parameter Stability of SiC MOSFETs in Real Application Tests

M. Sievers, B. Findenig, M. Glavanovics, T. Aichinger, B. Deutschmann

10:20-10:40

Extraction of Wearout Model Parameters using On-Line Test of an SRAM

Shu-Han Hsu, Ying-Yuan Huang, Yi-da Wu, Kexin Yang, Li-Hsiang Lin, Linda Milor

09:00-09:20

Analysis of the aging mechanism occurring at the bond-wire contact of IGBT power devices during power

N. Dornic, A. Ibrahim, Z. Khatir, N. Degrenne, S. Mollov, D. Ingrosso

09:20-09:40

Single-pulse observation of photoemission during avalanche breakdown in insulated gate bipolar

Koichi Endo, Norimichi Chinone, Tomonori Nakamura, Toru Matsumoto, Koji Nakamae

09:40-10:00

Thermal Behaviour Evolution of an IGBT Chip After Aging Measured by Thermoreflectance

Metayrek Youssef, Kociniewski Thierry, Khatir Zoubir

10:00-10:20

Shoot-through protection for an inverter consisting of the next-generation IGBTs with gate impedance

Kazunori Hasegawa, Seiya Abe, Masanori Tsukuda, Ichiro Omura, Tamotsu Ninomiya

10:20-10:40

Modular dynamic pulse stress test system for discrete high power semiconductors

Konstantinos Patmanidis, Michael Glavanovics, Angelos Georgakas, Annette Muetze

09:00-09:20

On the use of soft gamma radiation to characterize the pre-breakdown carrier multiplication in SiC power MOSFETs and its correlation to the TCR failure rate as measured by neutron

Mauro Ciappa, Marco Pocaterra

09:20-09:40

Surge Current Capability of Ultra-Wide-Bandgap Ga2O3 Schottky Diodes

C. Buttay, H.-Y. Wong, B. Wang, M. Xiao, C. DiMarino, Y. Zhang

09:40-10:00

A non-invasive SiC MOSFET Junction Temperature Estimation Method based on the Transient Light Emission from the Intrinsic Body

Giovanni Susinni, Francesco Iannuzzo, Angelo Raciti, Santi Agatino Rizzo

10:00-10:20

Gate-damage accumulation and off-line recovery in SiC power MOSFETs with soft short-circuit failure

Castellazzi, Richardeau, Borghese, Boige, Fayyaz, Irace, Guibaud, Chazal

10:20-10:50

Fail-to-open short-circuit failure mode in SiC power MOSFETs, device characterization and system level

Alberto Caztellazzi

10:50-11:10 Break

11:10-11:30

CFD Modelling of Additive Manufacturing Liquid Cold Plates for More Reliable Power Press-Pack

P. Cova, D. Santoro, D. Spaggiari, F. Portesine, F. Vaccaro, N. Delmonte

11:30-11:50

Combined Experimental-FEM Investigation of Electrical Ruggedness in Double-Sided Cooled Power

Scognamillo, Catalano, Lasserre, Duchesne, d'Alessandro, Castellazzi

11:50-12:10

Vibration-induced dynamic characteristics modeling of electrical contact resistance for connectors

Le Xu, Sanqiang Ling, Donghui Li, Guofu Zhai

12:10-12:30

Investigation of the mechanical properties of corroded sintered silver layers by using

Elisabeth Kolbinger, Simon Kuttler, Stefan Wagner, Martin Schneider-Ramelow

12:30-12:50

New power module concept in PCB-Embedded technology with silver sintering die attach

A. Tablati, N. Alayli, T. Youssef, O. Belnoue, L. Théolier, E. Woirgard

12:50-13:20

3D and compact thermal modeling in power electronics: an overview

Nicola Delmonte

11:10-11:30

Radiation-enhanced glide of 30o Shockley partial dislocations in gallium nitride heterostructures

G. Vasileiadis, Belabbas, Moneta, Smalc-Koziorowska, Komninou, P. Dimitrakopulos

11:30-11:50

Profiling of carriers in a 3D flash memory cell with nanometer-level resolution using scanning nonlinear dielectric

Jun Hirota, Kohei Yamasue, Yasuo Cho

11:50-12:10

Reliable Endpoint Technique on Si trenching for Backside Circuit Edit

Hideo Tanaka, Chun-Cheng Tsao

12:10-12:30

Magnetic field imaging and light induced capacitance alteration for failure analysis of Cu-TSV

Ingrid De Wolf, Kristof J.P. Jacobs, Antonio Orozco

12:30-12:50

Analog and Mixed-Signal Circuits simulation for product level EMMI analysis

Tommaso Melis, Emmanuel Simeu, Etienne Auvray, Paul Armagnat

12:50-13:10

On the replacement of water as coupling medium in scanning acoustic microscopy analysis of sensitive electronics

Michael Hertl, Florie Mialhe, Isaline Richard

11:10-11:30

A Single-Trap Study of PBTI in SiON nMOS Transistors

Michael Waltl, Bernhard Stampfer, Gerhard Rzepa, Ben Kaczer, Tibor Grasser

11:30-11:50

Reliability Analysis in GeTe and GeSbTe based Phase-Change Memory 4kb Arrays targeting Storage Class Memory

Lama et.al

11:50-12:10

Hot-Carrier Degradation in P- and N- Channel EDMOS for Smart Power Application

S. Li, A. Bravaix, E. Kussener, D. Ney, X. Federspiel, F. Cacho

12:10-12:30

Single event upset for monolithic 3-D integrated 6T SRAM based on a 22 nm FD-SOI technology: Effects of channel size and

Zhang, Liu, Li, Li, Huang, Yang, Wang, Wang, Luo, Han

12:30-12:50

Methodology to Evaluate the Critical Blocks in an Integrated Circuit based on the Temperature

Rafael Nunes, José Ramirez, Roberto Orio

12:50-13:10

Analysis of the successive breakdown statistics of multilayer Al2O3/HfO2 gate stacks using the time-dependent clustering

J. Muñoz Gorriz, M. Gonzalez, F. Campabadal, J. Suñe, E. Miranda

13:10-13:30

Research on 3D NAND flash reliability from the perspective of threshold voltage distribution

Debao Wei, Hua Feng, Xiaoyu Chen, Liyan Qiao, Xiyuan Peng

13:30-14:00 Break

14:00-15:30

Modeling and analysis of the catastrophic failure and degradation data

Seung Hyun Kim, Si-Il Sung

A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula

Guangze Pan, Yaqiu Li, Xiaobing Li, Qin Luo, Chunhui Wang, Xianghong Hu

Optimal Sampling for Accelerated Testing in 14nm FinFET Ring Oscillators

Shu-Han Hsu, Ying-Yuan Huang, Yi-da Wu, Kexin Yang, Li-Hsiang Lin, Linda Milor

Life-cycle Reliability Design Optimization of High-power DC Electromagnet-ic Devices Based on Time-dependent Non-probabilistic Convex Model

X. Ye, H. Chen, Q. Sun, C. Chen, H. Niu, G. Zhai, W. Li, R. Yuan

A high-efficiency threshold voltage distribution test method based on the reliability of 3D NAND flash

Debao Wei, Xiaoyu Chen, Hua Feng, Liyan Qiao, Xiyuan Peng

A novel accelerated life-test method under thermal cyclic loadings for electronic devices considering multiple failure

Yaqiu Li, Guangze Pan, Qian Li, Chunhui Wang, Xianghong Hu

An error detecting scheme with input offset regulation for Enhancing Reliability of ultralow-voltage

P. Yang, X. Ye, Y. Zhao, W. Zhang, S. Huang, Y. Huang, Y. Wang

FPGA-based reliability testing and analysis for 3D NAND flash memory

Debao Wei, Zhelong Piao, Hua Feng, Liyan Qiao, Xiyuan Peng

FBGA solder ball defect effect on DDR4 data signal rise time and ISI measured by loading the data line with a

M. Waqar, S. Baeg, G. Bak, J. Kwon, K. Lee, S.H. Jeon

Comparisons of SnO2 Gas Sensor Degradation under Elevated Storage and Working Conditions

Yongquan Sun, Jiaying Guo, Jia Qi, Bo Liu, Tianhua Yu

Effect of integrated anneal optimizations of electroplated Cu thin films Interconnects

Abdul Wahab, Johan, Hamizi, Akbarzadeh, Chowdhury, Sagadevan

Analysis of counterfeit electronics

Giovanna Mura, Roberto Murru, Giovanni Martines

Smart Manufacturing through Predictive FA

Ankush Oberai, Rupa Kamoji

Assessing Multi-Output Gaussian Process Regression for Modeling of Non-Monotonic Degradation Trends of Light Emitting Diodes in

S.L.H. Lim, P.L.T. Duong, H. Park, P. Singh, C.M. Tan, N. Raghavan

14:00-15:30

Electro-thermal Evaluation and Comparison of Quasi-Z Source Inverter Using Different Modulation Methods in Wind Power

Peng Fan, Shoudao Huang, Derong Luo

14:00-15:30

Mitigating single event upset of FPGA for the onboard bus control of satellite

Xiuhai Cui, Liansheng Liu

Reliability-driven pin assingment optimization to improve in-orbit soft-error rate

Aguiar, Wrobel, Autran, Leroux, Sagné, Pouget, Touboul

Single-event induced failure mode of PWM in DC/DC converter

Gao, Li, Li, Li, Zhao, Li, Zhang, Wang, Zeng, Liu, Cui, Wu, Ye

Design Exploration of Majority Voter Architectures based on the Signal Probability for TMR Strategy Optimization in Space

Aguiar, Wrobel, Autran, Leroux, Sagné, Pouget, Touboul

On the Analysis of radiation-induced Failures in the AXI Interconnect Module

Corrado De Sio, Sarah Azimi, Luca Sterpone

Evaluating the Soft Error Sensitivity of a GPU-based SoC for Matrix Multiplication

German Leon, Jose M. Badia, Jose A. Belloch, Almudena Lindoso, Luis Entrena

An Investigation of FinFET Single-Event Latch-up Characteristic and Mitigation Method

Dongqing Li, Tianqi Liu, Zhenyu Wu, Chang Cai, Peixiong Zhao, Ze He, Jie Liu

Comparing Analytical and Monte-Carlo-based Simulation Methods for Logic Gates SET Sensitivity

R. Schvittz, Y.Q. Aguiar, F. Wrobel, J.-L. Autran, L. Rosa Jr, P.F. Butzen