EPEPS 2024: 33RD IEEE CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS
PROGRAM FOR WEDNESDAY, OCTOBER 9TH
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08:00-09:00Breakfast
09:00-10:00 Session 22: Invited Talk
Chair:
Xu Chen (University of Illinois at Urbana-Champaign, United States)
Location: W280
09:00
Zheng Zhang (University of California Santa Barbara, United States)
Machine Learning for EDA, or EDA for Machine Learning?

ABSTRACT. The rapid advancement of machine learning (especially deep learning) in the past decade has impacted, both positively and negatively, many research fields. Driven by the great success of machine learning in image and speech domains, there have been increasing interests in “Machine Learning for EDA”. In the first part of the talk, I will explain the main challenge of data sparsity when applying existing machine learning techniques to EDA. Then I will show how some data-efficient scientific machine learning techniques, specifically uncertainty quantification and physics-constraint operator learning, can be utilized to build high-fidelity surrogate models for variability analysis and for 3D-IC thermal analysis, respectively. These techniques can greatly reduce the number of required device/circuit simulation data samples.

Another important but highly ignored direction is “EDA for Machine Learning”. The five decades of EDA research has produced a huge body of solid theory and efficient algorithms for analyzing, modeling and optimizing complex electronic systems. Many of the white-box EDA ideas may be leveraged to solve black-box AI problems. In the second part of the talk, I will show how the self-healing idea and compact modeling idea from EDA can be utilized to improve the trustworthiness and sustainability of deep learning models (including large-language models).

10:00-11:00 Session 23: Machine Learning II
Chairs:
Paolo Manfredi (Politecnico di Torino, Italy)
Zheng Zhang (University of California, Santa Barbara, United States)
Location: W280
10:00
Felix Yuan (Intel Corporation, Canada)
Abinash Roy (Intel Corporation, United States)
Reinforcement Learning Based Automatic Router for Power Delivery Network Prototypes

ABSTRACT. Reinforcement learning (RL) is applied to an automated power delivery network design process. Initially, a prototype board is created with multiple power rails. Using two RL agents, each power rail is routed from the voltage regulator to the integrated circuit (IC) pins. Secondly, the metal width of each rail is expanded to decrease the resistance and inductance of the rail.

10:20
Ahsan Javaid (Carleton University, Canada)
Ramachandra Achar (Carleton University, Canada)
Jai Tripathi (Indian Institute of Technology Jodhpur, India)
An Efficient Machine Learning Approach for PSIJ Analysis in a Chain of CMOS Inverters

ABSTRACT. In this paper, an efficient machine learning approach based on the knowledge-based and recurrent neural networks to predict power supply induced jitter in the presence of multiple power supply noises is presented. The proposed approach provides a reasonable accuracy and a significant increase in speed compared to conventional approaches.

10:40
Anuj Mathur (Carleton University, Canada)
Ramachandra Achar (Carleton University, Canada)
Hand-drawn Circuit Schematic Digitization and Netlisting using Machine Learning with Emphasis on Signal Integrity Applications

ABSTRACT. There is an emerging keen interest in the design and academic communities to automatically generate a simulatable netlist from hand-written schematics. This paper presents a novel machine learning-based circuit digitization and netlisting methodology.

11:00-11:10 Session 24: Sponsor Demo: Keysight
Chairs:
Paolo Manfredi (Politecnico di Torino, Italy)
Zheng Zhang (University of California, Santa Barbara, United States)
Location: W280
11:10-11:30Coffee Break
11:30-12:10 Session 25A: Optics
Chairs:
Andreas Weisshaar (Oregon State University, United States)
Xuan Chen (AMD, Canada)
Location: W280
11:30
Festim Iseini (IHP GmbH – Leibniz Institute for High Performance Microelectronics, Germany)
Han-Ting Lin (School of Electrical Engineering and Computer Science, Oregon State University, United States)
Nicola Pelagalli (IHP GmbH – Leibniz Institute for High Performance Microelectronics, Germany)
Andrea Malignaggi (IHP GmbH – Leibniz Institute for High Performance Microelectronics, Germany)
Corrado Carta (IHP GmbH – Leibniz Institute for High Performance Microelectronics, Germany)
Gerhard Kahmen (IHP GmbH – Leibniz Institute for High Performance Microelectronics, Germany)
Andreas Weisshaar (School of Electrical Engineering and Computer Science, Oregon State University, United States)
A Tunable Inductor Peaking Technique for Optical Communication Systems

ABSTRACT. A tunable inductor peaking technique for loss compensation in optical communication systems is presented. The proposed technique is based on creating a tunable damped resonator with a fixed peaking inductor and a high-frequency transistor with low intrinsic capacitance. The tuning technique is first demonstrated with a generic equivalent circuit model and then implemented and evaluated using the high-speed bipolar transistor in 130 nm IHP SG13G2 BiCMOS technology, featuring ft/fmax of 350 / 450 GHz. Our proposed technique has been simulated in a real case scenario demonstrating the effectiveness of the tunable inductor peaking technique for loss compensation in optical communication systems.

11:50
Jongchul Shin (Samsung Semiconductor Inc., United States)
Hamid Eslampour (Samsung Semiconductor Inc., United States)
Sangnam Jeong (Samsung Semiconductor Inc., United States)
Woopoung Kim (Samsung Semiconductor Inc., United States)
Seokbeom Yong (Samsung Electronics Co., Ltd., South Korea)
Sung-Oh Ahn (Samsung Electronics Co., Ltd., South Korea)
Eunkyeong Park (Samsung Electronics Co., Ltd., South Korea)
Sangsub Song (Samsung Electronics Co., Ltd., South Korea)
Signal Integrity of Die-to-Die Interface with Advanced Packages for Co-Packaged Optics

ABSTRACT. To meet the high demands in Artificial Intelligence (AI) and Machine Learning (ML) applications, the conventional electrical interconnect has limitations on bandwidth, latency, and power consumptions. Co-Packaged Optics (CPO), and advanced heterogenous integration of optics and silicon on a single package, has attracted much attention to achieve higher bandwidth and power efficiency. Samsung has dedicated to develop advanced packaging technologies, such as 2.5D I-CubeS with a silicon interposer, 2.3D I-CubeE with an embedded silicon-bridge and organic redistribution layer (RDL), 2.3D I-CubeR with an organic RDL, and 3D X-Cube with a fine bump pitch Thermo-compression Bonding (TCB) and hybrid Cu bonding. Using I-CubeS or I-CubeE technologies, the feasible CPO architecture can be built by optoelectronic engine arrangement, stacking of photonic integrated circuit (PIC) and electronic integrated circuit (EIC), and PIC coupling type. This paper presents the signal integrity of die-to-die (D2D) interface for the logic of XPU to the logic of EIC. The signal integrity under simplified I/O models for a transmitter and receiver, W-element interconnect of Si-bridge, and through-silicon via (TSV) in the PIC was compared and verified from Universal Chiplet Interconnect express (UCIe) specification.

11:30-12:10 Session 25B: Keysight Training Program
Chair:
Heidi Barnes (Keysight Technologies, United States)
Location: W240
11:30
Heidi Barnes (Keysight, United States)
Digital Twin PI Simulations for 2000 Amp AI, Cloud Compute, and Multi-Die Packages

ABSTRACT. Delivering thousands of amps to the next generation of high-speed digital designs is fast becoming the biggest design challenge for the next generation of custom multi-die packages, AI Chips, and cloud server applications. End-to-end power integrity digital twins with multiphase voltage regulators, PCB PDN with 100’s of capacitors, and dynamic loads are critical for mitigating expensive hardware failures when working with thousands of amps. This presentation will explore the model fidelity trade-offs and lessons learned from simulating the Picotest 2000 Amp Transient Load Stepper demo board with a 55-phase MPS horizontal power delivery topology and over 700 decoupling capacitors.

The digital twin PI simulations will be demonstrated using Keysight Power Integrity designer tools. Keysight EDA Power Integrity designer tools in the ADS environment bring together a full workflow to solve the challenge of designing for high current low voltage power delivery. The solution includes DC IR Drop with electrothermal, AC EM with Decap optimization, and Conducted EMI with dynamic DC/DC regulator switching models. The solution is well integrated with multiple time domain and frequency domain solvers including Harmonic Balance (HB) for fast steady-state solutions and spectral data. HB works with the latest in state-space behavioral models for cascaded and parallel voltage regulators. Traditional frequency domain analysis with target impedance also includes the Non-Invasive Stability Margin for assessing phase margin to mitigate resonances by designing for low Q flat impedance.

12:10-12:50 Session 26: Computer Aided Design
Chairs:
Ram Achar (Carleton University, Canada)
Tommaso Bradde (Politecnico di Torino, Italy)
Location: W280
12:10
Alexander Kirchberger (Western University, Canada)
Anestis Dounavis (Western University, Canada)
Delay Rational Macromodelling of Noisy Tabulated Frequency Responses

ABSTRACT. This paper presents a scheme to fit delay rational macromodels of electrically long electric networks from noisy frequency domain tabulated data. Delay regions of the tabulated data are estimated by evaluating the energy of the frequency responses over time. Then, the frequency responses of each delay term are obtained as a rational approximation using a vector fitting-instrumental variable technique. The combination of rational approximations of each delay region provides a delay rational macromodel for the entire network.

12:30
Hyunwoo Kim (Korea Advanced Institute of Science and Technology (KAIST), South Korea)
Dongryul Park (Korea Advanced Institute of Science and Technology (KAIST), South Korea)
Seunghun Ryu (Korea Advanced Institute of Science and Technology (KAIST), South Korea)
Seonghi Lee (Korea Advanced Institute of Science and Technology (KAIST), South Korea)
Sanguk Lee (Korea Advanced Institute of Science and Technology (KAIST), South Korea)
Jinwook Lee (Korea Advanced Institute of Science and Technology (KAIST), South Korea)
Dongkyun Kim (Korea Advanced Institute of Science and Technology (KAIST), South Korea)
Seungyoung Ahn (Korea Advanced Institute of Science and Technology (KAIST), South Korea)
An Efficient SPICE-compatible Model for Fast Co-simulation of Signal and Power Integrity on Multilayer PCB with Arbitrary Shape

ABSTRACT. This paper presents the SPICE-compatible model to efficiently simulate and analyze the multilayer PCBs with arbitrarily shaped plates, signal/power/ground vias, and multicoupled traces. This model is compared and evaluated using full-wave simulation. The results demonstrate that the proposed model significantly reduces computational time while maintaining high accuracy for complex PCB designs, achieving high efficiency.

12:50-14:20Lunch
14:20-15:00 Session 27: Signal and Power Integrity II
Chairs:
Tawfik Rahal-Arabi (AMD, United States)
Heidi Barnes (Keysight Technologies, United States)
Location: W280
14:20
Chad Smutzer (Mayo Clinic, United States)
Jordan Keuseman (Mayo Clinic, United States)
Alexander Hickman (Mayo Clinic, United States)
Clifton Haider (Mayo Clinic, United States)
Application of the Reverse Pulse Technique for Worst Case Transient Analysis in HPC PDN Design

ABSTRACT. The reverse pulse technique (RPT) predicts peak voltage deviation in the presence of worst case transient (WCT) load current. While RPT has been vetted through simulation, this paper addresses the practical application in lab hardware.

14:40
Tawfik Rahal-Arabi (AMD, United States)
Paul Van der Arend (AMD, China)
Ashish Jain (AMD, United States)
Mehdi Saidi (AMD, United States)
Rashad Oreifej (AMD, United States)
Sriram Sundaram (AMD, United States)
Rajit Seahra (AMD, United States)
Optimizing Power and Power Delivery For Data Center GPUs

ABSTRACT. GPUs are used in products from ultra-low power mobile devices to high performance machine learning accelerators in data centers. Across the products, power and power delivery have become top limiters to performance and are key considerations in the early stages of product definition and design. In particular, the power and power delivery problem has been significantly exacerbated with the recent trends in the growth of AI workloads. In this paper, we present some of the data centers driven power optimizations used in latest generation of AMD GPUs including the recently announced AMD Instinct™ MI300 GPU. To this end, we cover power and power delivery optimization techniques spanning the product life cycle from architecture, physical design, validation, test, and manufacturing with an eye on the challenges in the road ahead

15:00-15:20 Session 28: Closing Ceremony
Chair:
Piero Triverio (University of Toronto, Canada)
Location: W280