Program for Thursday, October 4th: Session View

ESREF 2018: 29TH EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS

PROGRAM AUTHORS KEYWORDS

PROGRAM FOR THURSDAY, OCTOBER 4TH: SESSION VIEW

Days:

View: with abstracts talk overview

9:00

9:30

10:00

10:30

11:00

11:30

12:00

12:30

13:00

13:30

14:00

14:30

15:00

15:30

16:00

16:30

17:00

17:30

08:40-10:20

Defect Detection Using Microscopy and Probing Techniques

08:40-10:20

MEMS, Sensors and Organic Electronics reliability

08:40-10:20

Radiation Effects in Advanced Devices

08:40-10:20

ECPE Workshop:Frontiers in Reliability Engineering: Railway Traction, Renewables, Industry

10:00-10:20

10:40-12:00

Manufacturing Weaknesses Leading to Failure

10:40-12:20

Reliability and Qualification of Microwave GaN Technologies

10:40-12:20

Analysis and Mitigation of Radiation Effects in Complex Chips

10:40-12:20

Workshop: Condition and Health Monitoring

12:20-13:00

Conference closing

13:00-17:30

APETT Symposium

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