Program

PROGRAM

Days: Tuesday, November 10th Wednesday, November 11th Thursday, November 12th Friday, November 13th

Tuesday, November 10th

View this program: with abstracts session overview talk overview

09:30-10:30 Session 1

Welcome and Keynote I

Chair:

Kieran O’leary

Location: Presidents Suite (Presentation room)

09:30	Kieran O'Leary Welcome to EMC Compo 2015 ( abstract )
09:45	Bob Scully Maxwell’s Legacy – The Heart and Soul of the EMC Discipline ( abstract )

10:30-11:00Coffee Break

11:00-12:30 Session 2

Design for EMC I

Chairs:

Mart Coenen and Frank Klotz

Location: Presidents Suite (Presentation room)

11:00	Bernd Deutschmann, Gunter Winkler and Timucin Karaca Emission Reduction in Class-D Audio Amplifiers by Optimizing Spread Spectrum Modulation ( abstract )
11:22	Tvrtko Mandic, Raul Blecic, Renaud Gillon and Adrijan Baric DC/DC Converter Dead-Time Variation Analysis and Far-Field Radiation Estimation ( abstract )
11:44	Matthieu Deloge, Arnoud van der Wel, Shishir Goyal, Gerald Kwakernaat and Adrien Schoof A Highly-Digitized Automotive CAN Transceiver in 0.14μm High-Voltage SOI CMOS ( abstract )
12:06	Alexis Schindler, Bernhard Wicht and Benno Koeppl EMC and Switching Loss Improvement for Fast Switching Power Stages by di/dt, dv/dt Optimization with 10ns Variable Current Source Gate Driver ( abstract )

12:30-13:30Lunch Break

13:30-15:00 Session 3

Measurement techniques I

Chairs:

Renaud Gillon and Hugo Pues

Location: Presidents Suite (Presentation room)

13:30	Mohamed Amellal, Sjoerd Op'T Land, Richard Perdriau, Mohamed Ramdani, Ali Ahaitouf and Mhamed Drissi Direct power injection on functional and non-functional signals of SPI EEPROM memories ( abstract )
13:52	Jeremy Raoult, Pierre Payet, Rachid Omarouayache and Laurent Chusseau Electromagnetic Coupling Circuit Model of a Magnetic Near-Field Probe to a Microstrip Line ( abstract )
14:14	Veljko Tomasevic, Alexandre Boyer and Sonia Ben Dhia Bandgap Failure Study Due To Parasitic Bipolar Substrate Coupling In Smart Power Mixed ICs ( abstract )
14:36	Megumi Saito, Yuichi Hayashi, Takaaki Mizuki and Hideaki Sone Fundamental Study on Randomized Processing in Cryptographic IC Using Variable Clock Against Correlation Power Analysis ( abstract )

15:00-15:30Coffee Break

15:30-17:30 Session 4

Design for EMC II (poster)

Chairs:

Alistair Duffy and Jan Niehof

Location: Presidents Suite (Poster area)

15:30	Johannes Janschitz An EMI robust LIN Driver with low Electromagnetic Emission ( abstract )
15:30	Kamel Abouda, Guillaume Aulagnier, Marc Cousineau and Eric Rolland Analytical Aproach to study Electromagnetic Emission EME Contributors on DC/DC applications Introducing of multiphase Buck converters in automotive analog designs to reduce EME ( abstract )
15:30	Andrea Lavarda and Bernd Deutschmann EMI Improved Chopped Operational Amplifier ( abstract )
15:30	Sergei Kapora, Marcel Hanssen, Jan Niehof and Quino Sandifort Methodology for interference analysis during early design stages of high-performance mixed-signal ICs ( abstract )
15:30	Fabian Vargas, Letícia Bolzani Poehls and Christofer de Oliveira On-Chip Watchdog to Monitor RTOS Activity in MPSoC Exposed to Noisy Environment ( abstract )
15:30	Yann Bacher, Nicolas Froidevaux, Henri Braquet and Gilles Jacquemod Resonance Analysis for EMC Improvement in Integrated Circuits ( abstract )
15:30	Andy Degraeve, Davy Pissoort and Keith Armstrong Improving the Shielding Effectiveness of a Board-Level Shield by Bonding it with the Waveguide-Below-Cutoff Principle ( abstract )
15:30	Mart Coenen, Ming Ye and Huichun Yu Dynamic Multi-Parameter Response Model for SEED Analysis ( abstract )
15:30	Andreas Rauchenecker and Timm Ostermann Examination of different adder structures concerning di/dt in a 180nm technology ( abstract )
15:30	Mario Rotigni, Mauro Merlo, Martina Cordoni, Paolo Colombo and Valentino Liberali Role of IC Substrate and ESD Protections in Noise Propagation: Design and Modelling of Dedicated Test Chip in 40 nm Technology ( abstract )
15:30	Park Sanghyeok, Huynh Hai Au and Kim Soyoung Analysis of EMI Reduction Methods of DC-DC Buck Converter ( abstract )
15:30	Boyuan Zhu, Junwei Lu, Mengcheng Zhu and Mei Jiang Arbitrary Shape Multilayer Interconnects EMC Modelling and Optimization ( abstract )

18:00-20:00 Session

Welcome event

Wednesday, November 11th

View this program: with abstracts session overview talk overview

09:30-10:30 Session 5

Keynote II

Chair:

John Dawson

Location: Presidents Suite (Presentation room)

09:30

Nick Wainwright

The Evolution of Commercial EMC Standards ( abstract )

10:30-11:00Coffee Break

11:00-12:30 Session 6

Immunity I

Chairs:

Bernd Deutschmann and Mohamed Ramdani

Location: Presidents Suite (Presentation room)

11:00	Adrien Doridant, Jean-Jacques Laurin, Jérémy Raoult, Sylvie Jarrix and Patrick Hoffmann Preliminary Study of Automatic Control Gain Loop Subjected to Pulse-modulated Radiofrequency Interference ( abstract )
11:22	Philipp Schröter, Fabio Ballarin and Franco Fiori Susceptibility to EMI of High Side Current Sensors based on Chopper OpAmps ( abstract )
11:44	Philipp Schröter, Marco Pamato and Frank Klotz RF Immunity Investigations of Linear DC Current Regulators ( abstract )
12:06	Thomas Ungru, Wolfgang Wilkening, Steffen Walker and Renato Negra Functional analysis of an integrated communication interface during ESD ( abstract )

12:30-13:30Lunch Break

13:30-15:00 Session CST1

CST Workshop

Location: 1925 suite

13:30

Arnab Bhattacharya

Signal/Power Integrity and EMC simulations of chip/package/board (Part I) ( abstract )

13:30-15:00 Session 7

Immunity II

Chairs:

Franco Fiori and Soyoung Kim

Location: Presidents Suite (Presentation room)

13:30	Bertrand Vrignon, Adrien Doridant, Kamel Abouda, Yuan Gao, Didier Pagnoux and Tomas Marek Near-Field Injection on a Safe System Basis Chip at Silicon Level ( abstract )
13:52	Sergey Miropolsky, Stefan Jahn, Frank Klotz and Stephan Frei Experimental Validation of the Generalized Accurate Modelling Method for System-Level Bulk Current Injection Setups up to 1 GHz ( abstract )
14:14	Hidetoshi Miyahara, Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado and Osami Wada Relation between Internal Terminal Voltage and Immunity Behavior of LDO Regulator Circuits ( abstract )
14:36	Jongtae Hwang, Youngbong Han, Hyunho Park, Wansoo Nah and Soyoung Kim Radiated Electromagnetic Immunity Analysis of VCO Using IC Stripline Method ( abstract )

15:00-15:30Coffee Break

15:30-17:00 Session D1

Demonstrations

Location: Presidents Suite (Presentation room)

15:30

Etienne Sicard

EMC modeling of Integrated Circuits using IC-EMC ( abstract )

15:30-17:00 Session CST2

CST Workshop

Location: 1925 suite

15:30

Arnab Bhattacharya

Signal/Power Integrity and EMC simulations of chip/package/board (Part II) ( abstract )

15:30-17:30 Session 8

EMC I (poster)

Chairs:

John Dawson and Davy Pissoort

Location: Presidents Suite (Poster area)

15:30	Satoshi Tanaka, Peng Fan, Jingyan Ma, Hanae Aoki, Masahiro Yamaguchi, Sho Muroga and Makoto Nagata Analysis of On-Chip Digital Noise Coupling Path for Wireless Communication IC Test Chip ( abstract )
15:30	Jonghoon J. Kim, Daniel H. Jung, Heegon Kim, Sunkyu Kong, Sumin Choi, Jaemin Lim and Joungho Kim TSV-based Current Probing Structure using Magnetic Coupling in 2.5D and 3D IC ( abstract )
15:30	Burak Baran, Wim Dehaene, Hugo Pues and Kristof Stijnen Case Study on the Differences between EMI Resilience of Analog ICs against Continuous Wave, Modulated and Transient Disturbances ( abstract )
15:30	Manuel Kaufmann and Timm Ostermann Simulation model based on JEDEC JS-001-2014 for circuit simulation of HBM ESD pulses on IC level ( abstract )
15:30	Andrea Lavarda, Bernd Deutschmann, Dominik Amschl and Susanne Bauer Characterization of the Immunity of Integrated Circuits (ICs) at Wafer Level ( abstract )
15:30	Jean-Marc Dienot, Emmanuel Batista and Ioav Ramos Thermal-electromagnetic susceptibility behaviors of PWM patterns used in control electronic circuit ( abstract )
15:30	Priscila Fernandez-Lopez, Meriem Amara, Thi Quynh Van Hoang and Frederic Lafon DPI set-up for ICs with differential inputs ( abstract )
15:30	Boyuan Zhu, Junwei Lu, Ling Sun and Haiyan Sun Computational Electromagnetics in Shielding Analysis of System in Package ( abstract )
15:30	Shih-Yi Yuan, Ting-Wei Yeh, Chiu-Kuo Chen and Yung-Chi Tang Time-domain EMI Measurement Methodology ( abstract )
15:30	Hyun Ho Park, Dong Gun Kam, Yong Bae Park, Jiseong Kim, Jae-Deok Lim, Hark-Byeong Park and Eakhwan Song RF Interference Evaluation of Flexible Flat Cables for High-Speed Data Transmission in Mobile Devices ( abstract )
15:30	Alexandre Boyer and Manuel Cavarroc Enhancement of the Spatial Resolution of Near-Field Immunity Maps ( abstract )
15:30	Ahmed Aldabbagh and Alistair Duffy Ageing effects on power RF LDMOS reliability using the Transmission Line Matrix method ( abstract )
15:30	Lars Glaesser and Sven Koenig ESD test at component level ( abstract )

19:00-22:00 Session

Visits to James Clerk Maxwell's house

Thursday, November 12th

View this program: with abstracts session overview talk overview

09:30-10:30 Session 9

Keynote III

Chair:

Alistair Duffy

Location: Presidents Suite (Presentation room)

09:30

Etienne Sicard

Future needs in EMC of ICs - Are you hearing the voice of industry ? ( abstract )

10:30-11:00Coffee Break

11:00-12:30 Session 10

Modelling I

Chairs:

Adrijan Baric and Jack Kruppa

Location: Presidents Suite (Presentation room)

11:00	Raul Blecic, Renaud Gillon, Bart Nauwelaers and Adrijan Baric Radiation Characteristics of Small Loop Antenna above Perforated Finite Image Plane ( abstract )
11:22	Herbert Hackl, Gunter Winkler and Bernd Deutschmann Simulation of Radiated Emission during the Design Phase based on Scattering Parameter Measurement ( abstract )
11:44	Clovis Pouant, Jérémy Raoult and Patrick Hoffmann Large domain validity of MOSFET Microwave Rectification Response ( abstract )
12:06	Etienne Sicard, Alexandre Boyer, Priscila Fernandez Lopez, An Zhou, Nicolas Marier and Frederic Lafon EMC performance analysis of a Processor/Memory System using PCB and Package-On-Package ( abstract )

12:30-13:30Lunch Break

13:30-15:00 Session ANSYS1

ANSYS Workshop (Part I)

13:30

Simon Muff

Assessment and improvement of the EMC behaviour for Printed Circuit Boards ( abstract )

13:30-15:00 Session 11

Modelling II

Chairs:

Fabian Vargas and Wolfgang Wilkening

Location: Presidents Suite (Presentation room)

13:30	Helmut Herrmann, Wolfgang Horchler, Stefan Schwartz, Philipp Schröter, Frank Klotz, Marco Brignone and Franco Fiori Smart Power IC Macromodeling for DPI Analysis ( abstract )
13:52	Jaemin Lim, Manho Lee, Daniel H. Jung, Jonghoon J. Kim, Sumin Choi, Hyunsuk Lee and Joungho Kim Shielding Structures for Through Silicon Via (TSV) to Active Circuit Noise Coupling in 3D IC ( abstract )
14:14	Abhishek Ramanujan, Etienne Sicard, Alexandre Boyer, Jean-Luc Levant, Christian Marot and Frederic Lafon Developing a Universal Exchange Format for Integrated Circuit Emission Model – Conducted Emissions ( abstract )
14:36	Marko Magerl, Christian Stockreiter, Oliver Eisenberger, Rainer Minixhofer and Adrijan Barić Building Interchangeable Black-Box Models of Integrated Circuits for EMC Simulations ( abstract )

15:00-15:30Coffee Break

15:30-17:00 Session W1

EMC behaviour of COTS components after ageing (Workshop)

Chair:

André Durier

Location: Presidents Suite (Presentation room)

15:30	André Durier A methodologic project to characterize and model EMC behavior of COTS components after ageing ( abstract )
16:00	Alexandre Boyer Analysis and Modelling of Passive device degradation for a long-term electromagnetic emission study of a DC-DC converter ( abstract )
16:30	Tristan Dubois ICIM-CI model of Op. Amp taking into account environment effect for robustness concern ( abstract )

15:30-17:00 Session ANSYS2

ANSYS Workshop (Part II)

15:30

Chris Coull

Power, Noise and Reliability: Analysis and Optimisation of High Performance Chip Designs using ANSYS Apache ( abstract )

19:00-23:59 Session : Gala Dinner

EMC Compo Gala Dinner at Ghillie Dhu including presentation of best paper awards.

Location: Ghillie Dhu

Friday, November 13th

View this program: with abstracts session overview talk overview

09:00-10:30 Session W2

System decoupling capacitor selection and placement to minimize radiation and immunity issues Part I (Workshop)

Chair:

Kristoffer Skytte

Location: Presidents Suite (Presentation room)

09:00	Kristoffer Skytte Introduction ( abstract )
09:15	Kristoffer Skytte The power delivery system ( abstract )
10:00	John Phillips Simple test board measurements and results ( abstract )

10:30-11:00Coffee Break

11:00-12:30 Session W3

System decoupling capacitor selection and placement to minimize radiation and immunity issues Part II (Workshop)

Chair:

Kristoffer Skytte

Location: Presidents Suite (Presentation room)

11:00	Mario Rotigni ST Microcontroller pcb and measurement results ( abstract )
11:45	Kristoffer Skytte Demonstration of optimization of the power delivery system on a large design ( abstract )
12:15	Kristoffer Skytte Summary and further discussion ( abstract )