Program for Tuesday, October 2nd: Talk View

PROGRAM FOR TUESDAY, OCTOBER 2ND: TALK VIEW

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View: with abstracts session overview

9:00

9:30

10:00

10:30

11:00

11:30

12:00

12:30

13:00

13:30

14:00

14:30

15:00

15:30

16:00

16:30

17:00

17:30

18:00

18:30

19:00

19:30

20:00

20:30

21:00

21:30

22:00

08:40-09:00

An acoustic emission sensor system for thin layer crack detection

M. Unterreitmeier, O. Nagler, L. Pfitzner, R. Weigel, R. Holmer

09:00-09:20

Device Characterization of 16/14nm FinFETs for Reliability Assessment with Infrared Emission Spectra

Ivo Vogt, Tomonori Nakamura, Babak Motamedi, Christian Boit

09:20-09:40

Lock-in Thermography for defect localization and thermal characterization for space application

Morgane Mousnier, Kévin Sanchez, Elsa Locatelli, Thierry Lebey, Vincent Bley

09:40-10:00

Physics-of-Failure (PoF) methodology for qualification and lifetime assessment of supercapacitors for industrial

A. Bey Temsamani, S. Kauffmann, S. Helsen, T. Gaens, V. Driesen

10:00-10:20

Smart SiC MOSFET accelerated lifetime testing

Nick Baker, Francesco Iannuzzo

08:40-09:00

Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power

N. Dornic, A. Ibrahim, Z. Khatir, J. Ewanchuk, S. Mollov, S. Tran, J.-P. Outsen

09:00-09:20

Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha

Mauro Ciappa, Ying Pang, Chenchen Sun

09:20-09:40

A power cycling degradation inspector of power semiconductor devices

Akihiko Watanabe, Ichiro Omura

09:40-10:00

The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of

C. Papadopoulos, C. Corvasce, A. Kopta, D. Schneider, G. Paques, M. Rahimo

08:40-09:00

ZURICH INSTRUMENTS: Digital Signal Processing for FA

Stephan Koch

09:00-09:20

MASER: Next generation Accelerated Life test systems for individual sub-40nm node IC’s

Kees Revenberg

09:20-09:40

PARK SYSTEMS: Automatizing Atomic Force Microscopy – Newest technological solutions in advanced applications for failure

Ludger Weisser

09:40-10:00

INSIDIX: TDM COMPACT3: Multi-physical platform for advanced warpage and strain measurement

Diane Ecoiffier

08:40-09:00

Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic

Ionut Vernica, Huai Wang, Frede Blaabjerg

09:00-09:20

Impact of meteorological variations on the lifetime of grid-connected PV inverters

E. Brito, A. Cupertino, P. Reigosa, Y. Yang, V. Mendes, H. A. Pereira

09:20-09:40

System-level Reliability Enhancement of dc/dc Stage of a Single-Phase PV Inverter

Saeed Peyghami, Pooya Davari, Huai Wang, Frede Blaabjerg

09:40-10:00

Mission profile resolution impacts on the thermal stress and reliability of power devices in PV

Ariya Sangwongwanich, Dao Zhou, Elizaveta Liivik, Frede Blaabjerg

10:00-10:20

Converter monitoring in a wind turbine application

B. Rannestad, P. Nielsen, S. Munk-Nielsen, K. Gadgaard, S. Jorgensen

10:20-10:40 Coffee break

10:40-11:20

The end of gate oxide scaling (for real this time)

Barry Linder

11:20-11:40

IC security and quality improvement by protection of chip backside against hardware attacks

E. Amini, A. Beyreuther, N. Herfurth, R. Muydinov, B. Szyszka, C. Boit

11:40-12:00

Reliability concerns from the gray market

Giovanna Mura

12:00-12:20

A novel crowdsourcing platform for microelectronics counterfeit defect detection

Ahamadi, Tavousi, Favata, Shahbeigi-Roodposhti, Pelapurb, Shahbazmohamadi

11:20-11:40

Self-heating induced variability and reliability in nanosheet-FETs based SRAM

Wangyong Chen, Linlin Cai, Kunliang Wang, Xing Zhang, Xiaoyan Liu, Gang Du

11:20-11:40

Simple and Effective Open Switch Fault Diagnosis of Single-Phase PWM Rectifier

Keting Hu, Zhigang Liu, Francesco Iannuzzo, Frede Blaabjerg

11:40-12:00

Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power

Julio Brandelero, Jeffrey Ewanchuk, Nicolas Degrenne, Stefan Mollov

12:00-12:20

humidity robustness for high voltage power modules: limiting mechanisms and improvement of lifetime

Sebastian Kremp, Oliver Schilling

12:20-12:40

Investigation of Degradation Mechanisms in Low-Voltage p-Channel Power MOSFETs Under High Temperature Gate Bias

Paolo Magnone, Giacomo Barletta, Angelo Magrì

11:20-11:40

SELA: Advanced Solutions for Cross-section of visible and buried defects

Vladimir Zheleznyak

11:40-12:00

MSSCORPS: Inside of 10 nm technology node

Shih-Hsin Chang

12:00-12:20

MITSUBISHI: Recent SiC module progress and related applications

Harufusa Kondo

11:40-12:00

Statistical Nature of Hard Breakdown Recovery in High-κ Dielectric Stacks Studied using Ramp Voltage

Feng Xuan, Nagarajan Raghavan, Sen Mei, Kin Leong Pey, Hei Wong

12:00-12:20

A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate

Alberto Rodriguez Fernandez, Jordi Muñoz-Gorriz, Jordi Suñe, Enrique Miranda

12:20-13:40 Lunch

13:40-14:20

Reliability and reliability investigation of WBG power devices

Josef Lutz

13:40-14:20

NBTI and irradiation related degradation mechanisms in power VDMOS transistors

Stojadinovic et.al

14:20-14:40

Performance-reliability trade-offs in short range RF power amplifier design

S.M. Pazos, F.L. Aguirre, F. Palumbo, F. Silveira

14:40-15:00

Surge Protection Design with Surge-to-Digital Converter for Microelectronic Circuits and Systems

Wen-Chieh Chen, Ming-Dou Ker

15:00-15:20

Influence of temperature of Storage, Write and Read operations on Multiple Level Cells NAND Flash

Coutet, Marc, Dozolme, Guetard, Janvresse, Lebosse, Pastre, Clement

15:20-15:40

A Lightweight Write-Assist Scheme for Reduced RRAM Variability and Power

Hassen Aziza, Basma Hajri, Mohammad M. Mansour, Ali Chehab, Annie Perez

15:40-16:00

Experimental studies of: laminate composition, drill bit wear out, and chloride ion concentration as factors affecting CAF formation

Michal Baszynski, Przemyslaw Rydygier, Mariusz Wojcik

14:20-14:40

Towards Understanding Recovery of Hot-Carrier Induced Degradation

Maurits de Jong, Cora Salm, Jurriaan Schmitz

14:40-15:00

Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters

V. Della Marca, J. Postel-Pellerin, T. Kempf, A. Regnier, P. Chiquet, M. Bocquet

15:00-15:20

Variation-resilient quantifiable plasma process induced damage monitoring

Daniel Beckmeier, Andreas Martin

14:20-14:40

VTH subthreshold hysteresis technology and temperature dependence in commercial 4H-SiC MOSFETs

Besar Asllani, Asad Fayyaz, Alberto Castellazzi, Hervé Morel, Dominque Planson

14:40-15:00

Impact of the substrate and buffer design on the performance of GaN on Si power HEMTs

Borga, Meneghini, Stoffels, Van Hove, Zhao, Li, Decoutere, Zanoni, Meneghesso

15:00-15:20

Degradation of GaN-on-GaN vertical diodes submitted to high current stress

Fabris, Meneghini, De Santi, Hu, Li, Nomoto, Jena, Xing, Gao, Meneghesso, Zanoni

15:20-15:40

Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules

F. Stella, O. Olanrewaju, Z. Yang, A. Castellazzi, G. Pellegrino

15:40-16:00

Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs

Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli

14:20-14:40

LATTICEGEAR: Scribing and cleaving solutions in Nanofab and Research – technologies, workflows and uses

Efrat Moyal

14:40-15:00

ULTRATEC: ‘In Situ’ Preparation System

Tim Hazeldine

15:20-15:40

A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT

Vandendaele et.al

16:00-16:20 Coffee break

16:20-16:40

Voltage oscillations during surge pulses induced by self-extinguishing non-destructive second breakdown in pn-junction

Steffen Holland, Rolf Brenner

16:40-17:00

An Efficient EDAC Approach for Handling Multiple Bit Upsets in Memory Array

Roger Goerl, Paulo Villa, Letícia Poehls, Eduardo Bezerra, Fabian Vargas

16:20-16:40

Ensure an original and safe “Fail-to-Open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit

F. Boige, F. Richardeau, S. Lefebvre, J.-M. Blaquière, G. Guibaud

16:40-17:00

Operating-waveform analysis based reliability evaluation of power MOSFETs used for a leg short-circuit initial charge

Tomoyuki Mannen, Keiji Wada

17:00-17:20

Bias temperature instability and condition monitoring in SiC power MOSFETs

Jose Ortiz Gonzalez, Olayiwola Alatise

17:20-17:40

On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs

Pagnano, Longobardi, Udrea, Sun, Imam, Garg, Kim, Charles

16:20-16:40

Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated

Buffolo et.al

16:40-17:00

Current induced degradation study on state of the art DUV LEDs

Trivellin, Monti, De Santi, Buffolo, Meneghesso, Zanoni, Meneghini

17:00-17:20

Further improvements of an extended Hakki-Paoli method

Massimo Vanzi, Giovanna Mura, Martines Giovanni

17:20-17:40

Impact of dislocations on DLTS spectra and degradation of InGaN-based laser diodes

Monti, Meneghini, De Santi, Bojarska, Perlin, Meneghesso, Zanoni

17:40

Gaussian Process Regression Approach for Robust Design and Yield Enhancement of Self-Assembled

Pham Luu Trung Duong, Xuechu Xu, Qing Yang, Nagarajan Raghavan

17:40

Application of Multi-Output Gaussian Process Regression for Remaining Useful Life Prediction of Light Emitting

Pham Luu Trung Duong, Hyunseok Park, Nagarajan Raghavan

17:40

A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated

Thiago Ferreira de Paiva Leite, Laurent Fesquet, Rodrigo Possamai Bastos

17:40

Evaluation of Variability using Schmitt Trigger on Full Adders Layout

Leonardo Moraes, Alexandra Zimpeck, Cristina Meinhardt, Ricardo Reis

17:40

Impact of Different Transistor Arrangements on Gate Variability

A. Lackmann Zimpeck, C. Meinhardt, L. Artola, G. Hubert, F. Kastensmidt, R. Reis

17:40

Investigation of artificial neural network algorithm based IGBT online condition monitoring

Xiaoman Sun, Meng Huang, Yi Liu, Xiaoming Zha

17:40

In-situ transistor reliability measurements through nanoprobing

Oberon Dixon-Luinenburg, Jordan Fine

17:40

Statistical analysis of characteristic of ageing precursor of IGBT based on synthetic effect of multi-physical

Mingyao Ma, Kaiqi Chu, Mingyue Zhan, Ye Wang, Fang Liu

17:40

Design and Implementation of Reliable Flash ADC for Microwave Applications

Prathiba G, Santhi M, Ahilan A

17:40

Manufacturing process-based storage degradation modelling and reliability assessment

Xuerong Ye, Yigang Lin, Qingmin Wang, Hao Niu, Guofu Zhai

17:40

Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults

Viera, Dutertre, Flottes, Potin, Di Natale, Rouzeyre, Possamai Bastos

17:40

Corrosion reliability of lead-free solder systems used in electronics

Feng Li, Vadimas Verdingovas, Kai Dirscherl, Bálint Medgyes, Rajan Ambat

17:40

Effect of DC/AC stress on the reliability of cell capacitor in DRAM

Gang-Jun Kim, Nam-Hyun Lee, Jongkyun Kim, Jung Eun Seok, Yunsung Lee

17:40

Method to extract parameters of power law for nano-scale SiON pMOSFETs under Negative Bias Temperature

Yeohyeok Yun, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang

17:40

A New Multitime Programmable Non-volatile Memory Cell Using High Voltage NMOS

Shunqiang Xu, Hongyi Wang, Jianfei Wu, Liming Zheng, Jietao Diao

17:40

Analysis of 6T SRAM cell in sub-45nm CMOS and FinFET technologies

R. Almeida, C.M. Marques, P.F. Butzen, F.R.G. Silva, R.A.L. Reis, C. Meinhardt

17:40

Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress

Yeohyeok Yun, Ji-Hoon Seo, Donghee Son, Bongkoo Kang

17:40

Life Prediction Methodology of System-in-Package Based on Physics of Failure

Guicui Fu, Yutai Su, Wendi Guo, Bo Wan, Zhongqing Zhang, Ye Wang

17:40

Effect of OFF-State stress on Reliability of nMOSFET in SWD circuits of DRAM

J. Kim, N. Lee, G.-J. Kim, Y.-Y. Lee, J. Seok, Y. Lee

17:40

An easy-implemented confidence filter for signal processing in the complex electromagnetic

Zhen Zhang, Yaoting Xue, Ruiqing Ma, Yongheng Yang

17:40

Unified view on energy and electrical failure of the short-circuit operation of IGBTs

Baburske, Niedernostheide, Schulze, Bhojani, Kowalsky, Lutz

17:40

Investigations on immunity of interfaces between intelligent media processor and DDR3 SDRAM memory

Jianfei Wu, Wei Zhu, Binhong Li, Yafei Li, Hongyi Wang, Mengjun Wang

17:40

Conducted EMI Evolution of power SiC MOSFET in a Back Converter after Short-Circuit Aging Tests

S. Douzi, M. Kadi, H. Boulzazen, M. Tlig, J. Ben Hadj Slama

17:40

Failure mechanism of Ag nanowire-coated conductive transparent electrode for wearable devices under folding and torsional fatigue

H.Y. Kim, J.Y. Kim, Ki-Tae Yoo, Won-Jon Yang, Jai-Won Byeon

17:40

Automated Detection of Counterfeit ICs using Machine Learning

Bahar Ahmadi, Bahram Javidi, Sina Shahbazmomhamadi

17:40

A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs

G. Cardoso Medeiros, L.M. Bolzani Poehls, M. Taouil, F.L. Vargas, S. Hamdioui

17:40

A Prognostic Methodology for Power MOSFETs Under Thermal Stress Using Echo State Network and Particle

Zhongliang Li, Zhixue Zheng, Rachid Outbib

17:40

Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission

Katsuyoshi Miura, Atsuki Seko, Koji Nakamae

17:40

Detection of Failure Mechanisms in 24-40nm FinFETs with (Spectral) Photon Emission Techniques using InGaAs

Ivo Vogt, Tomonori Nakamura, Ingrid De Wolf, Christian Boit

17:40

Failure Analysis on 14nm FinFET Devices with ESD CDM Failure

Chithambaram, Tan, Zhao, Liu, Ma, Quah, Nagalingam, Pan, Mai

17:40

Cross-sectional Nanoprobing Sample Preparation on Sub-micron Device with Fast Laser Grooving

P.K. Tan, Y. Zhao, F. Rivai, B. Liu, Y. Pan, R. He, H. Tan, Z. Mai

17:40

Void detection in solder bumps with deep learning

Marc van Veenhuizen

17:40

Fault Location of a Switched Mode Power Supply based on Extended Integer-coded Dictionary Method

Xuerong Ye, Cen Chen, Guofu Zhai

17:40

Non-destructive imaging of defects in Ag-sinter die attach layers – a comparative study including X-Ray, Scanning Acoustic Microscopy and

P. Dreher, R. Schmidt, A. Vetter, J. Hepp, A. Karl, C. Brabec

17:40

Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stress

O. Chihani, L. Théolier, A. Bensoussan, J.-Y. Deletage, A. Durier, E. Woirgard

17:40

A new electro-optical transmission line measurement method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic

Dany Hachem, David Trémouilles, Frédéric Morancho, Gaëtan Toulon

17:40

Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation

Oualli et.al

17:40

Measure of High Frequency Input Impedance to Study the Instability of Power Devices in Short Circuit

A. Carmine, G. Busatto, A. Sanseverino, D. Tedesco, F. Velardi

17:40

Investigation of Acoustic Emission as a Non-invasive Method for Detection of Power Semiconductor

Ole Kristensen, Pooya Davari, Francesco Iannuzzo

17:40

Analysis of indentation measured mechanical properties on Multilayer Ceramic Capacitors (MLCCs)

Nga Man Jennifa Li, Subramani Manoharan, Diganta Das, Patrick McCluskey

17:40

An Analytical Circuit based Nonlinear Thermal Model for Capacitor Banks

Haoran Wang, Huai Wang

17:40

Reliability evaluation of IGCT from accelerated testing, quality monitoring and field return

Thomas Stiasny, Olivier Quittard, Ch. Waltisberg, Urban Meier

17:40

Comparison of temperature sensitive electrical parameter based methods for junction temperature determination during accelerated ageing of power

F. Wuest, S. Trampert, S. Janzen, S. Straube, M. Schneider-Ramelow

17:40

Degradation estimation using feature increment stepwise linear regression for PWM Inverter of Electro-Mechanical

Y. Peng, Y.J. Zhang, D.T. Liu, L.S. Liu

17:40

A Multi-Port Thermal Coupling Model for Multi-Chip Power Modules Suitable for Circuit Simulators

Zhongxu Wang, Huai Wang, Yi Zhang, Frede Blaabjerg

17:40

Online Condition Monitoring of IGBT Modules Using Voltage Change Rate Identification

Mohamed Halick Mohamed Sathik, Sundararajan Prasanth, Firman Sasongko, Josep Pou

17:40

Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena

Masanori Tsukuda, Seiya Abe, Kazunori Hasegawa, Tamotsu Ninomiya, Ichiro Omura

17:40

A fully digital feedback control of gate driver for current balancing of parallel connected power

Ravi Nath Tripathi, Masanori Tsukuda, Ichiro Omura

17:40

Envelop Tracking Based Embedded Current Measurement for Monitoring of IGBT and Power Converter

B.-O. Bat-Ochir, B. Bayarkhuu, K. Hasegawa, M. Tsukuda, B. Dugarjav, I. Omura

17:40

Mutual and self-aging effects of power semiconductors on the thermal behaviour of DC-DC boost power

Vahid Samavatian, Yvan Avenas, Hossein Iman-Eini

17:40

Avalanche ruggedness of parallel SiC power MOSFETs

Asad Fayyaz, Besar Asllani, Alberto Castellazzi, Michele Riccio, Andrea Irace

17:40

Failure Analysis of 650V Enhancement Mode GaN HEMT after Short Circuit Tests

A. Carmine, G. Busatto, A. Sanseverino, D. Tedesco, F. Velardi

17:40

Effect of power cycling tests on traps under the gate of Al2O3/AlGaN/GaN normally-ON devices

Malika Elharizi, Fadi Zaki, Ali Ibrahim, Zoubir Khatir, Jean-Pierre Ousten

17:40

Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power

He Du, Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli

17:40

Effect of short circuit aging on safe operating area of SiC MOSFET

Tien Anh Nguyen, Stéphane Lefebvre, Stéphane Azzopardi

17:40

Study of forward AC stress degradation of GaN-on-Si Schottky diodes

Lorin, Vandendaele, Gwoziecki, Gillot, Biscarrat, Ghibaudo, Gaillard

17:40

Evolution of C-V and I-V characteristics for a commercial 600V GaN GIT power device unde repetitive short-circui

Jian Zhi Fu, François Fouquet, Moncef Kadi, Pascal Dherbecourt

17:40

Investigating SiC MOSFET body diode’s light emission as Temperature-Sensitive Electrical Parameter

Lorenzo Ceccarelli, Haoze Luo, Francesco Iannuzzo

17:40

Measurement and Analysis SiC-MOSFET threshold voltage shift

Quentin Molin, Mehdi Kanoun, Christophe Raynaud, Hervé Morel

17:40

The synergetic effects of high temperature gate bias and total ionization dose on 1.2kV SiC devices

Teng Zhang, Bruno Allard, Jinshun Bi

17:40

Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body

O. Avino-Salvado, H. Morel, C. Buttay, D. Labrousse, S. Lefebvre

17:40

Comparison of Experimental, Analytical and Simulation Methods to Estimate Substrate Material Properties for Warpage Reliability

Cheryl Selvanayagam, Rathin Mandal, Nagarajan Raghavan

17:40

Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature

Ui-Min Choi, Soren Jorgensen, Francesco Iannuzzo, Frede Blaabjerg

17:40

An empirical model for thermal interface materials based on experimental characterizations under realistic

Yi Zhang, Huai Wang, Zhongxu Wang, Frede Blaabjerg

17:40

GaN transistors efficient cooling by graphene foam

Mattia Antonini, Paolo Cova, Nicola Delmonte, Alberto Castellazzi

17:40

Development of thermal shock-resistant of GaN/DBC die-attached module by using Ag sinter paste and thermal stress relaxation

D. Kim, C. Chen, A. Suetake, C. Choe, T. Sugahara, S. Nagao, K. Suganuma

17:40

Water cold plates for high power converters: a software tool for easy optimized design

P. Cova, N. Delmonte, D. Chiozzi, M. Portesine, F. Vaccaro, E. Mantegazza

17:40

Reliability investigation of large area solder joints in power electronics modules and its simulative

A.J. George, J. Zipprich, M. Breitenbach, M. Klingler, M. Nowottnick

17:40

Shear properties of In-Bi alloy joints with Cu substrates during thermal aging

Sanghun Jin, Min-Su Kim, Shutetsu Kanayama, Hiroshi Nishikawa

17:40

Sequential Combined thermal Cycling and Vibration Test and Simulation of Printed Circuit Board

Faical Arabi, Alexandrine Gracia, Jean-Yves Deletage, Helene Fremont

17:40

Low temperature transient liquid phase bonded Cu-Sn-Mo and Cu-Sn-Ag-Mo interconnects – a novel approach for hybrid metal

M. Brincker, P.K. Kristensen, S. Söhl, R. Eisele, V.N. Popok

17:40

Study on power cycling test with different control strategies

Guang Zeng, Felix Wenisch-Kober, Josef Lutz

17:40

Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film

Hee Pyung Park, Sang Woo Kim, Joong Woon Shin, Won Ju Cho, Jong Tae Park

17:40

Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP

Buonomo, Torto, Barbato, Wrachien, Rizzo, Gevorgyan, Krebs, Cester

17:40

Effects of stair-case Gate bias stress in IGZO/Al2O3 flexible TFTs

Marco Buonomo, Nicola Wrachien, Nicolò Lago, Giuseppe Cantarella, Andrea Cester

17:40

Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress

Renso, Buffolo, De Santi, Ronzani, Meneghesso, Zanoni, Meneghini

17:40

Analysis of Semiconductor Fault using DS (Damped Sinusoidal) HPEM Injection

Dongshin Kim, Ju-Hwan Choi, Nochang Park, Sung-Il Chan, Yongchae Jeong

17:40

Experimental and simulation study of the correlation between displacement damage and incident proton energy for GaAs

Qingkui Yu, Yi Sun, Zheng Li, Bo Mei, Xiaolaing Li, He Lv, Pengwei Li, Min Tang

17:40

Radiation robustness of normally-off GaN/HEMT power transistors (COTS)

Moustafa Zerarka, Oliver Crepel

17:40

The total ionizing dose response of Leading-edge FDSOI NMOSFET

Wang, Li, Huang, Zhao, Yu, Zheng, Guo, Xu, Gao, Cai, Cui

17:40

Charge and energy deposition in thick silicon depletion layers by environmental ionizing radiation and terrestrial cosmic

Ying Pang, Mauro Ciappa

17:40

Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment

Li, Huang, Wu, Huang, Li, Zhang, Yang, Wan, Luo, Han, Yin

17:40

Process variation dependence of total ionizing dose effects in bulk nFinFETs

Li, Huang, Yang, Zhang, Zheng, Li, Zhu, Bu, Yin, Luo, Han, Wang

17:40

Impact of elevated temperature applied during low dose rate irradiation on the degradation of BiCMOS operational

A.S. Petrov, K.I. Tapero, V.N. Ulimov, A.M. Chlenov

17:40

TCAD simulation of radiation-induced leakage current in 1T1C SDRAM

Nguyen, Rodriguez, Wrobel, Michez, Bezerra, Chatry, Vandevelde

17:40

Single-Event Transient Effects on Dynamic Comparator in 28nm FDSOI CMOS Technology

Nilson Maciel, Elaine Crespo Marques, Lirida Naviner, Hao Cai

17:40

Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring

Chihiro Kawahara, Yukihiko Wada, Shinichi Kinouchi, Hiroshi Kobayashi

17:40

Photovoltaic plant maintainability optimization and degradation detection: modelling and

Paolo Cova, Nicola Delmonte, Massimo Lazzaroni

17:40

The effect of solar cell internal resistance change on the bus voltage ripple in spacecraft power

Jianhua Qin, Li Wang, S.S. Yang, Rui Huang

17:40

Lifetime Evaluation of a Multifunctional PV Single-Phase Inverter during Harmonic Current

Rodrigo Barros, Erick Brito, Allan Cupertino, Victor Mendes, Heverton A. Pereira

17:40

Lifetime estimation of modular cascaded H-bridge MLPVI for grid-connected PV systems considering mission

Ranjith Kumar Gatla, Wei Chen, Guorong Zhu, Dingjun Zeng, Ramchander Nirudi

17:40

Life consumption of a MMC-STATCOM Supporting Wind Power Plants: Impact of the Modulation Strategies

Renata Sousa, João Victor Farias, Allan Cupertino, Heverton Pereira

17:40

Direct power control of three-level NPC grid-connected system combined with fault-tolerant

G. Yang, C. Fu, H. Yi, C. Chai, B. Huang, S. Hao, Z. Chen

17:40

Reliability Assessment of Power Conditioner Considering Maintenance in a PEM Fuel Cell System

Sajjad Bahrebar, Dao Zhou, Sima Rastayesh, Frede Blaabjerg, H. Wang

17:40

A Novel Method of Reliability-Centered Process Optimization for Additive Manufacturing

Z. Ye, J. Zhu, Q. Li, B. Mo, B. Lei, Y. Li, C. Wang, C. Huang

17:40

Influence of the pulse length and temperature swing on the relative lifetime estimation for sintered/soldered chip-on-substrate samples via FE-simulation of power

Flaviu-Bogdan Simon, Sebastian Amadeus Letz, Andreas Schletz

17:40

Effect of solder material thickness on Power MOSFET reliability by Electro-Thermo-Mechanical

Daniela Cavallaro, Rosario Greco, Gaetano Bazzano

17:40

Lifetime prediction of a modified Y-source inverter in photo-voltaic application

Hongpeng Liu, Wentao Wu, Panbao Wang, Hui Wu, Wei Wang

17:40

Creep measurement and choice of creep laws for BGA assemblies' reliability simulation

Samuel Pin, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont

17:40

Reliability model of bond wire fatigue for IGBT in MMC with system redundancy consideration

Tao Zheng, Meng Huang, Yi Liu, Xiaoming Zha

17:40

Transient junction temperature estimation of IGBT using improved thermal model

Jingge Hu, Meng Huang, Yi Liu, Xiaoming Zha

17:40

Reliability design of battery management system for power battery

G. Xu, X. Du, Z. Li, X. Zhang, M. Zheng, Y. Miao, Y. Gao, Q. Liu

17:40

RCD snubber design based on reliability consideration: A case study for thermal balancing in power electronic

Ramin Parvari, Mostafa Zarghani, Shahriyar Kaboli

17:40

An Extensible Stability Analysis Method in Time Domain for Cascaded DC-DC Converters in Electrical

Hong Li, Zhongya Guo, Chen Liu, Trillion Q. Zheng

17:40

Reliability of rail transit traction drive system—a review

Shuai Lin, Xiaochun Fang, Fei Lin, Zhongping Yang, Xiaofan Wang

17:40

A Novel Fault-tolerant Control for Battery-Energy-Storage System Based on Cascade Multilevel Converter with Battery/BMS

Zhao Liu, Shuai Wang, Zhendong Ji, Xiaopeng Ji, Yunyun Xie

17:40

Implementation of Direct Chip Junction Temperature Measurement in High Power IGBT Module in Operation - Railway Traction

Michel Piton, Bertrand Chauchat, Jean-François Serviere

17:40

Reliable N Sleep Shuffled Phase Damping Design for Ground Bouncing Noise Mitigation

B. Sivasankari, A. Ahilan, R. Jotin, A. Jasmine Gnana Malar

17:40

On-line Fault Diagnosis Model for Locomotive Traction Inverter Based on Wavelet transform and Support Vector

Mei Fei, Miao Huiyu, Pan Yi, Sha Haoyuan, Liu Ning, Zheng Jianyong

17:40

A PCH Strong Tracking Control Strategy for Power Coordinated Allocation of Li-SC HESS

Tiezhou Wu, Zhihao Cheng, Jiasheng Zhang, Zhangqing He

17:40

Influence Factors Analysis of Rail Potential in Urban Rail Transit

Jingda Gu, Xiaofeng Yang, Trillion Q. Zheng

17:40

A Reliable Speed Controller for Suppressing Low Frequency Concussion of Electric Vehicle

Dan Zhang, Jianguo Jiang

20:00-22:00 Young Professional Reception